| Literature DB >> 32366660 |
Jie Wu1, Hari P Nair2, Anthony T Bollinger1, Xi He1,3, Ian Robinson1, Nathaniel J Schreiber2, Kyle M Shen4,5, Darrell G Schlom2,5, Ivan Božović6,3.
Abstract
We have measured the angle-resolved transverse resistivity (ARTR), a sensitive indicator of electronic anisotropy, in high-quality thin films of the unconventional superconductor Sr2RuO4 grown on various substrates. The ARTR signal, heralding the electronic nematicity or a large nematic susceptibility, is present and substantial already at room temperature and grows by an order of magnitude upon cooling down to 4 K. In Sr2RuO4 films deposited on tetragonal substrates the highest-conductivity direction does not coincide with any crystallographic axis. In films deposited on orthorhombic substrates it tends to align with the shorter axis; however, the magnitude of the anisotropy stays the same despite the large lattice distortion. These are strong indications of actual or incipient electronic nematicity in Sr2RuO4.Entities:
Keywords: angle-resolved transverse resistivity; electronic nematicity; molecular-beam epitaxy; strontium ruthenate
Year: 2020 PMID: 32366660 PMCID: PMC7245092 DOI: 10.1073/pnas.1921713117
Source DB: PubMed Journal: Proc Natl Acad Sci U S A ISSN: 0027-8424 Impact factor: 11.205