| Literature DB >> 32191041 |
Juan Molina1, Daniel Ramos1, Eduardo Gil-Santos1, Javier E Escobar1, José J Ruz1, Javier Tamayo1, Álvaro San Paulo1, Montserrat Calleja1.
Abstract
We describe an optical transduction mechanism to measure the flexural mode vibrations of vertically aligned nanowires on a flat substrate with high sensitivity, linearity, and ease of implementation. We demonstrate that the light reflected from the substrate when a laser beam strikes it parallel to the nanowires is modulated proportionally to their vibration, so that measuring such modulation provides a highly efficient resonance readout. This mechanism is applicable to single nanowires or arrays without specific requirements regarding their geometry or array pattern, and no fabrication process besides the nanowire generation is required. We show how to optimize the performance of this mechanism by characterizing the split flexural modes of vertical silicon nanowires in their full dynamic range and up to the fifth mode order. The presented transduction approach is relevant for any application of nanowire resonators, particularly for integrating nanomechanical sensing in functional substrates based on vertical nanowires for biological applications.Entities:
Keywords: Nanoelectromechanical Systems (NEMS); Nanomechanical Resonators; Nanomechanical Sensors; Semiconductor Nanowires; Silicon Nanowires
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Year: 2020 PMID: 32191041 PMCID: PMC7146857 DOI: 10.1021/acs.nanolett.9b04909
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189
Figure 1Experimental system and measurement setup. (a) Scanning electron microscopy image of a representative example of the Si nanowires considered in this work as a model system. (b) Representation of the orthogonal vibrations corresponding to the lower- and upper-frequency components of the fundamental flexural mode doublet of a Si nanowire and its relative position with respect to the parallel incidence probe laser beam. (c) Schematic depiction of the measurement setup.
Figure 2Detection of a fundamental flexural mode doublet and demonstration of the effect of varying the relative nanowire–laser beam position. (a) Resonance spectra of an undriven nanowire at varying angles between the nanowire–laser beam vector and the lower-frequency vibration axis. (b) Mapping of the lower-frequency oscillation amplitude as a function of the relative nanowire–laser beam position. (c) Mapping of the upper-frequency oscillation amplitude as a function of the relative nanowire–laser beam position.
Figure 3Transduction mechanism model and experiment–theory comparison. (a) Mapping of collected optical power as a function of the relative nanowire–laser beam position (the nanowire is located at the center of the map). (b) Cross-section of the previous map showing the variation of reflected power as the laser beam is translated along the nanowire center position. (c) Gradient (absolute value) of the collected optical power shown in part a. (d) Cross-section of the previous map showing the variation of the reflected power gradient when the beam is displaced along the nanowire center position. (e, g) Schematic depiction of the projections along the nanowire–laser position vector of the lower- and upper-frequency vibration amplitudes (aL, aU). (f, h) Mapping of the projections of the reflected power gradient along the lower- and upper-frequency vibration axis, respectively. (i, j) Experiment–theory comparison of the thermomechanical resonance spectra of an undriven nanowire for the lower-frequency (i) and upper-frequency (j) components of the fundamental flexural mode doublet.
Figure 4Transduction in full dynamic range and high-order flexural modes of vertical Si NW resonators. (a) Resonance spectra showing the lower and upper resonance peaks of the fundamental mode doublet of a Si nanowire driven with varying piezo voltage amplitudes, from 0 V (thermomechanical fluctuations) to 800 mV (slightly above the onset of the nonlinear regime). (b) Peak amplitude vs piezo voltage amplitude obtained from the previous results. (c–g) Resonance spectra and amplitude mappings from the fundamental (c) to the fifth order mode (g) for a Si nanowire driven just below the onset of the nonlinear regime (a full experiment–theory comparison for the resonance frequency values is provided in the Supporting Information). All resonance spectra were measured at θ0 = 0° for the lower peak and θ0 = 90° for the upper peak. All amplitude maps are 20 × 20 μm2 with a Z-range equivalent to the vertical axis of the corresponding resonance spectra.
Figure 5Effect of optical power on sensitivity and noise performance. (a) Resonance spectra showing the lower resonance peak of the fundamental mode doublet of an undriven Si nanowire obtained for varying optical power from 0.4 to 17.7 μW. (b–e) Peak amplitude, SNR, resonance frequency, and quality factor vs optical power obtained from the previous results. (f) Resonance frequency fluctuations (Allan deviation) vs acquisition time for a Si nanowire driven just below the onset of the nonlinear regime obtained at different values of the optical power. (g) Resonance frequency fluctuations (Allan deviation) vs optical power at varying acquisition times obtained from the previous result, highlighting the minimum frequency fluctuations achievable as a function of the optical power (red line).