Rebecca J Fong1,2, Ophélie Squillace1,3, Carl D Reynolds1,4, Joshaniel F K Cooper5, Robert M Dalgliesh6, James Tellam5, Florence Courchay7, Richard L Thompson1. 1. Department of Chemistry, Durham University, Science Site, Durham DH1 3LE, United Kingdom. 2. Procter & Gamble, Newcastle Innovation Centre, Whitley Road, Newcastle-upon-Tyne, NE12 9TS, United Kingdom. 3. School of Chemical Engineering, University of Birmingham, SW Campus, Birmingham B15 2TT, United Kingdom. 4. School of Chemistry, University of Birmingham, University Road West, Birmingham B15 2TT, United Kingdom. 5. Rutherford Appleton Laboratories, Chilton, Didcot, OX11 0QX, United Kingdom. 6. ISIS Neutron and Muon Source, Rutherford Appleton Laboratories, Chilton, Didcot, OX11 0QX, United Kingdom. 7. Procter & Gamble, Brussels Innovation Center, Temselaan 100, 1853 Strombeek Bever, Brussels, Belgium.
Abstract
The vertical depth distributions of amine oxide surfactants, N,N-dimethyldodecyl amine N-oxide (DDAO) and N,N-dimethyltetradecyl amine N-oxide (DTAO), in poly(vinyl alcohol) (PVA) films were explored using neutron reflectometry (NR). In both binary and plasticized films, the two deuterated surfactants formed a single monolayer on the film surface with the remaining surfactant homogeneously distributed throughout the bulk of the film. Small-angle neutron scattering and mechanical testing revealed that these surfactants acted like plasticizers in the bulk, occupying the amorphous regions of PVA and reducing its glass-transition temperature. NR revealed little impact of plasticizer (glycerol) incorporation on the behavior of these surfactants in PVA. The surfactant molecular area in the segregated monolayer was smaller for DTAO than for DDAO, indicating that the larger molecule was more densely packed at the surface. Surface tension was used to assess the solution behavior of these surfactants and the effect of glycerol incorporation. Determination of molecular area of each surfactant on the solution surface revealed that the structures of the surface monolayers are remarkably consistent when water is placed by the solid PVA. Incorporation of glycerol caused a decrease of molecular area for DDAO and increase in molecular area for DTAO both in solution and in PVA. This suggests that the head group interactions, which normally limit the minimum area per adsorbed molecule, are modified by the length of the alkyl tail.
The vertical depth distributions of amine oxide surfactants, N,N-dimethyldodecyl amine N-oxide (DDAO) and N,N-dimethyltetradecyl amine N-oxide (DTAO), in poly(vinyl alcohol) (PVA) films were explored using neutron reflectometry (NR). In both binary and plasticized films, the two deuterated surfactants formed a single monolayer on the film surface with the remaining surfactant homogeneously distributed throughout the bulk of the film. Small-angle neutron scattering and mechanical testing revealed that these surfactants acted like plasticizers in the bulk, occupying the amorphous regions of PVA and reducing its glass-transition temperature. NR revealed little impact of plasticizer (glycerol) incorporation on the behavior of these surfactants in PVA. The surfactant molecular area in the segregated monolayer was smaller for DTAO than for DDAO, indicating that the larger molecule was more densely packed at the surface. Surface tension was used to assess the solution behavior of these surfactants and the effect of glycerol incorporation. Determination of molecular area of each surfactant on the solution surface revealed that the structures of the surface monolayers are remarkably consistent when water is placed by the solid PVA. Incorporation of glycerol caused a decrease of molecular area for DDAO and increase in molecular area for DTAO both in solution and in PVA. This suggests that the head group interactions, which normally limit the minimum area per adsorbed molecule, are modified by the length of the alkyl tail.
Surface activity, which
is the defining property of a surfactant,
depends not only on surfactant molecular structure but also on its
relationship with the medium in which it is dispersed. It is interesting
therefore to consider whether an aqueous surfactant has recognizably
similar behavior when water is replaced with a polar polymer as the
“solvent”. Although the behavior of surfactants in aqueous
solution has been thoroughly explored, the case where the solution
is replaced by a solid polymer has been addressed very little. The
segregation of components in polymer films affects a wide range of
industries and surfactant segregation has been shown to be important
in the formation and properties of latices.[1−10]In particular, poly(vinyl alcohol) (PVA) films encounter surfactant-rich
environments in a number of areas, including as their use for the
encapsulation of detergents for soluble unit dose laundry and dishwashing
applications. The segregation and migration of surfactants at interfaces
has potential implications in the film behavior and aging, impacting
product performance and lifetime.Poly(vinyl alcohol) is a water-soluble,
synthetic, semicrystalline
polymer with excellent film forming capability, good mechanical properties,
and optical transparency.[11] Its application
in food packaging makes use of the excellent barrier properties of
PVA,[12] but PVA is additionally valued for
its solubility, nontoxicity, and biodegradability[13,14] which contribute to its low overall environmental impact. These
properties, alongside its resistance to organic solvents, have led
to its increased use in the laundry industry as a film for packaging
unit dose detergents.PVA is prepared from the hydrolysis of
poly(vinyl acetate) (PVAc).
The characteristics of PVA are therefore dependent on its degree of
polymerization (DP) as well as its degree of hydrolysis (DH), which
dictates the number of hydroxyl groups present on the backbone, and
must be controlled to optimize the polymer properties for its applications.
PVA generally requires the addition of plasticizers to obtain the
desired properties for many applications. Plasticizers are involatile,
low molecular weight molecules that can modify the polymer matrix,
increasing free volume and chain mobility. They are incorporated into
materials in order to improve processability and flexibility, while
maintaining desirable mechanical properties. Glycerol is one such
compatible plasticizer for PVA.[15]We have studied the segregation of a number of surfactants in poly(vinyl
alcohol) (PVA) and a rich and diverse range of segregation behaviors
have been observed in plasticized and nonplasticized films.[16,17] Plasticizer incorporation was also shown to significantly affect
surfactant distribution; although glycerol suppressed the surface
activity of a nonionic surfactant in PVA, the opposite trend was seen
for the cationic surfactant CTAB and the anionic surfactant sodium
dodecyl sulfate (SDS). There are number of driving forces for this
segregation that have been considered. First, it is expected that
the component with the lowest surface energy will be enriched on the
surface. Incompatibility between components can significantly increase
surface segregation and lead to the formation of wetting layers. This
is complicated, however, by the presence of multiple film components,
including amphiphilic molecules.Here, we study the segregation
behavior of zwitterionic surfactants
in order to identify factors affecting surfactant segregation in PVA.
For the first time, we address the impact of surfactant tail length
on distribution in films and furthermore explore the link between
bulk film properties and surface segregation. Amine oxides are particularly
interesting because of their small but highly polar head group (Figure ). Compared to other
surfactants of the same chain length, they are more hydrophilic, due
to the unusually high dipole moment of the NO group.[18] An important feature of these surfactants is that the dipolar
surfactant can be protonated at the oxygen and so therefore exists
either as a nonionic or cationic species, depending on the pH of the
solution.[19] We have used neutron reflectometry
(NR) with deuterium labeling to identify surfactant segregation in
spin-cast PVA films, and have used surface tension to compare the
surface adsorption in solution with that identified in the solid polymer,
aiming to address the question of how surfactant distribution in spin-cast
films is related to behavior in solution. We also consider the more
complex plasticized system in order to gain insight into interactions
between films components and their compatibility. Furthermore, by
extending this investigation to surfactant structuring in bulk, solution-cast
films, we are able to study systems that are particularly relevant
for soluble unit-dose technologies, an area of wide interest.
Figure 1
Structure of
the amine oxide surfactants. For DDAO and DTAO, n is 5 and 6, respectively.
Structure of
the amine oxide surfactants. For DDAO and DTAO, n is 5 and 6, respectively.
Experimental Section
Materials and Sample Preparation
PVA (Sigma-Aldrich
P8136, Mw = 30–70 kg mol–1, DH = 87–90%), glycerol (Sigma-Aldrich), N,N-dimethyldodecylamine N-oxide
(DDAO; Sigma-Aldrich), N,N-dimethyltetradecylamine N-oxide (DTAO; Sigma-Aldrich), and d5-glycerol (CK isotopes) were purchased and used as received.
Deuterated DDAO (d25) and DTAO (d29) were synthesized at the Rutherford Appleton
Laboratories.PVA was dissolved in deionized water by heating
to 75 °C with stirring to create 4 w/w % solutions. Similar aqueous
solutions of other components (glycerol, d5-glycerol, h-DDAO, h-DTAO, d25-DDAO, and d29-DTAO) were also made at 4% (w/w). Final 4% (w/w) solutions containing
the desired proportion of the polymer with surfactant and/or glycerol
were prepared by mixing the relevant solutions. These solutions were
spin-cast into films of 40–100 nm, varying with surfactant
and glycerol content by using a rotational speed of 3500 rpm during
the drying stage. For neutron reflectivity and atomic force microscopy
(AFM), solutions were spin-cast onto 55 mm diameter, 5 mm thick silicon
blocks that has been first cleaned using permanganic acid, and subsequently
acetone to remove traces of hydrophobic impurities in order to ensure
film consistency. For small angle neutron scattering (SANS) and dynamic
mechanical analysis (DMA), films were solution cast at 40 °C
(rather than spin-cast) to give films of approximately 70 μm
thick.
Neutron Reflectivity
The CRISP reflectometer at the
Rutherford Appleton Laboratories was utilized to obtain vertical concentration
versus depth profiles of spin-cast films under atmospheric conditions.
Deuterium labeling provided contrast via the difference in scattering
length density (SLD) of the components. The SLDs of the materials
used are presented in Table . A complete reflectivity profile, from critical edge to background,
was collected using three incident angles (0.25°, 0.6°,
and 1.5°) in order to obtain a momentum transfer (Q) range of 0.008 < Q/Å –1 < 0.47. This required an acquisition time of 2 h per sample.
Data were fitted using the Motofit package on IGOR.[20]
Table 1
Scattering Length Densities of the
Deuterated and Hydrogenous Film Components
component
SLD/10–6 Å–2
PVA (88% DH)
0.75
Si
2.07
SiOx
3.47
h-glycerol
0.61
d5-glycerol
4.91
hDDAO
–0.20
d25-DDAO
6.90
hDTAO
–0.21
d29-DTAO
6.70
Surface Tensiometry
The surface tensions of dilute
aqueous solutions of amine oxide surfactants and glycerol were measured
using a KRÜSS K10 tensiometer, equipped with a Du Noüy
ring. The platinum ring was cleaned by holding it in a microburner
gas flame immediately before each measurement. Solutions were prepared
using ultrahigh purity water, with a resistivity of 19.2 MΩ
cm obtained from a Sartorius Arium R comfort water purification system.
Surface tension measurements were performed at 20 °C. Repeat
measurements were taken to check the reproducibility, and the accuracy
of the measurements taken was ±0.1 mN m–1.
Determination of Phase Diagrams
Dilute solutions (∼0.4
g) were prepared at defined ratios of PVA and DDAO/DTAO, in which
the initial solute concentration was typically 10% (w/w). These solutions
were applied to a glass slide, which was thermostated to 40 °C.
The mass of the solution was regularly monitored, and the point at
which the solution became cloudy was determined by visual inspection.
Small Angle Neutron Scattering
SANS measurements were
carried out on solution-cast films, approximately 70 μm thick.
The Larmor instrument at ISIS was used with a incident beam, yielding
a fixed momentum transfer range of approximately 0.003 < Q < 0.7 Å –1. Scattering was recorded
as 2D detector images, and each sample was seen to be isotropic. The
2D images were then radially averaged to give the differential scattering
cross section, after reduction to correct for detector efficiency
and background scattering from the substrate.In order to scale
the SANS data to account for the varying thickness of films and quantify I(Q) in units of cm–1, image analysis was used to accurately determine the area of the
irregularly shaped films so that thickness could be calculated from
its mass and density. This is a more reliable approach than using
calipers, which would be likely to damage the relatively soft film
and yield low values for sample thickness. Images were captured using
a diffuse light source and image analysis was subsequently performed
using ImageJ.[22]The SANS data with
a single peak could be captured well by a broad
peak model that can be used to identify the peak position and thus
the distance between scattering inhomogeneities. In this model, the
scattering intensity, I(Q), is calculated
aswhere A is the Porod law
scale factor, n is the Porod exponent, C is the Lorentzian scale factor, m is the exponent
of Q, ξ is the screening length, and B is the flat background. A limited range of the data containing
a secondary peak at higher Q was also fitted with
this simple model in order to extract the positions of the primary
peak. Data was fitted to this model using the software Sasview.[21] Fitted parameters are included in the Supporting Information.
Dynamic Mechanical Analysis
Dynamic mechanical analysis
was performed on samples in order to identify the glass transition
temperatures. Samples for DMA were prepared by solution casting aqueous
solutions of polymer and surfactant containing 10 wt % total solute.
DMA was carried out with a temperature ramp from −40 to 100
°C at 3 °C min–1, and subsequent cooling
at the same rate, using a TA Instruments DMA Q800 system with nitrogen
cooling. Samples were oscillated at a frequency of 1 Hz in an 8 mm
3-point bend geometry. The amplitude of the oscillation was set at
2% strain. The glass transition temperature was inferred from the
maximum of the peak in tan δ, where δ is the phase
angle, calculated as . An average value of the tan delta values
determined upon heating and cooling the film was used.
Results
Distribution
of N,N-Dimethyldodecylamine N-Oxide in PVA films
Neutron reflectivity was used
to determine the depth profiles of DDAO in spin-cast PVA films. The
obtained reflectivity data could be fitted well to a three layer model,
consisting of a thin surfactant-rich layer at the film–air
interface, a bulk polymer-rich layer, and a layer of higher SLD corresponding
to a silicon oxide layer on the substrate. For each composition profile
presented, the numerical values for the layer composition, thickness,
and roughness are tabulated and have been provided in the Supporting Information.The observed SLD
is made up of contributions from the two film components and is assumed
to vary linearly with composition between the SLDs of pure PVA and
pure dDDAO (eq ) (any
nonlinearity from a nonzero volume of mixing is likely to be negligible).
The volume fraction profile of dDDAO, ϕdDDAO(z), can therefore be determined from eq , where ρ is the measured SLD and ρdDDAO and ρPVA are the SLDs of pure dDDAO
and pure PVA, respectively.The depth profiles obtained
from the binary films are shown as
the solid lines in Figure . It should be noted that, due to limited available beam time,
reflectivity for the film containing 2 wt % DDAO was collected using
only the two smallest angles and is therefore missing the data at
high Q. As a result, a slight increase in reflectivity
can be identified at Q ≈ 0.2 Å–1, which would normally not be apparent upon stitching the data with
that from the highest angle.
Figure 2
Volume fraction-depth profiles of 2–20%
DDAO in binary and
plasticized PVA films.
Volume fraction-depth profiles of 2–20%
DDAO in binary and
plasticized PVA films.From these depth profiles,
a very similar surface composition can
be identified for each surfactant concentration. Values for the volume
fraction (ϕDDAO,1) and thickness (d1) of the surfactant in the surface layer are equal in
binary films with each surfactant loading, with the exception of the
lowest loading of 2 wt % (Table ). The thickness of surface layers of each film are
consistent within the precision of the measurement (∼5 Å),
with the measured thickness corresponding well to a surfactant monolayer
adsorbed onto the surface. The surface excess, z*,
defined by eq , where
ϕb is the bulk additive concentration and ϕ(z) is the volume fraction profile in the surface region,
was also calculated. This value can also be used to quantify additive
segregation, as it represents the amount of material segregated from
the bulk in excess of what the concentration would be if the bulk
concentration persisted all the way to the interface. These values
are also included in Table . In the binary films, little change in the surface excess
with surfactant loading can be identified due to the large uncertainties
associated with this measurement as a result of significant error
propagation from each of the fitted parameters.
Table 2
Thickness of Surface Layer (d1), Surfactant Volume Fraction in the Surface
Layer (ϕDDAO,1), and Surface Excesses (z*) of Binary and Plasticized Films Containing dDDAO
ϕDDAO,1/10–2
d1/nm
z*/nm
[dDDAO]/wt %
binary
plast.
binary
plast.
binary
plast.
2
50 ± 20
49 ± 6
1.0 ± 0.4
0.9 ± 0.1
0.4 ± 0.3
0.3 ± 0.1
5
60 ± 10
40 ± 3
1.1 ± 0.5
2.6 ± 0.3
0.5 ± 0.3
0.8 ± 0.2
10
60 ± 10
50 ± 10
1.4 ± 0.3
2.1 ± 0.4
0.5 ± 0.1
0.6 ± 0.2
20
56 ± 10
48 ± 3
1.2 ± 0.3
2.0 ± 0.2
0.5 ± 0.2
0.4 ± 0.1
40
54 ± 3
1.3 ± 0.2
0.24 ± 0.06
NR was also used to explore the effect of the incorporation of
glycerol as a model plasticizer on the distribution of deuterated
DDAO in PVA films. The glycerol loading was fixed at 20 wt %, and
the surfactant concentration was varied from 2 to 20 wt %. The volume
fraction-depth profile of the deuterated surfactant was obtained by
assuming an even distribution of glycerol throughout the film. These
depth profiles are shown as the dashed lines in Figure .For all surfactant loadings, the
concentration of dDDAO in the
surface layer is slightly reduced upon glycerol incorporation. Table also includes the
obtained values for the volume fractions of DDAO in the surface layer
of plasticized films (ϕDDAO,1) and the thickness
of the surface layer, d1. It can be seen
that, as observed with the binary films, surfactant concentration
and thickness of the surface layer is very similar for all surfactant
loadings above 2 wt %, with both sets of values equal for each loading
within the uncertainty of the fitted parameters. In the case of plasticized
films, the consistent structure of the surface layer, regardless of
the surfactant loading (with the exception of 2 wt %), results in
a general decrease in the surface excess as the bulk surfactant concentration
increases.The depth profiles of samples containing deuterated
surfactant
appear to have a thicker silicon oxide layer adjacent to the substrate
(up to 72 Å) than would be expected (approximately 25 Å,
measured by ellipsometry for representative silicon blocks). This
observation strongly suggests adsorption of the deuterated surfactant
to the substrate interface. The SLD of the deuterated surfactant is
similar to that of the silicon dioxide, and so adsorption of an additional
surfactant layer would manifest itself in a thickening of the third
layer in this three-layer model. To test this, reflectivity data for
binary film containing 5 wt % dDDAO was fitted using a four-layer
model, including an additional layer to account for surfactant absorption
to the substrate interface. Although this does result in a slight
improvement in the χ2 values, the other fitted parameters
(thickness and SLD of surface and bulk layers) are consistent within
the uncertainty of these values. Due to the similar SLD of the enriched
layer of deuterated surfactant and the silicon oxide, there is a great
uncertainty in the thickness of this surfactant layer as these two
components cannot be distinguished. Therefore, in order to avoid overparameterization,
the reflectivity data for these systems is fitted using a three-layer
model, although the thickness of the silicon oxide layer can reasonably
be increased due to the presence of surfactant. The increase in thickness
of the silicon oxide layer is of the order of that of a surfactant
monolayer (≈20 Å). The similarity of the profiles obtained
is demonstrated by the comparison of the fits and SLD profiles obtained
using three- and four-layer models (Figure ).
Figure 3
Neutron reflectivity data and fits for a film
containing 5 wt %
dDDAO fitted with a three-layer model and four-layer model (red and
blue dashed lines, respectively).
Neutron reflectivity data and fits for a film
containing 5 wt %
dDDAO fitted with a three-layer model and four-layer model (red and
blue dashed lines, respectively).
Plasticizer Distribution in the Presence of Amine Oxide Surfactants
In order to identify any impact of amine oxide surfactants on the
distribution of glycerol throughout the film, the SLD depth profiles
of films consisting of PVA, deuterated glycerol, and hydrogenous DDAO
were obtained. These are illustrated in Figure . There is much less contrast in SLD between
PVA and the hydrogenous surfactants than between d-glycerol
and the hydrogenous components, and so the NR signal is almost entirely
dominated by the depth distribution of the plasticizer.
Figure 4
SLD depth profile
obtained from reflectivity data for a film containing
hDDAO from 2 to 20 wt % with 20 wt % d-glycerol.
SLD depth profile
obtained from reflectivity data for a film containing
hDDAO from 2 to 20 wt % with 20 wt % d-glycerol.Although the SLDs of the two hydrogenated components differ
significantly,
meaning eq cannot be
applied to accurately determine ϕGly(z), the minimum and maximum concentration of glycerol on the surface
can be determined by considering the remaining surface to be occupied
fully by PVA and fully by hDDAO, which have SLDs of 0.75 × 10–6 and −0.20 × 10–6 Å–2, respectively. The SLD of the surface layer in the
presence of 5 wt % DDAO of 3.3 × 10–6 Å–2 corresponds to 0.61 ≤ ϕGly ≤ 0.69.This therefore reveals some segregation of
the deuterated glycerol.
Previous work has confirmed that no segregation of glycerol occurs
in pure PVA/glycerol films.[17] The increased
concentration of glycerol on the surface therefore reveals the coadsorption
of DDAO and plasticizer into a monolayer on the film surface. Comparison
of the SLD and thickness of this layer shows that, in the same manner
as the surfactant distribution, the segregation of glycerol is consistent,
regardless of the surfactant loading in the film, which further supports
the hypothesis that z* is independent of ϕDDAO,tot. In contrast to the behavior of the surfactant, however,
there was no evidence for glycerol enrichment at the substrate interface.
Impact of Surfactant Tail Length on Amine Oxide Distribution
The effect of the hydrophobicity of the surfactant on the segregation
behavior was assessed by comparing the distribution of N,N-dimethyldodecylamine N-oxide
with N,N-dimethyltetradecylamine N-oxide (DTAO) (12 and 14 carbons in the chain, respectively),
in both binary and plasticized films. At a 20 wt % surfactant loading,
DTAO exhibits very similar segregation behavior to DDAO, where a surfactant
rich layer is present on the surface, the thickness of which corresponds
well to a surfactant monolayer, with the remaining surfactant evenly
distributed throughout the bulk of the film (Figure ). As observed for DDAO, plasticization results
in a decrease in the volume fraction of DTAO and increase in thickness
of this layer, with no overall change in the surface excess. There
is no measurable change in the thickness of the surface layer upon
increasing the number of carbons in the alkyl chain from 12 to 14.
However, there is a significant increase in the surfactant volume
fraction in the surface layer and, as a result, a corresponding increase
in the surface excess.
Figure 5
Comparison of the SLD depth profiles of PVA films containing
dDDAO
and dDTAO.
Comparison of the SLD depth profiles of PVA films containing
dDDAO
and dDTAO.For both surfactants, the obtained
depth profiles show behavior
remarkably similar to that typically observed of surfactants in solution,
with a monolayer adsorbed to the solution–air interface and
the remaining present as aggregates in solution. Based on the assumption
that this profile does indeed reflect an adsorbed pure monolayer on
the surface, rather than a layer of PVA enriched in surfactant, it
is possible to determine the area per molecule from the reflectivity
fitted by modeling the adsorbed layer as a single uniform layer. The
area per molecule, A, can be calculated using eq where ρ is the scattering length
density,
τ is the layer thickness, and Σmb is the total scattering length for the surfactant, with m being the number of atoms
of scattering length b. The coherent scattering lengths of each isotope present in the
surfactants are tabulated below (Table ).
Table 3
Coherent Scattering Lengths of Isotopes
Present in the Surfactant Molecules Comprising the Surface Monolayer
atom
bi/10–5 Å
H
–3.74
D
6.67
C
6.65
N
9.36
O
5.80
There are additional considerations in calculating
the area per
molecule in plasticized films. It is apparent from Figure that glycerol is also enriched
in the surface monolayer, coadsorbed with the surfactant, which will
therefore have some contribution to the SLD of this layer. However,
with the assumption that this surface monolayer in plasticized films
contains only surfactant and glycerol, an approximation can be made.
The SLD contribution from the hydrogenous component (glycerol) is
calculated from the SLDs of the surface monolayer of the two contrasts
via simultaneous equations and subtracted, to leave a corrected value
for the SLD which arises solely from the deuterated component, and
can be used to determine the area per molecule. Without making this
correction in the SLD in order to account for the presence of glycerol
in the surface layer, the calculated area per molecule is lower but
generally within the uncertainty of the corrected value, demonstrating
that the presence of the hydrogenated component has very little effect
on the calculated value of area per molecule. The surfactant molecular
areas in each of the films containing N,N-dimethyldodecylamine N-oxide (binary and plasticized)
calculated using eq are compared in Table .
Table 4
Area per dDDAO and dDTAO Molecule
in the Surface Layer of Binary and Plasticized Films
A/nm2
[dDDAO]/wt %
binary
plasticized
(uncorrected)
plasticized (corrected)
2
0.7 ± 0.3
0.8 ± 0.2
0.9 ± 0.2
5
0.5 ± 0.2
0.29 ± 0.06
0.35 ± 0.09
10
0.5 ± 0.1
0.33 ± 0.09
0.4 ± 0.1
20
0.5 ± 0.2
0.34 ± 0.05
0.40 ± 0.07
40
0.5 ± 0.1
For DDAO, the area per molecule is unchanged
with surfactant loading,
suggesting that the structure of the monolayer is identical, irrespective
of the total amount of surfactant present in the bulk of the film.
For the plasticized films, the area per molecule is again unchanged
with surfactant concentration, with the exception of the film with
the 2 wt % loading, which is significantly larger. This suggests that
there is less than full coverage at 2 wt % but above this the monolayer
formed as a mixture of glycerol and surfactant is identical, regardless
of the surfactant concentration. Due to the large uncertainties associated
with the values for molecular area in the binary films, the effect
of plasticization on the area per surfactant molecule on the surface
monolayer is unclear, but appears to be small.
Film Surface Topography
Assessing the height maps of
the film surface, and particularly considering the roughness of the
film in conjunction with the measured depth profiles, can reveal information
about the nature of the segregated layer, for example, highlighting
the presence of defects. Height maps of representative regions of
nonplasticized spin-cast films with areas of 2 μm2 are shown in Figure . Although there is very little change in the surface upon increasing
[DDAO] from 5 to 20 wt %, when [DDAO] is increased to 40 wt % the
surface features become larger and more pronounced, although, as can
be seen with the scale bar only ranging from −1 to 1 nm, the
film is still very smooth.
Figure 6
Height maps of nonplasticized PVA/DDAO films.
Height maps of nonplasticized PVA/DDAO films.Figure shows the
change in root-mean-square roughness, Rq, and maximum height variation, Rmax.
There is no significant increase in Rq upon DDAO incorporation throughout the entire surfactant concentration
range (even including the pure PVA film). Up to a concentration of
5 wt %, Rmax also remains consistent with
that of the pure PVA film. However, as the concentration is increased
further, there is a substantial increase in Rmax with [DDAO]. Despite this, the low and consistent values
for average roughness shows that the surface monolayer, identified
from the depth profiles obtained using neutron reflectivity, is very
even across the surface. Roughness values are of the same order as
measured by NR and tabulated in Supporting Information, although there is some variation between localized measurements
on wafer-cast films (AFM) and large area averages blocks for NR.
Figure 7
Change
in root-mean-square roughness and maximum roughness of PVA
films with DDAO loading.
Change
in root-mean-square roughness and maximum roughness of PVA
films with DDAO loading.
Solution Properties of
Amine Oxide Surfactants
The
formation of monolayers rather than multilayer of these amine oxide
surfactants in PVA films is different to that previously observed
in any PVA/surfactant system.[16,17] However, this behavior
is analogous to that of surfactants in solution. Surface tensiometry
was used to characterize the behavior of the surfactants in water. Figure shows that the surface
tension of DDAO and DTAO solutions decrease to critical micelle concentrations
of 0.024 and 0.0051 wt % respectively (1.1 and 0.20 mM). These values
are similar to, but both slightly lower than those reported by Birnie
et al.[23] (1.7 and 0.27 mM for DDAO and
DTAO respectively).
Figure 8
Surface tension of aqueous solutions of amine oxide surfactants
in the presence of 0, 20, and 40% glycerol.
Surface tension of aqueous solutions of amine oxide surfactants
in the presence of 0, 20, and 40% glycerol.The Gibbs adsorption equation, eq , enables the determination of the amounts of adsorbed
surfactant from surface tension measurements.[24] Values for the surface excess, Γ, of the surfactant in solution
are included in Table , where it can be seen that the values obtained in film and in solution
are largely consistent. Comparison of the obtained area per molecule
in solution, with the area per molecule on the polymer surface, determined
from the fitted reflectivity data shows that DTAO occupies a smaller
area per molecule than DDAO both in solution and in the film. Additionally,
although there are fairly large uncertainties associated with the
measurement of the area per molecule of DDAO, the areas per molecule
on the film and solution surface are remarkably consistent for both
surfactants studied.
Table 5
Comparison of Surface
Excess (Γ)
and Area Per Molecule of DDAO and DTAO in PVA Films and on the Water
Surface
DDAO
Γ/μmol m–2
A/nm2
solution
film
solution
film
binary
2.90 ± 0.09
3.3 ± 0.7*
0.57 ± 0.02
0.5 ± 0.2*
plasticized
4.89 ± 0.06
4.1–4.7*
0.58 ± 0.01
0.35–0.40*
The effect of plasticizer
inclusion on the surface tension of solutions
of the amine oxide surfactants is shown in Figure . The surface excesses of DDAO and DTAO were
determined at glycerol concentrations of 0, 20, and 40 wt %. These
values are included in Table and illustrated in Figure (values marked with an asterisk represented values
that have not been corrected for the presence of hydrogenous glycerol
in the surface layer). As previously stated, DTAO occupies a lower
area per molecule than DDAO. As with the PVA matrix, addition of glycerol
has relatively little impact on the surface excess. However, upon
incorporation of 20 wt % glycerol the molecular area of both surfactants
on the solution surface is unchanged. In contrast, at 40 wt % glycerol
the two surfactants appear to converge to the same molecular area.
Figure 9
Change in molecular area of DDAO and DTAO on the solution surface
with glycerol concentration
Change in molecular area of DDAO and DTAO on the solution surface
with glycerol concentration
Compatibility of the PVA/Amine Oxide Surfactant System
Compatibility
has been previously demonstrated to have a significant
influence on surfactant segregation and the ternary phase diagrams
have been shown to provide a useful measure of the compatibility of
the PVA/water/SDS system.[16] PVA/water/amineoxide surfactant phase diagrams were constructed by determining points
at which the system clouds during solution casting. The ternary phase
diagrams for the PVA/DDAO/water and PVA/DTAO/water systems are shown
in Figure . It can
be seen that all compositions relevant for the formation of spin-cast
films are well into the one-phase region; in the absence of water,
over 50 wt % surfactant can be incorporated before phase separation
occurs. There is surprisingly little difference in the phase behavior
of DDAO and DTAO, which is reflected in their very similar depth profiles
and segregation behavior. This shows that the significant increase
in hydrophobicity with the extra −C2H4 group in DTAO is not obviously reflected by a change in compatibility
with PVA. This result suggests that the unfavorable interaction between
the surfactant tail group and the PVA matrix is less significant than
it is in water, where the critical micelle concentration (CMC) is
significantly dependent on the tail group length.
Figure 10
Ternary phase diagrams
of the binary DDAO/PVA and DTAO/PVA systems,
in units of mass fraction.
Ternary phase diagrams
of the binary DDAO/PVA and DTAO/PVA systems,
in units of mass fraction.Small angle neutron scattering can provide further insight into
the structures present in polymer samples, and thus be used as a tool
to better understand the nature of the surfactant aggregates. Data
was collected on PVA films containing amine oxides and/or glycerol
in varying ratios.SANS data for binary and plasticized films
containing dDDAO and
dDTAO at concentrations ranging from 0 to 40 wt % are shown in Figures and 12, respectively. All samples scatter strongly, exhibiting
a large peak in scattering intensity at Q ≈
0.055 Å–1. Because the size of this peak increases
with surfactant concentration, it strongly suggests the aggregation
of the deuterated surfactant within the samples. However, the strong
SANS signal and segregation of surfactant is not inconsistent with
the apparent solubility of the surfactant from the phase diagrams.
This is because light scattering/turbidity is on scale approaching
microns at the least whereas SANS is sensitive to the smaller scale
of semicrystalline domains.
Figure 11
SANS data for the binary PVA/DDAO and PVA/DTAO
systems. Solid curves
are fits using the broad peak model.
Figure 12
SANS
data for the plasticized (20% glycerol) PVA/DDAO and PVA/DTAO
systems. Solid curves are fits using the broad peak model.
SANS data for the binary PVA/DDAO and PVA/DTAO
systems. Solid curves
are fits using the broad peak model.SANS
data for the plasticized (20% glycerol) PVA/DDAO and PVA/DTAO
systems. Solid curves are fits using the broad peak model.The peak at Q ≈ 0.055 Å–1 is present in all samples, including PVA in the absence
of additional
additives. This is therefore likely to be due to scattering from the
interface between the amorphous and crystalline domains of the polymer,
with contrast in the pure PVA arising due to the density differences
of the two regions. The position of this peak in pure PVA (Q0 = 0.054 Å–1) is largely
unchanged upon incorporation of either 20% d-glycerol or
up to 20% deuterated amine oxide surfactants, strongly suggesting
that scattering from the same structures is measured, but intensity
is significantly greater in the latter system due to the increased
contrast between amorphous and crystalline domains as a result of
a higher concentration of additive with a greater SLD.From
the peak positions, determined from Q0, the characteristic distance corresponding to this peak, d0, can be calculated using eq . The variation in d0 for binary and plasticized films containing dDDAO and dDTAO
is shown in Figure .
Figure 13
Spacing between scattering structures in binary and plasticized
PVA films containing DDAO and DTAO, determined from peak positions
of SANS data. Curves are a guide to the eye.
Spacing between scattering structures in binary and plasticized
PVA films containing DDAO and DTAO, determined from peak positions
of SANS data. Curves are a guide to the eye.First considering the binary films, it can be seen that, in the
concentration range of 2–20% surfactant, there is very little
difference in the spacing between the regions occupied by DDAO and
DTAO, and there is no significant change in d0 with surfactant concentration. Upon incorporation of 40%
DDAO, however, there is a substantial increase in d0. There is no difference between the values for DDAO
and DTAO, and thus this feature is not directly related to surfactant
molecular structure.In the case of the plasticized films, there
is again very little
difference between the spacing between scattering structures in PVA
films containing DDAO and DTAO at each concentration. However, in
contrast to the binary films, there is a general increase in d0 with surfactant concentration.At high
surfactant loadings (20% DDAO and 10% DTAO) a secondary
peak at higher Q appears (denoted Q1). This is likely to be due to the structuring of the
surfactant within the surfactant-rich domains, such as the formation
of micelles. The position of this secondary peak is consistent with
that previously observed for DDAO in solution, which has been consistently
modeled as prolate ellipsoids.[25−27] The peak position is also related
to the spacing, d, of the scattering inhomogeneities
by eq . Based on Q1 ≈ 0.15 Å–1,
determined from the data corresponding to PVA containing 40% DDAO,
the secondary peak corresponds to a distance, d1, of 41 Å. This correlates well with the length of a
fully extended DDAO bilayer.[28] Although
a value for d1 cannot be accurately determined
from the SANS data on binary films, comparison of the secondary peak
positions (Q1) for DDAO and DTAO in plasticized
PVA films reveals that Q1DDAO (0.19 Å–1) > Q1DTAO (0.15 Å–1), which reflects the larger size of the aggregates
formed from the surfactant with the larger hydrocarbon tail.
Discussion
Distribution
of Components in PVA/Amine Oxide Surfactant Films
Neutron
reflectivity has revealed that the amine oxide surfactants
behave much like classical surfactants in PVA as well as water, forming
a monolayer layer on the surface, but the majority of the surfactant
is evenly distributed throughout the bulk film. In order to fairly
compare the surfactant behavior in a range of model systems containing
the different classes of surfactant, the same polymer used in previous
systems, with a molecular weight range of 30–70 kg mol–1 and a degree of hydrolysis of 87–90%, was
used to prepare the films. Although surfactant multilayer adsorption
has been previously observed with C12E5[17] and SDS,[16] this is
the first system where the adsorption is restricted to a single monolayer.
Surface energy has been previously suggested to be largely responsible
for segregation; comparison of the surface activity of the components
in aqueous solution was able to rationalize the extensive segregation
of SDS and C12E5 from PVA. Surface tensiometry
has shown that the amine oxide surfactants have the lowest surface
tension in solution of all components in the model film system. Therefore,
based on our previous arguments, it would be favorable for them to
segregate more extensively to the surface, with the amount of segregated
additive dependent on the total amount of surfactant present. Despite
this, very little surfactant is actually observed to segregate, and
the amount of segregated surfactant is independent of the total amount
present in the system. However, the substantially lower surface tension
of DDAO and DTAO in solution compared to PVA is likely to lead to
the formation of the surface monolayer in the solid films as this
is sufficient to reduce the surface energy of the system.We
therefore also turn to compatibility arguments to rationalize the
observed depth profiles, and postulate that most of the surfactant
is present in the bulk film due to its high compatibility with the
PVA matrix. Based on the minimal segregation observed even with very
high surfactant concentration, it is probable that most of the surfactant
is present in the bulk film due to its high solubility in the PVA
matrix. This was confirmed by obtaining phase diagrams of the PVA/amineoxide/water systems, which reveal that a substantial amount of surfactant
can be incorporated into the PVA matrix in the absence of water without
phase separation occurring. Amine oxide surfactants are extremely
hydrophilic, with their high hydrophilicity compared to other surfactants
of the same chain length attributable to the strength of the dipole
in the N–O bond of the amine oxide. This property could act
to make them very compatible with the host polymer.[18] It is therefore likely that the strength of their interaction
with hydroxyl groups in the PVA matrix can compensate for the free
energy penalty of having the component with a lower surface free energy
dispersed throughout the bulk.The association of polymers and
surfactants in solution to form
polymer-bound micelles has been thoroughly documented, and it is well-established
that nonionic and cationic micelles do not associate greatly with
hydrophilic polymers.[29] Additionally, although
Brackman and Engberts[30] reported the stabilization
of micelles of DDAO in the cationic form by the hydrophobic polymerspoly(vinyl methyl ether) and poly(propylene oxide), no association
between these polymers and the neutral form of DDAO was identified
in solution. Association of neutral DDAO with polymers has been shown
to occur only when the polymer is sufficiently hydrophobic.[29,31] Indeed DDAO showed no association with the relatively hydrophilic
polymerpoly(ethylene oxide). In the current work with PVA, with the
solutions at the natural pH, the surfactants are almost exclusively
in the neutral form and therefore little interaction with the hydrophilic
PVA in solution would be expected. However, this does not preclude
the possibility of the amine oxide surfactants interacting favorably
with hydroxyl groups present in amorphous regions of the solid film
matrix.
Influence of Plasticizer on Surface Properties of Three-Component
Films
The replacement of some PVA with glycerol on the depth
profile of surfactants in PVA films can have a significant impact
of surfactant and plasticizer distribution due to the competing compatibilities
of the three components. However, we surprisingly observe very little
difference in the segregation of the amine oxide upon glycerol incorporation
other than a slight thickening of this layer, and an increased area
per surfactant molecule for DDAO. The adsorption of glycerol onto
the surface over a similar length scale to the thickness of the adsorbed
surfactant layer signifies the coadsorption of this species with the
surfactant into a more diffuse monolayer, but no other surface enrichment.
It was previously noted that the incorporation of glycerol into a
film containing CTAB results in the segregation of the surfactant
that was not observed in the binary film which is suggested to result
from glycerol out-competing CTAB for sites in the amorphous regions
of the matrix.[17] It was also shown that
glycerol enables the formation of thermodynamically stable stacked
SDS/glycerol layers on the film surface, allowing even more SDS to
segregate than was observed in binary films. In the current system,
the depth profiles observed therefore suggests a greater compatibility
of the amine oxide with the matrix, even in the presence of plasticizer,
probably due to the hydrophilicity of the surfactant.
Interfacial
Adsorption
The thick region of high SLD
(∼3.8 × 10–6 Å–2) on the substrate interface apparent in the SLD depth profiles of
films containing deuterated surfactant (Figure ) is strongly indicative of interfacial surfactant
adsorption. Although neutron reflectivity is not capable of resolving
the nature of the structures at the interface of these films spun
onto a silicon substrate due to the similar SLD of the silicon oxide
and the PVA containing this volume fraction of deuterated surfactant,
there has been substantial evidence for the formation of structures
on solution-substrate interfaces. When reflectivity data for a PVA/DDAO
film was fitted with a 4-layer model, to include an additional surfactant-rich
layer adjacent to the substrate, the thickness of the interfacial
layer was found to be 13 ± 10 Å, which could correspond
to a number of different structures, which have been probed theoretically
and experimentally.[32−35] The significant uncertainty in this value is a result of the difficulty
in resolving the interfacial surfactant from the SiO (25 ± 15 Å). It was previously reported that treating
structured surfactant films as a bilayer generally results in a good
fit to reflectivity data.[35] This surfactant
rich layer present adjacent to the silicon substrate could therefore
correspond either to a monolayer, as observed on the surface, a bilayer-type
structure consisting of a surfactant head group closest to the hydrophilic
substrate, a tail region, and another head group region adjacent to
the bulk polymer film, or a more complex structure such as cylindrical
aggregates, as observed in the case of nonionic DTAO on the mica-solution
interface by Kawasaki et al.[36] The evidence
from NR suggests that, similarly to the behavior observed in solution,
structures are forming on the film–substrate interface. They
are not multilayered, however, and are therefore consistent with the
single-phase behavior of the surfactant in the bulk. Although here
we do not focus on the nature of these aggregates, this finding presents
convincing evidence that the behavior of the surfactant in the solid
film is parallel to that in solution.
Structure of Surface Monolayer:
DDAO vs DTAO in Film and Solution
It is particularly noteworthy
that the surfactant exhibits identical
behavior when water is replaced by a solid polymer, given the significant
differences in surface tension of pure water and pure PVA. Although
a range of surface energy values for PVA have been reported, from
37 to 59 mN m–1[37−39] depending on the degree
of hydrolysis and molecular weight, all are higher than the surface
tension of the surfactant solutions above the CMC. This strongly suggests
that difference in surface energy is not the predominant driving force
for this segregation, as concluded in previous systems.When
discussing the nature of the surfactant behavior both in the film
and in solution, it is important to acknowledge the equilibrium between
the protonated and unprotonated forms of the surfactant. The equilibrium
constant, Ka is defined asThe pKa can be
written in terms of the degree of ionization of the micelle, αMAt neutral pH, the amine
oxides are almost
exclusively in the neutral form, although the presence of the cationic
species should be considered. The pKm value
can be defined as the intrinsic proton dissociation constant of the
micelle, rather than the single surfactant molecules. This is known
to be greater than that of the single surfactant molecule.[40,41] It is particularly relevant that Maeda and Kakehashi[18] have shown that DDAO and DTAO have significantly
different pKm values. Despite having identical
head group chemistry, the interfacial arrangement, which is partly
governed by the size of the tail groups, has an impact on the head
group separation and so the degree of dissociation. As a result, pKm(DDAO) (5.89) is smaller than pKm(DTAO) (6.30), meaning that a higher concentration of
the cationic species of DTAO is likely to be present in solution than
in the corresponding DDAO solution. This is thought to be a result
of the different shapes of the largely nonionic micelles; DDAO has
been shown to form spherical micelles, whereas DTAO forms rodlike
micelles. Although these pKm values were
taken in solutions containing 1 M NaCl, it was determined that the
salt concentration has no significant effect on pKm. The degree of protonation therefore affects both the
solution and surface properties of the surfactant, including CMC,
aggregation number, and aggregate shape. This is due to the well-known
hydrogen bonding between cationic and nonionic amine oxide groups,[42] the likely formation of hydrogen bonds between
two neighboring cationic groups,[43] and
the dipole–dipole interactions between the nonionic species.[18] Solutions for both surface tension measurements
and spin-casting were used at natural pH, above pH 7, and the amineoxide groups in these conditions are predominantly nonionic.However, analysis of the Gibbs isotherms has shown that DTAO occupies
a significantly smaller area per molecule than DDAO does. As the area
per molecule on the surface is highly sensitive to the degree of ionization
(α) of the surfactants, it is probable that the lower area per
molecule is due to the slightly greater degree of ionization of DTAO
(although a substantially greater degree of ionization would lead
to a greater molecular area due to greater head group repulsion).
However, the dissociation constants of the surfactant monomers are
not identical to that in the micelle as the introduction of charges
is generally more favored on the micelle surface. Despite this, it
is plausible that even a slightly higher concentration of the cationic
surfactant in DTAO solutions would result in the formation of strong
hydrogen bonds on the surface between the cationic and nonionic head
groups, leading to the formation of dimers and decreasing the average
area per head group. This effect is then replicated in the solid film,
where the area per molecule is greater for DDAO than DTAO, with values
consistent with those of the area on the solution surface. This suggests
that the nature of interactions is consistent when the bulk is water
or solid PVA.
Influence of Glycerol on Surfactant Molecular
Area
At the highest concentration, the presence of glycerol
has the opposite
effect on the areas of the DDAO and DTAO molecules both in the film
and solution. With a pKa of 14.4,[44] the incorporation of glycerol into the mixtures
is expected to have a negligible increase in the proportion of the
cationic species from that of the binary solutions. We therefore suggest
that it is the interaction between the surfactant head groups and
the plasticizer molecules that affects the area per molecule on the
surface. This should be addressed by considering the nature of the
interactions between the surfactant and glycerol.The effect
of glycerol on surfactant behavior has been addressed in a number
of systems including ionic and nonionic surfactants,[45−47] although there have been no reported studies on the effect of cosolutes
such as glycerol on the surface tension or micellization behavior
of amine oxide surfactants. In general two different mechanisms for
the action of cosolvents such as glycerol on the micellization of
surfactants have been suggested. The first is an indirect mechanism,
where the additive changes the properties of the aqueous medium, in
particular the dielectric constant, which impacts the electrostatic
interaction in solution. This is generally accepted in the case of
ionic surfactants. The second is a direct mechanism, where the additive
replaces some of the water molecules that hydrate the surfactant.
D’Errico et al.[45] investigated the
effects of glycerol on the cationic surfactant CTAB and the nonionic
ethoxylated surfactant Brij 58. Although the CMC of CTAB is affected
by the presence of the cosolute only above 30 wt % glycerol, above
this concentration the area per surfactant molecule was found to increase
almost linearly with the glycerol concentration. The average area
per Brij 58 molecule on the surface was also found to follow a generally
linear increase with concentration. In both of these systems, the
authors found no evidence of a direct interaction between the surfactant
and glycerol molecules. However, different behavior could be reasonably
expected of the amine oxide surfactants studied in this work due to
the strong N–O dipole and ability to form strong hydrogen bonds
with the additive.It is surprising that, in solutions containing
40 wt % glycerol,
the molecular areas of DDAO and DTAO appear to be equal, given that
this suggests a decrease in molecular area for the former surfactant
and increase in molecular area for the latter. This is likely to be
a result of the breakdown in ideality assumed in determining the molecular
area using the Gibbs Adsorption equation. It is possible that this
nonideality is caused by the hydrogen bonding between glycerol and
amine-oxide groups, rather than the presence of any cationic-nonionic
hydrogen bonds. It is plausible that the strength of hydrogen bonds
between glycerol and the surfactant head group are stronger than the
dipole–dipole interactions between the nonionic head groups
predominantly present in the DDAO solution/film.The lack of
change of molecular area in solution for both surfactants
when glycerol content is increased from 0 to 20 wt % is surprising.
This behavior suggests that in this system, the monolayer is unaffected
by the cosolute at this loading as there is no coadsorption of glycerol
in solution. (This is in contrast to the solid film, where enrichment
of d-glycerol to the surface of PVA containing 20 wt % d-glycerol is apparent, Figure ). This argument can be used to explain the observations
in both solution and films. However, the inconsistency of the values
for Asurf between solution and film in
the presence of 20 wt % glycerol suggests a subtle difference in the
behavior of surfactants when water is replaced by a solid polymer;
in the presence of the PVA, much lower loading of glycerol is required
for its coadsorption to the surface.
Compatibility of the PVA/Amine
Oxide Surfactant System
The high compatibility of the PVA/amineoxide surfactant system,
as revealed by the ternary phase diagram, was previously discussed
in terms of its role in the resulting surfactant distribution in spin-cast
films. This high compatibility of the amine oxides with PVA can also
be corroborated with findings from small angle neutron scattering.
First, SANS demonstrates that these molecules are localized in specific
regions already present in the polymer. As it is clear from the SANS
data that the surfactants localize in the same region as glycerol,
a commonly used plasticizer, it is probable that DDAO and DTAO are
localized in the amorphous regions of the polymer. This was confirmed
by the effect of DDAO on the glass transition temperature of PVA films
was measured using DMA (presented in the Supporting Information). If the additive localizes in the amorphous regions,
a change in glass transition temperature would result, whereas this
would not be expected should the additive localize exclusively in
the crystalline regions, or as a separate phase. From the clear decrease
in Tg with DDAO concentration it can be
concluded that the amine oxides occupy the amorphous regions, contributing
to the plasticization of the PVA.The lack of change in d0 upon increasing the concentration of both
DDAO and DTAO from 0 to 20% (Figure ) suggests that these additives can be incorporated
at a high loading without substantially changing the overall structure
of the polymer. With 40% DDAO, however, the size of the amorphous
domains must increase to accommodate the surfactant, leading to an
increase in d0. In contrast to the binary
films, in plasticized films, where 20% glycerol is additionally incorporated,
the inclusion of as little as 5% surfactant causes a substantial increase
in d0, which increases almost linearly
with additive concentration. This likely indicates that the preferential
occupation of both surfactant and plasticizer in the amorphous domains
causes an increase in size of these regions and a resulting greater
spacing between the crystallites.
Conclusion
Two
zwitterionic surfactants have shown segregation behavior in
PVA remarkably similar to their behavior in water, showing molecular
areas that are equal in solution and in the film. Neutron reflectivity
has additionally shown that the composition of the surface of the
films is the same, regardless of the surfactant loading. To date,
this is the only polymer/surfactant system observed where the surfactant
has such similar behavior to that in aqueous solution. This has been
attributed to the small amine-oxide group which affords the surfactant
a high level of compatibility with the polymer matrix. The head group
is also capable of strong dipole–dipole bonds with adjacent
head groups, resulting in the favorable formation of a monolayer on
the surface. Comparison of the molecular area of DDAO and DTAO shows
that the longer chain surfactant has a lower molecular area, which
is due to the higher degree of ionization and hence the stronger interhead
group interactions. The nature of the intermolecular interactions
in the monolayer can be used to justify the effect of the incorporation
of glycerol on the molecular areas of DDAO. Although there are some
subtle differences between the surfactant behavior in solution and
in the film, the remarkable and unprecedented similarity between the
systems demonstrates the importance of the interactions between the
head groups. Furthermore, these surfactants, which are unusually compatible
with PVA, were also observed to have a distinct plasticizing effect
on the polymer matrix, which may be a significant consideration for
using PVA films to encapsulate surfactants and their mixtures.