| Literature DB >> 31442256 |
Shokouh Attarilar1, Mohamad Taghi Salehi1, Khaled J Al-Fadhalah2, Faramarz Djavanroodi3,4, Masoud Mozafari5.
Abstract
Commercially pure titanium was processed by equal channel angular pressing (ECAP) and surface mechanical attrition treatment (SMAT) for the purpose of developing functionally gradedEntities:
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Year: 2019 PMID: 31442256 PMCID: PMC6707610 DOI: 10.1371/journal.pone.0221491
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Fig 1Schematic illustration of ECAP die including channel angle Φ and corner angle Ψ.
Fig 2A schematic of surface mechanical attrition treatment (SMAT) device, indicating different parts of device.
The condition and name of different CP Ti samples.
| Sample name | condition | Used beads and SMAT duration | ECAP pass numbers |
|---|---|---|---|
| A | Annealed Ti | - | 0 |
| SA | SMAT processed annealed Ti | Zirconia– 2 hours | 0 |
| 4E | Four passes ECAPed Ti | - | 4 passes |
| S4E | SMAT processes four passes ECAPed Ti | Zirconia– 2 hours | 4 passes |
Fig 3Band contrast of the CP Ti sample in the annealed condition with average grain size of 24 μm.
Fig 4The EBSD grain boundary and Euler maps of Ti samples showing the different structural regions in the depth of samples produces by SMAT and ECAP processing, these regions are entitled from top to bottom as nanostructured, deformed and undeformed zones.
The undeformed zone is not affected by SMAT. Black lines showing HAGBs and gray lines are LAGBs; (a) sample A; (b) sample 4E grain boundary maps before SMAT processing; (c) sample SA; (d) sample S4E grain boundary maps showing the effect of SMAT processing; (e) and (f) corresponding Euler maps of (c) and (d); (g) the necklace structure formation in 4E sample, magnified and rotated from the illustrated red oval region of 4E sample in (b), the squared regions shows the formation of incomplete HAGB segments; (h) band contrast map of magnified rectangular region in (c) showing the unindexed nanograined region and the red arrow shows the thickness of unindexed region.
Fig 5Misorientation and grain size distribution of SMATed samples; (a) and (b) misorientation; (c) and (d) grain size distribution of SA and S4E samples respectively in accordance to relative frequency. The black arrow shows the existence of twin boundaries.
The average grain size, fraction of HAGBs and standard deviation of different Ti samples calculated by EBSD data.
| Sample Name | Average grain size | Fraction of HAGBs | Standard deviation |
|---|---|---|---|
| A | 24 μm | ~100% | 9.43 |
| SA | 8 μm | 97.08% | 7.81 |
| 4E | 500 nm | 32% | 0.42 |
| S4E | 420 nm | 95.57% | 0.29 |
Fig 6Surface properties of Ti samples; AFM topography of samples in 20*20 μm2 area, (a) A, (b) SA, (c) 4E, and (d) S4E sample; (e) contact angle results of Ti samples; (f) SEM micrograph of SMATed as-received Ti (SA) sample showing the SMAT effected zone full of micrometer ranged cracks and pores.
Contact angle and roughness and values of different titanium samples in 20×20 μm2 area.
| Sample | Contact Angle | Ra (nm) | Rz (nm) | Rq (nm) |
|---|---|---|---|---|
| 66.37° | 9.907 | 78.45 | 71.44 | |
| 71.78° | 10.53 | 117.4 | 75.95 | |
| 56.23° | 10.51 | 139.1 | 75.77 | |
| 63.06° | 18.89 | 304.3 | 136.9 |
Fig 7(a) Vickers microhardness values of the as-received sample with and without SMAT processing SA and A samples in different depths from the SMAT affected surface; (b) Nanoindentation hardness and reduced Young modulus (Er) results in depth from SMAT affected surface 4 passes ECAPed samples with and without SMAT processing S4E and 4E samples.
Fig 8Osteoblast cell behavior of Ti samples; SEM images of G292 cells growing on Ti sample after 24 h of incubation: (a) A sample; (b) S4E sample; (c) relative cell viability of different titanium samples in 1, 3 and 8 culture days; (d) ALP activity of different titanium samples over 1, 3 and 5 days.