| Literature DB >> 31396602 |
Ali Syari'ati1, Sumit Kumar, Amara Zahid, Abdurrahman Ali El Yumin, Jianting Ye, Petra Rudolf.
Abstract
The fingerprint of structural defects in CVD grown MoS2 was revealed by means of X-ray Photoelectron Spectroscopy (XPS). These defects can be partially healed by grafting thiol-functionalized molecules. The functionalization does not alter the semiconducting properties of MoS2 as confirmed by the photoluminescence spectra.Entities:
Year: 2019 PMID: 31396602 DOI: 10.1039/c9cc01577a
Source DB: PubMed Journal: Chem Commun (Camb) ISSN: 1359-7345 Impact factor: 6.222