| Literature DB >> 31824890 |
Mohammed Mousa Bakri1,2, Sung Ho Lee3, Jong Ho Lee4,5.
Abstract
BACKGROUND: A compact passive oxide layer can grow on tantalum (Ta). It has been reported that this oxide layer can facilitate bone ingrowth in vivo though the development of bone-like apatite, which promotes hard and soft tissue adhesion. Thus, Ta surface treatment on facial implant materials may improve the tissue response, which could result in less fibrotic encapsulation and make the implant more stable on the bone surface. The purposes of this study were to verify whether surface treatment of facial implant materials using Ta can improve the biohistobiological response and to determine the possibility of potential clinical applications.Entities:
Keywords: Silicone; Surface treatment; Tantalum ion implantation; ePTFE
Year: 2019 PMID: 31824890 PMCID: PMC6879676 DOI: 10.1186/s40902-019-0231-3
Source DB: PubMed Journal: Maxillofac Plast Reconstr Surg ISSN: 2288-8101
Fig. 1Intraoperative photograph. Intraoperative photograph showing the implant material adapted to the calvarium before suturing. The rat’s head was shaved and disinfected prior to making an incision. A 2-cm-long transverse incision was made on the rat’s calvarium. Then, the implant was placed subperiosteally over the calvaria
Fig. 2Transmission and scanning electron microscopy images of a tantalum implanted ePTFE implant material. A Transmission electron microscopy images: (a) A protective carbonic layer was formed on the implant material surface after treatment with Ta. (b) Ta layer after implantation. (c) ePTFE implant material. B Scanning electron microscope images: long two-headed arrows, protective carbonic layer. Short two-headed arrow, Ta layer after ion implantation. (d) ePTFE implant material
Cell viability assessment
| Mean ± SD | Mean ± SD | |||
|---|---|---|---|---|
| Group | Fibroblast | Osteoblast | ||
| Ta-treated silicone | 0.060 ± 0.013 | 0.4 | 0.173 ± 0.101 | 0.7 |
| Untreated silicone | 0.054 ± 0.008 | 0.128 ± 0.070 | ||
| Ta-treated ePTFE | 0.089 ± 0.034 | 0.4 | 0.349 ± 0.285 | 0.7 |
| Untreated ePTFE | 0.062 ± 0.023 | 0.202 ± 0.081 |
Fig. 3Photomicrographs of the histological slides. Photomicrographs of the histological slides showing biological responses toward Ta-treated and untreated facial implants. a Untreated silicone implant material and b Ta-treated silicone implant material. The two-headed arrows in a and b indicate the soft tissue thickness between the implant material and the bone at 8-week intervals. c Untreated ePTFE implant and d treated ePTFE implant material. The upwards filled arrows in c and d indicate newly formed bone between the implant material and the bone at 4-week intervals (H&E stain, × 400)
Histological evaluation of silicone implants
| Soft tissue thickness | New bone formation | |||||
|---|---|---|---|---|---|---|
| Mean ± SD | Mean ± SD | |||||
| Ta-treated | Untreated | Ta-treated | Untreated | |||
| 4 weeks | 73 ± 34 | 92 ± 43 | 0.7 | 0.00 | 0.00 | – |
| 8 weeks | 82 ± 27 | 115 ± 54 | 0.3 | 0.20 ± 0.45 | 0.20 ± 0.45 | 1.00 |
Soft tissue thickness in the ePTFE implant materials
| Soft tissue thickness | New bone formation | |||||
|---|---|---|---|---|---|---|
| Mean ± SD | Mean ± SD | |||||
| Ta-treated | Non-treated | Ta-treated | Non-treated | |||
| 2 weeks | 95 ± 71 | 111 ± 70 | 0.6 | 0.60 ± 0.55 | 0.50 ± 0.58 | 0.8 |
| 4 weeks | 38 ± 17 | 70 ± 63 | 0.7 | 1.40 ± 0.89 | 1.33 ± 1.15 | 0.9 |