| Literature DB >> 32542412 |
Jie-Xiang Yang1,2, Yongtao Meng3, Chuan-Ming Tseng4,5, Yan-Kai Huang6, Tung-Ming Lin1,2, Yang-Ming Wang1,2, Jin-Pei Deng7, Hsiang-Chiu Wu8, Wei-Hsuan Hung9,10.
Abstract
α-Phase hematite photoelectrodes can split water. This material is nontoxic, inexpensive, and chemically stable; its low energy gap of 2.3 eV absorbs light with wavelengths lower than 550 nm, accounting for approximately 30% of solar energy. Previously, we reported polyhedral pseudocubic α-Fe2O3 nanocrystals using a facile hydrothermal route to increase spatial charge separation, enhancing the photocurrent of photocatalytic activity in the water-splitting process. Here, we propose a p-n junction structure in the photoanode of pseudocubic α-Fe2O3 to improve short carrier diffusion length, which limits its photocatalytic efficiency. We dope Zn on top of an Fe2O3 photoanode to form a layer of p-type semiconductor material; Sn is doped from the FTO substrate to form a layer of n-type semiconductor material. The p-n junction, n-type Fe2O3:Sn and p-type Fe2O3:Zn, increase light absorption and charge separation caused by the internal electric field in the p-n junction.Entities:
Keywords: Pseudocubic α-Fe2O3; Solar energy; Water splitting; p-n junction
Year: 2020 PMID: 32542412 PMCID: PMC7295917 DOI: 10.1186/s11671-020-03362-5
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703
Fig. 1Concept of the p-n junction in a photoelectrode of polyhedral pseudocubic α-Fe2O3
Fig. 2a TEM image of pseudocubic-Fe2O3 NPs. b High-resolution TEM image of a pseudocubic-Fe2O3 NP. c The FFT pattern in b reveals an α-Fe2O3 NP along its projection
Fig. 3X-ray photoelectron spectroscopy (XPS) analysis of the Zn/Sn-doped p-n pseudocubic Fe2O3 photoelectrode: a survey XPS spectrum; b Fe 2p; and c Zn 2p
Fig. 4Cross-sectional imaging and chemical mapping of Zn/Sn-doped p-n pseudocubic Fe2O3 photoelectrode: a–f STEM images of the cross-section of an Zn/Sn-doped PN pseudocubic Fe2O3 photoelectrode. Note that the thin Pt layer seen in the image was deposited over the sample as a protection layer for the focused ion beam (FIB) milling step for cross-sectional sample preparation. g EDS mapping showing Zn, Fe, Sn, and Si elemental distributions respectively for the same sample as in a
Fig. 5a Absorption spectrum of the photoelectrodes of Fe2O3:Sn and Fe2O3:Zn/Sn; b PL analysis of the Fe2O3:Sn and Fe2O3:Zn/Sn photoelectrodes; and c J-V scans collected for different doped Fe2O3
Fig. 6a Stability study of pseudocubic Fe2O3:Zn/Sn photoelectrodes (inset photo: our test system). b Production of H2 and O2 from pseudocubic Fe2O3:Zn/Sn photoelectrodes