| Literature DB >> 32422891 |
Maxim S Ivanov1,2, Vladimir A Khomchenko1, Maxim V Silibin3,4,5,6, Dmitry V Karpinsky3,4,7, Carsten Blawert8, Maria Serdechnova8, José A Paixão1.
Abstract
In this work we demonstrate the role of grain boundaries and domain walls in the local transport properties of n- and p-doped bismuth ferrites, including the influence of these singularities on the space charge imbalance of the energy band structure. This is mainly due to the charge accumulation at domain walls, which is recognized as the main mechanism responsible for the electrical conductivity in polar thin films and single crystals, while there is an obvious gap in the understanding of the precise mechanism of conductivity in ferroelectric ceramics. The conductivity of the Bi0.95Ca0.05Fe1-xTixO3-δ (x = 0, 0.05, 0.1; δ = (0.05 - x)/2) samples was studied using a scanning probe microscopy approach at the nanoscale level as a function of bias voltage and chemical composition. The obtained results reveal a distinct correlation between electrical properties and the type of charged defects when the anion-deficient (x = 0) compound exhibits a three order of magnitude increase in conductivity as compared with the charge-balanced (x = 0.05) and cation-deficient (x = 0.1) samples, which is well described within the band diagram representation. The data provide an approach to control the transport properties of multiferroic bismuth ferrites through aliovalent chemical substitution.Entities:
Keywords: BiFeO3; domain walls; grain boundaries; n- and p-type conductivity; scanning probe microscopy
Year: 2020 PMID: 32422891 PMCID: PMC7279369 DOI: 10.3390/nano10050940
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Scanning probe microscopy (SPM) measurements of the Bi0.95Ca0.05FeO2.975 sample: (a) surface topography, (b) out-of-plane (OOP) PFM response, (c) in-plane (IP) PFM response, (d) c-AFM response at positive DC bias voltage of 5 V, (e) c-AFM response at negative DC bias voltage of −5 V, (f) magnified c-AFM image of the area marked by the red dotted square in (e). Cross-section profiles for (g) topography, (h) c-AFM, and (i) OOP PFM. The arrows indicate the position of grain boundaries (GB) and domain walls (DW) on the corresponding cross-section profiles.
Figure 2SPM measurements of the Bi0.95Ca0.05Fe0.95Ti0.05O3 sample: (a) surface topography, (b) OOP PFM response, (c) IP PFM response, (d) c-AFM response at positive DC bias voltage of 5 V, (e) magnified c-AFM image of the area marked by the red dotted square in (d), (f) c-AFM response at negative DC bias voltage of −5 V.
Figure 3SPM measurements of the Bi0.95Ca0.05Fe0.9Ti0.1O3.025 sample: (a) surface topography, (b) OOP PFM response, (c) IP PFM response, (d) c-AFM response at positive DC bias voltage of 10 V, (e) c-AFM response at negative DC bias voltage of −10 V, (f) magnified c-AFM image of the area marked by the red dotted square in (e).
Figure 4Local current-voltage dependencies for the Bi0.95Ca0.05Fe1−xTixO3−δ samples, as measured within conductive areas: (a) x = 0, (b) x = 0.05, (c) x = 0.1. The inset shows the dependence characteristic of insulating regions (the vertical scale is in pA). (d) The band diagram representation considering the influence of grain boundaries and domain walls on the energy band bending depending on the chemical composition. The values representing the Fermi level (1.4 eV), bandgap (2.8 eV), and the electron affinity (3.3 eV) of BFO were taken from Refs. [13,15,42].