Wide-band-gap perovskites such as methylammonium lead bromide (MAPB) are promising materials for tandem solar cells because of their potentially high open-circuit voltage, which is yet still far below the maximum limit. The relatively short charge-carrier lifetimes deduced from time-resolved photoluminescence (TRPL) measurements seem in strong contrast with the long lifetimes observed with time-resolved photoconductance measurements. This is explained by a large amount of hole defect states, NT > 1016 cm-3, in spin-coated layers of MAPB residing at or near the grain boundaries. The introduction of hypophosphorous acid (HPA) increases the average grain size by a factor of 3 and reduces the total concentration of the trap states by a factor of 10. The introduction of HPA also increases the fraction of initially generated holes that undergo charge transfer to the selective contact, Spiro-OMeTAD (SO), by an order of magnitude. In contrast to methylammonium lead iodide (MAPI)/SO bilayers, a reduction of the carrier lifetime is observed in MAPB/SO bilayers, which is attributed to the fact that injected holes undergo interfacial recombination via these trap states. Our findings provide valuable insight into the optoelectronic properties of bromide-containing lead halide perovskites essential for designing efficient tandem solar cells.
Wide-band-gap perovskites such as pan> class="Chemical">methylammonium lead bromide (MAPB) are promising materials for tandem solar cells because of their potentially high open-circuit voltage, which is yet still far below the maximum limit. The relatively short charge-carrier lifetimes deduced from time-resolved photoluminescence (TRPL) measurements seem in strong contrast with the long lifetimes observed with time-resolved photoconductance measurements. This is explained by a large amount of hole defect states, NT > 1016 cm-3, in spin-coated layers of MAPB residing at or near the grain boundaries. The introduction of hypophosphorous acid (HPA) increases the average grain size by a factor of 3 and reduces the total concentration of the trap states by a factor of 10. The introduction of HPA also increases the fraction of initially generated holes that undergo charge transfer to the selective contact, Spiro-OMeTAD (SO), by an order of magnitude. In contrast to methylammonium lead iodide (MAPI)/SO bilayers, a reduction of the carrier lifetime is observed in MAPB/SO bilayers, which is attributed to the fact that injected holes undergo interfacial recombination via these trap states. Our findings provide valuable insight into the optoelectronic properties of bromide-containing lead halide perovskites essential for designing efficient tandem solar cells.
Entities:
Keywords:
charge selective contact; charge-carrier dynamics; deep hole traps; metal halide perovskites; time-resolved microwave conductivity
Metalpan> class="Chemical">halideperovskites (MHPs) have attracted an increasing amount
of attention over the past decade due to the steep increase in performance
of MHP-based solar cells from an initial 3.8% in 2009 to over 25%.[1−6] The high performance is attributed to a number of interesting properties
such as high optical absorption coefficients, long charge-carrier
diffusion lengths, and recombination lifetimes as well as low trap
state densities.[4,7,8] Their
low cost and ease of processing make them also attractive for other
applications including light-emitting diodes, lasers, and X-ray detectors.[9−11] Recently, tandem solar cells based on a Si bottom cell and a MHP
top cell are intensively investigated since efficiencies above the
Shockley–Queisser limit can be attained.[12−15] The wide band gap of 2.38 eV
of methylammonium lead bromide (MAPB) perovskite makes it a promising
candidate as a top cell for a tandem solar cell.[16,17] Moreover, MAPB features promising properties, such as high photoluminescence
(PL) yield,[18] relatively small exciton
binding energies,[19] and balanced mobility
between electrons and holes.[17] In principle,
the wider band gap of MAPB should potentially allow for higher open-circuit
voltages (Voc) essential to reach higher
power conversion efficiencies (PCEs) of tandem solar cells. However,
in practice, the energy gap between the Ebg/e and Voc for mixed
halideperovskites increases with the increasing ratios of Br/I.[20] For MAPB-based solar cells, the maximum reported Voc’s amounts to 1.61 V,[21] which in view of the Ebg of
2.38 eV yields a deficit of 0.77 V. In comparison, for MAPI, Ebg amounts to 1.59 eV and the highest reported
voltage amounts to 1.26 V, yielding a gap of only 0.33 V.[22] Hence, to reach higher Voc’s for the Br-containing top cell, a detailed understanding
and eventual reduction of this deficit is important.One of
the most critical factors determining the efficiency of
pan> class="Chemical">MHP-based solar cells is the presence of recombination centers. For
perovskites, a large variety of defect states including point defects
in the bulk, e.g., interstitials or vacancies and surface defects,
such as undercoordinated halides ions or lead ions, is possible. Some
of these defects form states within the forbidden band gap and lead
to the trapping of excess charge carriers.[23,24] Hence, to ultimately improve solar cell efficiencies, it is particularly
important to understand the origin and type of these trap states.
From density functional theory calculations,[25] it has been reported that halide interstitials and lead vacancies
are the most stable defects in both MAPI and MAPB. For both these
materials, it is argued that halide interstitials result in slight
p-type behavior. In another work, Musiienko et al. found by first-principle
calculations that cation vacancies and Br interstitials are the main
acceptors in MAPB.[26] However, there are
no detailed experimental studies focusing on the density and the type
of trap states as well as the relationship between structure and trap
states in MAPBperovskites.In this work, time-resolved microwave
conductivity (TRMC) was used
to study trap states in bare pan> class="Chemical">MAPB and in bilayers of MAPB with a charge
selective transport layer. We start off by comparing the time-resolved
PL and time-resolved photoconductance measurements on MAPB with those
on MAPI. These data suggest that one type of carrier in MAPB is trapped
on short timescales resulting in photoconductance decays extending
into the multi-microsecond time regime. Furthermore, we investigate
how these trap states are affected by the domain size, which we manipulate
by the addition of a small percent of hypophosphorous acid (HPA) to
the precursor solution. Previous research on the addition of HPA has
improved the electronic properties of MAPI layers remarkably. In that
work, it is argued that HPA, a strong reducing agent, avoids the oxidation
of I– and in addition retards the crystallization
process yielding larger crystals.[27−29] Analysis of the TRMC
traces of MAPB-HPA shows a reduction of the number of trap states
by an order of magnitude, which is related to the increased grain
size as exposed by atomic force microscopy (AFM). Additional PL and
TRMC measurements on MAPB/SO and MAPB/C60 bilayer systems
allowed us to determine the type of deep traps. Finally, we modeled
the charge-carrier dynamics in the single and bilayers to extract
hole transfer rates and charge-carrier collection efficiencies. Our
findings provide valuable insight into how passivation of deep trap
states in MAPB affects the charge-carrier dynamics, essential for
optimizing perovskite-based optoelectronic devices and designing tandem
solar cells.
Results and Discussion
MAPB thin
films (∼300 nm) were deposited on precleanpan>ed quartz
substrates by spin-coating a pan> class="Chemical">N,N-dimethylformamide (DMF) solution containing the precursors methylammonium
bromide (MABr) and lead acetate trihydrate in a 3:1 molar ratio. MAPI
thin films (∼250 nm) were prepared using the same procedure,
with methylammonium iodide replacing MABr. The (100), (200) and (110),
(220) main characteristic peaks in the X-ray diffraction (XRD) patterns
(SI, Figure S1) confirm the cubic and tetragonal
crystal structure of MAPB and MAPI films, respectively.[30] Absorption and fluorescence spectra of MAPI
are provided in the SI, Figure S2 and correspond
to previously reported spectra.[31]Figure a,b shows
photoconductance traces (ΔG) normalized by
the number of absorbed photons as a function of time on photoexcitation
of MAPI (λ = 650 nm) anpan>d pan> class="Chemical">MAPB (λ = 500 nm) in a log-linear
representation. The initial increase of the signal originates from
the generation of free charge carriers, while the decay is attributed
to recombination or to the immobilization of excess carriers by trapping.
The traces recorded for MAPI are similar to those reported previously
by some of us.[8,32,33] The signal heights for MAPI are substantially higher than that for
MAPB, which can be attributed to the lower charge-carrier mobilities
for the latter.[34] On increasing the laser
intensity, the decay kinetics become faster, which can be explained
by the fact that with higher initial charge densities the second-order
band-to-band recombination leads to faster decay. Most intriguingly,
the decay kinetics for the MAPB are substantially different compared
to MAPI. Although at higher intensities the decay kinetics are initially
faster, all traces are characterized by almost parallel tails at longer
times, even extending into the microsecond timescales. Moreover, the
same trend was also observed in MAPB films prepared from PbBr2 (see the SI, Figure S3), which
indicates that these long tails are independent of the lead precursor
source. Furthermore, similar long-lived photoconductance and transient
absorption traces have been previously reported for bromide-rich MHPs.[25,35]
Figure 1
Photoconductance
as a function of time for (a) MAPI and (b) MAPB
recorded at intensities ranging from 1010 to 1012 photons cm–2 per pulse, corresponding to initial
charge-carrier densities of 1015–1017 cm–3. (c) PL lifetimes of MAPI and MAPB thin films
recorded using pulsed excitation at 405 nm.
Photoconductance
as a function of time for (a) MAPI anpan>d (b) pan> class="Chemical">MAPB
recorded at intensities ranging from 1010 to 1012 photons cm–2 per pulse, corresponding to initial
charge-carrier densities of 1015–1017 cm–3. (c) PL lifetimes of MAPI and MAPB thin films
recorded using pulsed excitation at 405 nm.The time-resolved photoluminescence (TRPL) traces for both materials
dispan> class="Chemical">played in Figure c show the opposite behavior: the lifetime of MAPB is substantially
shorter than that of MAPI. Since the PL originates from the radiative
decay of electrons and holes,[36] this observation
implies that in MAPB one type of charge carrier is depleted within
few tens of nanoseconds. At the same time, we can deduce that the
other type of charge carrier is mobile for prolonged timescales, as
it is apparent from the TRMC traces. These results suggest that for
MAPB, one type of carrier, is trapped on short timescales resulting
in a rather different photophysical behavior in comparison to MAPI.To further investigate the nature and origin of the trap states
in pan> class="Chemical">MAPB, HPA was added to the precursor solution to manipulate the
morphology of MAPB yielding thin films, denoted as MAPB-HPA.[27] HPA has been used as an additive in the MAPI
and MAPI3–Cl to improve the optoelectronic properties.[27−29,37] The XRD pattern of MAPB-HPA is
very comparable to the pattern of the perovskite layer without HPA,
denoted as MAPB-reference (MAPB-ref) (see the SI, Figure S1). From X-ray photoemission spectroscopy (see the
SI, Figure S4), we observe only a small
amount of P (2.5%) in the MAPB-HPA layer.Figure a,b shows
the atomic force microscopy (AFM) images of both MAPB films, respectively.
It is apparent that the average pan> class="Chemical">perovskite domain size is significantly
enlarged on adding HPA: from ca. 200 to 700 nm. The substantial increase
of the domain size in the HPA sample is due to the lower crystallization
rate during the nucleation of perovskite, as previously reported.[28] Therefore, the total surface area related to
the domain boundaries in MAPB-HPA is considerably smaller than in
the MAPB-ref.
Figure 2
Atomic force microscopy (AFM) images for MAPB-ref- (a)
and MAPB-HPA-processed
(b) films spin-coated on quartz substrates. (c) Fraction of light
absorbed (FA) by MAPB-ref and MAPB-HPA
films (left axis) and corresponding PL spectra (right axis). (d) PL
lifetimes of MAPB-ref and MAPB-HPA thin films photoexcited at 405
nm (1 MHz, 1.2 × 1012 photons cm–2) recorded at the maximum emission wavelengths.
Atomic force microscopy (AFM) images for MAPB-ref- (a)
anpan>d pan> class="Chemical">MAPB-HPA-processed
(b) films spin-coated on quartz substrates. (c) Fraction of light
absorbed (FA) by MAPB-ref and MAPB-HPA
films (left axis) and corresponding PL spectra (right axis). (d) PL
lifetimes of MAPB-ref and MAPB-HPA thin films photoexcited at 405
nm (1 MHz, 1.2 × 1012 photons cm–2) recorded at the maximum emission wavelengths.Then, we investigated the optical properties of these two MAPBpan> class="Chemical">perovskites layers. Figure c displays the fraction of absorbed light (FA) and the PL emission of both thin films. For both samples,
we find the contribution of the characteristic excitonic absorption
at 524 nm to the absorption spectra. For MAPB-ref, a small red shift
of approximately 5 nm of the absorption onset and of the maximum PL
are observed. More importantly, the PL intensity of MAPB-HPA is about
4 times higher than that of MAPB-ref. Furthermore, TRPL measurements
show that the PL lifetime of MAPB-HPA is increased by a factor of
2 in comparison to MAPB-ref. The improved optical properties of MAPB-HPA
are expected to result from suppressed nonradiative recombination
pathways due to the reduction of the number of trap states.[38] Assuming that the trap states are largely located
at the grain surface, this decrease might be reasonably related to
the reduced total surface area of MAPB-HPA.To gain more insight
into the trapping process by intra-banpan>d-gap
states, we measured the photoconductanpan>ce traces in pan> class="Chemical">MAPB-ref and MAPB-HPA
thin films (see Figure ). A number of observations can be made on addition of HPA: first,
the maximum signal height is higher. This value represents the product
of the free charge-carrier generation yield, φ, and the sum
of the electron and hole mobility, ∑μ. Based on the thermal
energy at 300 K and the exciton binding energy of MAPB, which is in
the range of 14–60 meV,[19,39] we expect that the
predominant part of the excitons is dissociated into free charges
as detailed in the SI (Figure S5). Therefore,
we can assume that φ is close to unity at room temperature for
both samples. Apart from this increased signal height, we observe
a substantial reduction in the initial decay kinetics on addition
of HPA. To extract the mobilities and rate constants for various processes,
we modeled photoconductance traces using a kinetic model (see Scheme ) previously successfully
used to describe the photophysical processes in MAPI.[8,35] For MAPB, the fits are calculated by taking into account the processes
indicated by the black arrows and assuming a slightly n-doped material
as will be discussed later on (see the SI for a used set of differential eqs S2–S4). The fits are added in Figure as solid lines and
are in good agreement with the experimental traces. All kinetic parameters
are collected in Table .
Figure 3
Photoconductance as a function of time for MAPB-ref (a) and processed
with HPA (b) thin films for intensities ranging from 1010 to 1012 photons cm–2 per pulse (λ
= 500 nm), corresponding to initial charge-carrier densities of 1015–1017 cm–3. The full
lines are fits to the data points as described in the text.
Scheme 1
Kinetic Model of Charge-Carrier Processes Initiated
by Photoexcitation
of MAPB
Gc represents
the photogeneration of charge carriers; k2 depicts the second-order recombination rate. Hole trap-mediated
recombination is described by a trapping rate kT and depopulation rate kD. The
Fermi level, EF, is located above the
trap level, ET, implying that the material
is n-type doped. In the presence of a SO hole transport layer, charges
can be injected into SO with kh (green
arrow) and further recombine with electrons via ke (blue arrow).
Table 1
Kinetic
Fitting Parameters Extracted
from TRMC Traces for Bare MAPB and MAPB/SO Bilayers
MAPB-ref
MAPB-ref/SO
MAPB-HPA
MAPB-HPA/SO
k2 [× 10–9 cm3 s–1]
5.5
6.5
2.1
2.8
kT [× 10–9 cm3 s–1]
2
2
2.5
2.5
kD [× 10–10 cm3 s–1]
0.45
3.2
1.5
50
NT [× 1015 cm–3]
35
35
3.5
3.5
n0 [× 1015 cm–3]
3.5
3.5
3.5
3.5
kh [× 106 s–1]
5
10
ke [× 106 s–1]
<0.1
7
∑μ [cm2 V–1 s–1]
19
19
30
30
Photoconductance as a function of time for MAPB-ref (a) anpan>d processed
with pan> class="Disease">HPA (b) thin films for intensities ranging from 1010 to 1012 photons cm–2 per pulse (λ
= 500 nm), corresponding to initial charge-carrier densities of 1015–1017 cm–3. The full
lines are fits to the data points as described in the text.
Kinetic Model of Charge-Carrier Processes Initiated
by Photoexcitation
of MAPB
Gc represents
the photogeneration of charge carriers; k2 depicts the second-order recombination rate. Hole trap-mediated
recombination is described by a pan> class="Gene">trapping rate kT and depopulation rate kD. The
Fermi level, EF, is located above the
trap level, ET, implying that the material
is n-type doped. In the presence of a SO hole transport layer, charges
can be injected into SO with kh (green
arrow) and further recombine with electrons via ke (blue arrow).The ∑μ
values are 19 and 30 cm2 V–1 s–1 for MAPB-ref anpan>d pan> class="Chemical">MAPB-HPA, respectively. We
attribute this increase to the expanded domain sizes of MAPB-HPA since
the measured mobility at 8.5 GHz can be reduced by the domain boundaries.
The resulting restriction in the charge-carrier motion reduces the
measured effective AC mobility.[40] Also, k2 representing the second-order recombination
process is reduced from 5.5 ×10–9 to 2.1 ×10–9 cm3 s–1. In addition
to radiative band-to-band recombination, nonradiative trap-mediated
decay can also give rise to the second-order decay process as we and
others have experimentally observed.[8,36] Obviously,
the reduced surface area of MAPB-HPA has resulted in a lowering of
the nonemissive part of k2. This agrees
with the enhancement in PL for the MAPB-HPA film. More importantly,
the concentration of deep trap states, NT, for MAPB-HPA is 1 order of magnitude lower as compared to the ref
sample. The origin of the reduction of NT could be attributed to the reduced total surface area of the MAPB-HPA
layer. Moreover, the substantially higher NT values in MAPB in comparison to those reported for MAPI[32] explain the differences observed with (TR)PL
and TRMC, as shown in Figure .Knowing the rate constants for the various processes
allows us
to model the TRPL signpan>al, which is given by[8]Since
the laser pulse used for time-correlated
single-photon counting (TCSPC) measurements is different from the
TRMC experiments, we have to adapt the GC term in the span> class="Gene">et of coupled differential equations (see the SI, eqs S2–S4). Solving the equations again
numerically yields the time-dependent concentrations of n and p. Via this approach, the TRPL signals for
both MAPB films are calculated and shown in the SI, Figure S6. Although there is no exact match with Figure d, the similarity
with experimental TRPL traces is clearly present.To obtain
more information about the type of traps anpan>d how pan> class="Gene">trap
states affect the charge collection, we deposited Spiro-OMeTAD (SO)
(∼250 nm) as a hole transport layer or C60 as an
electron transport layer (∼30 nm) on top of the same perovskite
layers studied above. The absorption spectra of SO and C60 as well as their corresponding bilayers are shown in the SI, Figure S7. For all bilayers, we observe a clear
reduction in PL intensity on the introduction of SO as well as of
C60 in comparison with the bare MAPB layer, indicating
charge transfer to the transport layer. For the bilayers based on
MAPB-HPA, the PL quenching was substantially stronger than for the
MAPB-ref based bilayers (SI, Figure S8).
In Figure , the normalized
photoconductance traces of the bare ref and HPAperovskites together
with their bilayer systems are shown. The samples were excited through
the transport layer using an excitation wavelength of 500 nm. The
non-normalized traces are provided in the SI, Figure S10.
Figure 4
Energy diagrams and charge-carrier processes occurring
upon photoexcitation
of MAPB/SO (top, left) and MAPB/C60 (top, right). TRMC
traces for neat MAPB and MAPB/SO bilayers (a, b) and MAPB/C60 bilayers (c, d) for both ref (a, c) and HPA processed (b, d) samples
recorded at initial charge-carrier densities of 3 × 1015 cm–3 (λ = 500 nm). Maximum signal sizes
of single layers are normalized to 1, while bilayers are normalized
with the same factor.
Energy diagrams and charge-carrier processes occurring
upon photoexcitation
of MAPB/SO (top, left) anpan>d pan> class="Chemical">MAPB/C60 (top, right). TRMC
traces for neat MAPB and MAPB/SO bilayers (a, b) and MAPB/C60 bilayers (c, d) for both ref (a, c) and HPA processed (b, d) samples
recorded at initial charge-carrier densities of 3 × 1015 cm–3 (λ = 500 nm). Maximum signal sizes
of single layers are normalized to 1, while bilayers are normalized
with the same factor.For MAPB-ref/SO, a relatively
small deviation from the single layer
is visible, while for pan> class="Chemical">MAPB-HPA/SO, the tail of the TRMC signal is
decaying much faster than the base layer (see also the SI, Figure S9a,b for a log-linear representation).
Note that the mobility of charges in SO (and also in C60) is more than an order of magnitude smaller than in MHPs and that
only mobile carriers contribute to the photoconductance.[41,42] The fact that the introduction of the SO layer on the MAPB-ref layer
does not appreciably change the TRMC trace demonstrates that the holes
do not contribute substantially to the TRMC signal in neither the
bare layer nor the bilayer. Hence, in both samples, the excess electrons
are responsible for the TRMC signal. From here, we can conclude that
the majority of the excess holes in the bare MAPB-ref layer are rapidly
trapped. Holes captured in trap states are not mobile and thus do
not contribute to the conductance. This result is understandable in
view of the initial charge-carrier density of 3 × 1015 cm–3 and the much larger value of NT for the MAPB-ref. For the MAPB-HPA/SO bilayer, the situation
is somewhat different since NT is close
to the initial charge-carrier density and hence partial hole transfer
can be expected. As mentioned above, those injected holes in SO hardly
contribute to photoconductance due to their low mobility. From the
faster decay kinetics for both bilayers in comparison to the bare
MAPB layers, we conclude that the recombination of holes with the
mobile conduction band electrons is enhanced by the introduction of
SO, which we will discuss in more detail below.For both MAPB/C60 bilayers, we observe a drop in the
initial signpan>al size anpan>d a severe reduction in a lifpan> class="Gene">etime as compared
to the single perovskite layer (a log-linear representation is shown
in the SI, Figure S9c,d). The reduction
of the initial photoconductance could be partially due to the fact
that C60 has a nonzero absorption at 500 nm. More importantly,
the long-lived tails clearly visible in the bare MAPB layer disappear
in both MAPB/C60 bilayers. Realizing that the dominant
part of the holes is trapped in the MAPB layer, and the fact that
the TRMC signal goes quickly back to zero, proves that electron transfer
from both MAPB layers into C60 is efficient which is in
accordance with the PL quenching.The above explanpan>ation for
the TRMC measurements on the double layers
brings us to the conclusion that the dominanpan>t type of pan> class="Gene">traps in MAPB
layers are hole traps. Then, we examine the decay kinetics in both
MAPB/SO bilayers. For both bilayers, we observe a reduction in charge-carrier
lifetime with those in bare MAPB layers. In contrast, we reported
previously for MAPI/SO bilayers an enhancement in charge-carrier lifetimes,
which was attributed to the fact that after charge transfer the charges
are physically separated.[31,32] To obtain more insight
into the recombination processes, we fitted the bilayers using the
kinetic model of Scheme completed by an additional charge transfer process to the transport
layer with rate constant kh and recombination
of a hole in SO with a conduction band electron with rate ke as indicated in green and blue, respectively.
The TRMC traces and corresponding fits are provided in the SI, Figure S11, for a range of intensities. The used
kinetic parameters are added to Table . For both MAPB/SO bilayers, we observe values of 5–10
× 106 s–1 for kh, which confirms that hole transfer to the transport
layer occurs. Although most found parameters are very comparable to
the corresponding bare MAPB, we observe an increase of more than an
order of magnitude for kD. Obviously,
the introduction of SO enhances the emptying of occupied trap states.
To explain this observation, we argue that (i) the location of the
trap states is near or at the surface of the grains. This explains
that for MAPB-HPA the effect is more severe than for the MAPB-ref
layer since for the latter most of the grain boundaries are not in
direct contact with SO. (ii) The energetic position of the trap states
is located close to or above the highest occupied molecular orbital
(HOMO) level of SO. In this way, the surface states offer an additional
decay path for holes that have been injected into SO, as indicated
by the dashed arrow in Scheme . The increased decay rate from the trap states can be attributed
to the fact that the injected holes in SO induce an internal electric
field pulling electron density toward the interface. The increased
electron concentration enhances the recombination of trapped holes
with conduction band electrons. Both effects lead basically to an
increase of the trap-mediated recombination, which might be one of
the key reasons for the higher voltage deficit in the MAPB-based cells
in comparison to the MAPI cells. However, we cannot exclude that also
the fast interfacial recombination observed at the interface between
MAPB/C60 might be another reason for the voltage deficit. The lower
concentration or absence of surface states for MAPI explains why,
in contrast to MAPB/SO bilayers, an elongation of the charge-carrier
lifetimes on hole transfer to SO is observed (see the SI, Figure S12).[31,32]Knowing
all of the rate constants describing the bare and bilayer
system allows us to determine the fraction of the initially generated
excess carriers by the laser pulse, which has undergone charge tranpan>sfer
into SO. For both bilayers, this fraction is dispan> class="Chemical">played in Figure versus the laser
intensity. In particular, at low intensities where the second-order
recombination is less prominent, we can conclude that the charge collection
for the MAPB-ref is almost a factor of 10 less efficient. This is
in line with the much weaker PL quenching efficiency in the MAPB-ref/SO
bilayer than in MAPB-HPA/SO. Although under steady-state illumination
conditions the results may be somewhat different, we conclude that
for MAPB-ref/SO hole collection is hampered, reducing the efficiency
of a MAPB-ref based solar cell.
Figure 5
Fraction of initial photoinduced charge
carriers that undergo charge
transfer to the SO transport layer.
Fraction of initial photoinduced charge
carriers that undergo charge
transfer to the SO transport layer.Combining all found information regarding the trap states in pan> class="Chemical">MAPB
brings us to the following key features: spin-coated MAPB is characterized
by a large amount of defect hole states, NT > 1016 cm–3, residing at or near
the
surface of the perovskite grains. The introduction of HPA in the spin-coating
solution considerably increases the grain sizes and at the same time
reduces the total concentration of the trap states by an order of
magnitude. As mentioned in the Introduction section, undercoordinated
atoms at the surface might give rise to such surface traps. The larger
crystals of the MAPB-HPA layer resulting in the reduced surface area
of the MAPB-HPA layer is likely the major origin of the reduced concentration
of the defect states.
Conclusions
In this work, the optoelectronic
properties of MAPB, which are
markedly different from those of pan> class="Chemical">MAPI, are described, in particular
how trap states affect the charge-carrier dynamics and charge collection.
By addition of HPA to the precursor solution, the average crystal
domain size is found to increase by more than a factor of 3, as revealed
by AFM. Analysis of the photoconductance traces recorded by electrodeless
time-resolved microwave measurements reveals that positive charges
are trapped on short timescales. Most importantly, the concentration
of deep trap states, NT, for MAPB-HPA
is reduced from 35 × 1015 to 3.5 × 1015 cm–3. Furthermore, k2 comprising both radiative and nonradiative second-order recombination
is reduced by a factor of 2. Both observations can be attributed to
the reduced surface area of MAPB-HPA. From additional PL and TRMC
measurements on MAPB-ref/SO and MAPB-HPA/C60 double layers,
we conclude that charge transfer into C60 and SO occurs.
However, for MAPB-ref/SO, the hole collection is hampered by the presence
of excessive amounts of hole traps. In contrast to MAPI/SO, we observe
a reduction of the charge-carrier lifetime in bilayers, which we attribute
to the fact that interfacial recombination from the injected holes
via the trap states is possible. More insight into the manipulation
of the concentration of intra-band-gap states and in their effect
on the charge-carrier dynamics will contribute to a more complete
understanding of the optoelectronic properties of MAPB. This is essential
for optimizing perovskite-based optoelectronic devices in particular
for bromide-containing perovskite top cells for application in tandem
solar cells.
Experimental Methods
Preparation
of MHP Films
Quartz substrates were rinsed
with acetone anpan>d pan> class="Chemical">ethanol in an ultrasonic bath for 10 min each. Subsequently,
oxygenplasma treatment was performed prior to layer deposition. To
prepare MAPB/MAPI precursor solution, methylamine bromide (336 mg,
3.0 mmol)/methylamine iodide (480 mg, 3.0 mmol) and lead acetate trihydrate
(PbAc2·3H2O) (379 mg, 1.0 mmol) were dissolved
in anhydrous N,N-dimethylformamide
(DMF) (1.77 mL). For the preparation of the MAPB-HPA layers, 4 μL
of an HPA stock solution was added to the precursor solution yielding
a 7.5% molar ratio of HPA to PbAc2. The perovskite solutions
were spin-coated on the substrates at 2000 rpm for 45 s and then annealed
at 100 °C for 5 min after drying for 10 min at room temperature.
For the Spiro-OMeTAD layer, a 75 mg mL–1 chlorobenzene
solution was prepared, which was spin-coated at 1500 rpm for 45 s.
The C60 layer (30 nm) was thermally evaporated.
Photoconductance
Measurements
The time-resolved microwave
conductivity (TRMC) technique was determined to investigate the photoconductanpan>ce
as a function of time using anpan> excitation wavelength of 500 nm for
pan> class="Chemical">MAPB and 650 nm for MAPI. With this technique, the reduction in microwave
power (ΔP(t)/P) induced by a laser pulse (repetition rate: 10 Hz) was related to
the change in conductance (ΔG(t)) by the sensitivity factor KThe TRMC signal is expressed in the
product
of mobility (μe + μh) and charge-carrier yield φ, which was calculated
from the maximum change in photoconductance ΔGmaxwhere FA is the
fraction of light absorbed by the sample at the excitation wavelength, I0 is the laser intensity in the number of photons
per unit area per pulse, e is the elementary charge,
and β is the ratio of the inner dimensions of the microwave
cell. The samples were placed in a sealed microwave cell inside the
glovebox to ensure that they are not exposed to ambient conditions
during the measurement.
Optical Characterization
Absorption
spectra were recorded
with a PerkinElmer Lambda 1050 spectrophotometer equipped with anpan>
integrated sphere. The sampan> class="Chemical">ples were placed inside the sphere to measure
the total fraction of reflected and transmitted light (FR+T). Then, the fraction of absorbed light (FA) was calculated byPhotoluminescence spectra and lifetimes
in
the main text were carried out using an Edinburgh LifeSpec spectrometer
equipped with a single-photon counter. The films were excited at 405
nm using a picosecond pulsed diode laser (I0 = 1.2 × 1012 photos/cm2) at 1 MHz. On
recording the transients at a repetition rate limited to 100 kHz,
no significant changes were observed. Photoluminescence spectra in
the Supporting Information were recorded
using an Edinburgh FLS980 spectrometer at an excitation wavelength
of 470 nm.
Structural Characterization
X-Ray
diffraction patterns
were conducted on a Brucker D8 diffractomn class="Gene">eter inpan> a Bragg–Brentanpan>o
configuration usinpan>g Co-Kα (λ = 1.79 Å) radiation.
The atomic force microscopy measurements were performed on a NTMDT
n class="Disease">Ntegra Aura AFM system inpan> semicontact mode. The canpan>tilevers used were
Nanpan>osensors PPP-NCHR with a resonanpan>ce frequency of 350 kHz. The only
postprocessinpan>g performed was a linpan>ear linpan>e by linpan>e flatteninpan>g.
X-ray photoemission spectroscopy (XPS) measurements were conducted
using a Thermo Fisher K-Alpha surface analysis machine.
Authors: Dong Shi; Valerio Adinolfi; Riccardo Comin; Mingjian Yuan; Erkki Alarousu; Andrei Buin; Yin Chen; Sjoerd Hoogland; Alexander Rothenberger; Khabiboulakh Katsiev; Yaroslav Losovyj; Xin Zhang; Peter A Dowben; Omar F Mohammed; Edward H Sargent; Osman M Bakr Journal: Science Date: 2015-01-30 Impact factor: 47.728
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