| Literature DB >> 31863018 |
Samuele Cornia1,2, Francesco Rossella3, Valeria Demontis3, Valentina Zannier3, Fabio Beltram3, Lucia Sorba3, Marco Affronte1,2, Alberto Ghirri4.
Abstract
With downscaling of electronic circuits, components based on semiconductor quantum dots are assuming increasing relevance for future technologies. Their response under external stimuli intrinsically depend on their quantum properties. Here we investigate single-electron tunneling in hard-wall InAs/InP nanowires in the presence of an off-resonant microwave drive. Our heterostructured nanowires include InAs quantum dots (QDs) and exhibit different tunnel-current regimes. In particular, for source-drain bias up to few mV Coulomb diamonds spread with increasing contrast as a function of microwave power and present multiple current polarity reversals. This behavior can be modelled in terms of voltage fluctuations induced by the microwave field and presents features that depend on the interplay of the discrete energy levels that contribute to the tunneling process.Entities:
Year: 2019 PMID: 31863018 PMCID: PMC6925118 DOI: 10.1038/s41598-019-56053-2
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Optical microscope image of the whole electrical device with central YBCO/sapphire coplanar resonator. Gold contacts and bonding pads are used for connecting dc lines and the coplanar resonator to the external cables. (b) Scanning Electron Microscope (SEM) close-up showing the antenna tip and the leads of two NW QD devices. In panels (a) and (b) the finite-element simulation of the distribution of the electric component of the fundamental mode of the resonator is superimposed with false colours. The colour scale is normalized to the maximum value. (c) False colour SEM image of the NW QD device investigated in this work, where source (S), drain (D) and gate (G1, G2) leads are indicated. (d) Schematic diagram of the InAs/InP NW QD. (e) Sketch of the NW QD showing InAs (light grey) and InP (dark grey) sections.
Figure 2(a) Stability diagram (bottom panel) and crosscut at V = 1 mV (top panel) of the log(|I|) current measured at T = 2 K. (b) Blow-up of the current map measured in the proximity of the peak at = 0.86 V. The colour scale is logarithmic. (c) Schematic diagrams showing the configuration of the electrochemical potentials of ground (ε′) and first excited (ε″) states in correspondence of the symbols in panel (b).
Figure 3Evolution of the I(V) characteristics in the presence of a microwave drive of frequency ω0 and increasing power P. Three dimensional plots and maps are measured for gate voltage around V (a,b) and = 0.86 V (c,d) at the temperature T = 2 K. Solid lines indicate the contour of regions with negative I. The dashed line in panel (d) display the zero current points used to extract the peak width ΔV. (e) Schematic energy diagrams showing the MW-assisted tunneling through the dot levels ε′ and ε″. (f) I(V) characteristics calculated for V ≃ 0 by averaging the measured current over increasing voltages .
Figure 4(a–d) Charge stability diagrams measured around the Coulomb peak at gate voltage = 0.86 V. (e–h) Calculated evolution of the stability diagrams in presence of different voltages as reported in the text.