| Literature DB >> 31438644 |
Susu Zhu1,2, Lei Feng1,2, Chu Zhang1,2, Yidan Bao1,2, Yong He3,4.
Abstract
Spinach is prone to spoilage in the course of preservation. Spinach leaves stored at different temperatures for different durations will have varying degrees of freshness. In order to monitor the freshness of spinach leaves during storage, a rapid and non-destructive method-hyperspectral imaging technology-was applied in this study. Visible near-infrared reflectance (Vis-NIR) (380-1030 nm) and near-infrared reflectance (NIR) (874-1734 nm) hyperspectral imaging systems were used. Spinach leaves preserved at different temperatures with different durations (0, 3, 6, 9 days at 4 °C and 0, 1, 2 days at 20 °C) were studied. Principal component analysis (PCA) was adopted as a qualitative analysis method. The second-order derivative spectra were utilized to select effective wavelengths. Partial least squares discriminant analysis (PLS-DA), support vector machine (SVM), and extreme learning machine (ELM) were used to build models based on full spectra and effective wavelengths. All three models achieved good results, with accuracies above 92% for both Vis-NIR spectra and NIR spectra. ELM obtained the best results, with all accuracies reaching 100%. The overall results indicate the possibility of the freshness identification of spinach preserved at different temperatures for different durations using two kinds of hyperspectral imaging systems.Entities:
Keywords: freshness detection; hyperspectral imaging; near-infrared spectra; spinach; visible/near-infrared spectra
Year: 2019 PMID: 31438644 PMCID: PMC6770342 DOI: 10.3390/foods8090356
Source DB: PubMed Journal: Foods ISSN: 2304-8158
Figure 1RGB images of spinach leaves preserved under different temperature conditions: (a) 4 °C; (b) 20 °C.
Figure 2The average spectra with standard deviation (SD): visible/near-infrared (Vis-NIR) hyperspectral images of spinach leaves stored at (a) 4 °C and (b) 20 °C; NIR hyperspectral images of spinach leaves stored at (c) 4 °C and (d) 20 °C.
Figure 3Score scatter plots of spinach leaves stored at (a) 4 °C and (b) 20 °C based on Vis-NIR hyperspectral data. Score scatter plots of spinach leaves stored at (c) 4 °C and (d) 20 °C based on NIR hyperspectral data.
Figure 4Effective wavelengths selected by second-order derivative spectra of spinach leaves stored at (a) 4 °C and (b) 20 °C based on Vis-NIR hyperspectral data. Effective wavelengths selected by second-order derivative spectra of spinach leaves stored at (c) 4 °C and (d) 20 °C based on NIR hyperspectral data.
Corresponding effective wavelengths selected by second-order derivative spectra.
| Hyperspectral Imaging System | Temperature (°C) | No. | Effective Wavelengths (nm) |
|---|---|---|---|
| Vis-NIR | 4 | 15 | 506, 518, 538, 566, 636, 643, 697, 704, |
| 20 | 12 | 506, 518, 538, 636, 643, 698, | |
| NIR | 4 | 14 | 988, 1032, 1132, 1164, 1204, 1321, 1348, |
| 20 | 13 | 995, 1032, 1136, 1164, 1200, 1311, 1348, |
Results of classification models using Vis-NIR spectra based on full spectra and effective wavelengths.
| Temperature (°C) | Classifier | Parameter 1 | Full Spectra | Parameter | Effective Wavelengths (%) | ||
|---|---|---|---|---|---|---|---|
| Calibration | Prediction | Calibration | Prediction | ||||
| 4 | PLS-DA | 12 | 100 | 100 | 11 | 100 | 100 |
| SVM | (108, 1) | 100 | 100 | (106, 102) | 95 | 92.5 | |
| ELM | 10 | 100 | 100 | 11 | 100 | 100 | |
| 20 | PLS-DA | 11 | 100 | 100 | 12 | 100 | 96.67 |
| SVM | (106, 102) | 98.33 | 100 | (104, 105) | 95.00 | 86.67 | |
| ELM | 13 | 100 | 100 | 19 | 100 | 100 | |
1 Parameter means the parameters of partial least squares discriminant analysis (PLS-DA), support vector machine (SVM), and extreme learning machine (ELM) models with optimal performances. The parameter for PLS-DA is the optimal number of latent variables; the parameters for SVM models are the regularization parameter c and kernel function parameter g; the parameter of the ELM model is the number of hidden layer neurons.
Results of classification models using NIR spectra based on full spectra and effective wavelengths.
| Temperature (°C) | Classifier | Parameter 1 | Full Spectra | Parameter | Effective Wavelengths (%) | ||
|---|---|---|---|---|---|---|---|
| Calibration | Prediction | Calibration | Prediction | ||||
| 4 | PLS-DA | 10 | 100 | 100 | 10 | 98.75 | 100 |
| SVM | (106, 103) | 100 | 97.50 | (106, 104) | 98.75 | 92.50 | |
| ELM | 12 | 100 | 100 | 18 | 100 | 100 | |
| 20 | PLS-DA | 4 | 100 | 100 | 4 | 100 | 100 |
| SVM | (103, 103) | 100 | 100 | (103, 105) | 100 | 100 | |
| ELM | 7 | 100 | 100 | 8 | 100 | 100 | |
1 Parameter means the parameters of partial least squares discriminant analysis (PLS-DA), support vector machine (SVM), and extreme learning machine (ELM) models with optimal performances. The parameter for PLS-DA is the optimal number of latent variables; the parameters for SVM models are the regularization parameter c and kernel function parameter g; the parameter of the ELM model is the number of hidden layer neurons.