Due to its semiconducting nature, controlled growth of large-area chemical vapor deposition (CVD)-grown two-dimensional (2D) molybdenum disulfide (MoS2) has a lot of potential applications in photodetectors, sensors, and optoelectronics. Yet the controllable, large-area, and cost-effective growth of highly crystalline MoS2 remains a challenge. Confined-space CVD is a very promising method for the growth of highly crystalline MoS2 in a controlled manner. Herein, we report the large-scale growth of MoS2 with different morphologies using NaCl as a seeding promoter for confined-space CVD. Changes in the morphologies of MoS2 are reported by variation in the amount of seeding promoter, precursor ratio, and the growth temperature. Furthermore, the properties of the grown MoS2 are analyzed using optical microscopy, scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), energy-dispersive X-ray spectroscopy (EDX), and atomic force microscopy (AFM). The electrical properties of the CVD-grown MoS2 show promising performance from fabricated field-effect transistors. This work provides new insight into the growth of large-area MoS2 and opens the way for its various optoelectronic and electronic applications.
Due to its semiconducting nature, controlled growth of large-area chemical vapor deposition (CVD)-grown two-dimensional (2D) molybdenum disulfide (MoS2) has a lot of potential applications in photodetectors, sensors, and optoelectronics. Yet the controllable, large-area, and cost-effective growth of highly crystalline MoS2 remains a challenge. Confined-space CVD is a very promising method for the growth of highly crystalline MoS2 in a controlled manner. Herein, we report the large-scale growth of MoS2 with different morphologies using NaCl as a seeding promoter for confined-space CVD. Changes in the morphologies of MoS2 are reported by variation in the amount of seeding promoter, precursor ratio, and the growth temperature. Furthermore, the properties of the grown MoS2 are analyzed using optical microscopy, scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), energy-dispersive X-ray spectroscopy (EDX), and atomic force microscopy (AFM). The electrical properties of the CVD-grown MoS2 show promising performance from fabricated field-effect transistors. This work provides new insight into the growth of large-area MoS2 and opens the way for its various optoelectronic and electronic applications.
Transition-metal dichalcogenides have
gained a lot of popularity
in recent years mainly because of the advantages they provide in terms
of their usage in field-effect transistors (FETs),[1] photodetectors,[2] photodiodes,[3] solar cells,[4] and
phototransistors.[5] The layers of two-dimensional
(2D) materials can be ultrathin, and the band gap can be tuned according
to the thickness of the layers of the material from monolayer to multilayer.[6−8] MoS2 is a very promising 2D material because of its outstanding
performance in terms of carrier mobility,[9] tunability of excitonic effects,[10] and
high current density of monolayer.[11] MoS2 is also one of the stable 2D materials available which makes
its fabrication process easier than other materials.[12] All of these applications of MoS2 rely heavily
on the size, shape, and crystallinity of the crystal. The electronic
structure of MoS2 can be tuned with the thickness of the
crystals, which can be used for applications like spin–valley
coupling[13] and abundant excitons.[14]One of the methods of obtaining 2D MoS2 is mechanical
exfoliation, which is not compatible with industrial-scale manufacturing.[15] Therefore, large-scale synthesis of 2D MoS2 has always been a challenge. Other methods include physical
vapor deposition,[16] chemical vapor deposition
(CVD),[17] liquid exfoliation,[18] and hydrothermal synthesis.[19] Of all of the mentioned methods, CVD is preferred for the
cost-effective growth of highly crystalline and uniform synthesis
of 2D MoS2.[20] Controllable growth
of MoS2 crystals is highly desirable, allowing the control
of thickness,[21] shape, and size of the
MoS2 crystals.[22] CVD provides
an excellent opportunity for the controllable growth of the MoS2 crystals as there are several controllable variables which
can impact the growth of MoS2 crystals.[23] Depending on the control method for CVD, various techniques
have been established for the controllable growth of MoS2 crystals. A better understanding of the chemistry inside the CVD
chamber such as the precursor ratio, precursor decomposition rate,
nucleation, and diffusion provides the basis for establishing control
over the growth of MoS2 crystals.[24]Seeding promoters have been extensively used for the highly
crystalline
growth of MoS2.[25] Studies have
been conducted on the role of alkali metal–based salts in the
growth of transition metal dichalcogenide (TMDC) materials, and it
has been observed that these salts act as seeding promoters having
a positive impact on the synthesis of 2D TMDC materials. The catalyst
effect of NaCl on MoS2 was discussed recently,[26] where both the positive and negative impacts
of NaCl on MoS2 growth were discussed. The role of concentration
boundary layers on the CVD growth of MoS2 using NaCl as
the seeding promoter has been shown recently.[27] Through the control of the concentration boundary and optimization
of parameters, the large-area growths of the monolayer, 2L, and 3L
MoS2 were demonstrated. The substrate-dependent, NaCl-assisted
growth of MoS2 was also discussed.[28] The demonstration of reduction in growth temperature was done along
with the comparison of growth on various substrates. The formation
of a water-soluble seeding layer is also discussed.Moreover,
the confined-space CVD method has proven to be an efficient
method for the growth of 2D materials as it helps in the reduction
of reactants concentration, stabilized growth conditions, and controllability
of vapor flow. It ensures that the growth of 2D materials is of high
quality where the uniformity of the grown 2D material is also maintained.[29] Similar methods have been deployed previously
for attaining large-scale growth of graphene flakes such as the pita-pocket
method[30] and the hole-pocket method,[31] in which high nucleation is controlled by regulating
the adsorption and permeation of the gases used for synthesis. The
confined-space CVD method has also been proven to be a better method for the growth of large-sized and
clean MoS2 crystals as the controlled flow of the precursor
vapors is ensured.[32,33] There are several parameters
which are involved in the growth of the MoS2 crystals;
these include substrate location, amount of precursor, precursor temperature,
seeding promoters, growth pressure, carrier gas flow rate, and the
growth time. Previously various studies have been conducted for the
proper control of these parameters to obtain the desired MoS2 crystal morphology.[34−36] However, an in-depth understanding of the MoS2 synthesis through confined-space CVD at various temperatures
and the addition of NaCl as a seeding promoter still needs exploration.In this work, we have adopted a new method for controllable growth
of MoS2 which amalgamates the NaCl-assisted growth with
confined-space CVD. We demonstrate a systematic study for the large-scale
controllable growth of highly crystalline MoS2 crystals
using the salt-assisted confined-space CVD method. The work explores
the role of NaCl and growth temperature in the controllable growth
of MoS2. The work shows control over the number of layers
of MoS2 as well as over the morphology of grown MoS2. Utilizing various techniques of characterization such as
atomic force microscopy (AFM), optical microscopy (OM), Raman spectroscopy
(Raman), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy
(XPS), and energy-dispersive X-ray spectroscopy (EDX), the analysis
of the crystallinity, uniformity, and thickness of monolayer, bilayer
and bulk MoS2 crystals is done. Moreover, the electrical
performance of the fabricated transistors shows promising results,
which opens the gate for further applications of the CVD-grown MoS2.
Results and Discussion
Figure a shows the schematic
of the confined-space CVD setup
used for the growth of MoS2. The confined space is created
in the crucible when it is blocked with SiO2/Si substrates
from the top (Figure S4). The substrates
placed on the outside of the crucible are the target substrates on
which the escaping vapors from the crucible are deposited (Figure d). The size of both
the blocking and target substrates is 1.5 × 1.5 cm2. However, to ensure that some of the vapors actually escape the
crucible, there are small gaps (1 mm) left in the blocking substrates
that can act as an outlet for the precursor vapors (Figure c). A mixture of MoO3 and NaCl was placed in a crucible in the middle of the furnace while
the sulfur powder is placed on the upstream side (see Experimental Section). The growth conditions are shown in Figure b. Figure e–g shows the deposition
of vaporized precursors on the top substrate. During the growth process
of MoS2 using the confined-space CVD, most of the vapors
of the precursors in the main boat, NaCl and MoO3, are
blocked by the substrates placed directly on top of the boat. This
results in the growth of nonuniform and bulk MoS2 on the
underside in the middle of the substrate. However, the diffusion of
vapors results in the escape of some vapors from the gaps in the top
substrates resulting in their deposition on the target substrates.
As most of the vapors are blocked by the top substrates, the growth
on the target substrates is relatively clean and uniform. The diffusion
of vapors from the crucible and the presence of secondary substrates
result in morphological variations of the grown MoS2 crystals
on the substrates.
Figure 1
(a) Schematic of the CVD setup for MoS2 growth
and (b)
the CVD growth parameters. (c) Top view of the placement of substrates
on the top and sides of the crucible. (d) Side view of the schematic
explaining escaping vapors from the crucible and their deposition
on the target substrates. The growth on the top SiO2 substrates:
(e) Deposition of MoO3 and NaCl vapors on the top substrate.
(f) Sulfurization of nucleation sites in the middle of the substrate
resulting in bulk MoS2 growth in the middle and crystals
around the edges. (g) OM image of the MoS2 growth on the
top substrate. Growth on SiO2 substrates placed on the
sides of the crucible: (h) Deposition of the MoO3 and NaCl
vapors on the target substrate, (i) sulfurization of nucleation sites
resulting in the growth of large area MoS2 crystals, and
(j) OM morphology of the MoS2 growth on the target substrate.
(a) Schematic of the CVD setup for MoS2 growth
and (b)
the CVD growth parameters. (c) Top view of the placement of substrates
on the top and sides of the crucible. (d) Side view of the schematic
explaining escaping vapors from the crucible and their deposition
on the target substrates. The growth on the top SiO2 substrates:
(e) Deposition of MoO3 and NaCl vapors on the top substrate.
(f) Sulfurization of nucleation sites in the middle of the substrate
resulting in bulk MoS2 growth in the middle and crystals
around the edges. (g) OM image of the MoS2 growth on the
top substrate. Growth on SiO2 substrates placed on the
sides of the crucible: (h) Deposition of the MoO3 and NaCl
vapors on the target substrate, (i) sulfurization of nucleation sites
resulting in the growth of large area MoS2 crystals, and
(j) OM morphology of the MoS2 growth on the target substrate.For the target substrates, the region close to
the crucible has
a higher concentration of vapors, which results in high nucleation,
as illustrated in Figure h–j. The size of the MoS2 crystals is also
bigger in this region. In the middle part of the substrate, the MoS2 crystals are more distanced from one another. The size of
these triangles also reduces as we move them away from the boat. In
the region of the substrate near the boat, there is growth of large
MoS2 crystals, and the length of the crystals is found
to be up to 300 μm, as shown in Figure . This shows the
growth of conspicuously large crystals of MoS2 comparable
with the large-sized crystals that have been reported previously.[37]
Figure 2
Changes in the morphology of MoS2 crystals
based on
growth temperature. (a–f) Optical microscope images of MoS2 grown on the SiO2 substrate with temperature changing
from 700 to 900 °C with 25 mg of NaCl and a MoO3/S
ratio of 1:20. (g) Edge length of a large-area MoS2 flake
grown at 800 °C. (h) AFM image and the line profile of monolayer
MoS2 crystal grown at a temperature of 780 °C.
Changes in the morphology of MoS2 crystals
based on
growth temperature. (a–f) Optical microscope images of MoS2 grown on the SiO2 substrate with temperature changing
from 700 to 900 °C with 25 mg of NaCl and a MoO3/S
ratio of 1:20. (g) Edge length of a large-area MoS2 flake
grown at 800 °C. (h) AFM image and the line profile of monolayer
MoS2 crystal grown at a temperature of 780 °C.We began by investigating the effect of temperature
on the growth
of large-area MoS2 using a systematic study. The growth
was carried out by placing the substrates at different temperatures
between 700 and 900 °C while sulfur was kept in a low-temperature
zone (150–180 °C), as shown in Figure a–f. All of the other experimental
parameters were kept the same for these experiments (100 mg sulfur,
25 mg NaCl, and 5 mg MoO3). For the characterization of
MoS2 grown at different temperatures, Raman spectroscopy
was used to find the layer structure of MoS2. The Raman
signals of MoS2 emerge in the forms of in-plane vibrational
mode (referred to as E12g) and out-of-plane
vibrational mode (A1g). The frequencies of these vibrational
modes as well as the difference between the A1g and E12g modes can be used for the identification of
the number of layers of MoS2.[38] The positioning of the Raman modes depends on the layer thickness,
impurities, and strain.[39,40] The Raman spectra were
observed at the central region of the MoS2 crystals grown
at different temperatures, and it is observed that the crystals have
high crystalline quality. The Raman spectra for growth at different
temperatures representing the average peak difference are shown in Figure a, where no clear correlation was observed between the growth
temperature and crystal thickness. The frequency values at E12g and A1g are also indicated for each case.
Figure 3
Raman
spectra of MoS2: (a) Comparison of the peak difference
of MoS2 grown at different temperatures. (b) OM image of
a MoS2 flake grown at 780 °C. (c, d) Raman intensity
mapping of the E12g and A1g vibrational
modes, respectively.
Raman
spectra of MoS2: (a) Comparison of the peak difference
of MoS2 grown at different temperatures. (b) OM image of
a MoS2 flake grown at 780 °C. (c, d) Raman intensity
mapping of the E12g and A1g vibrational
modes, respectively.At 700 °C, the crystals of MoS2 are small and barely
visible under the optical microscope (Figure a). The optical microscope shows very small
nanoparticles of MoS2 grown at this temperature which indicates
that this temperature is not ideal for the growth of large-area MoS2 crystals. However, Raman peaks are still detected at this
temperature where the characteristic E12g and
A1g peaks are observed at 386.221 and 405.137 cm–1, respectively. The peak difference “Δk” observed between the E12g and A1g modes is 18.916 cm–1, which corresponds
to monolayer MoS2. For the temperature of 750 °C,
large-scale monolayer MoS2 crystals (Δk = 16.336 cm–1) are grown along with bright small
crystals of bulk MoS2 (Δk = 24.073
cm–1).[39] At 780 °C,
large-scale monolayer MoS2 crystals (Δk = 18.055 cm–1) are observed with more clean and
uniform growth. The frequency position values are 387.082 and 405.137
cm–1. Both the modes indicate a blueshift. However,
the blue shift for the E12g mode is more significant,
which results in a reduced Δk as compared to
highly crystalline exfoliated MoS2 flakes. This can be
explained by the presence of thermally induced strain due to growth
at high temperatures because of lattice mismatch between the layer
and the substrate.[41] This result represents
the optimum temperature of 780 °C for the growth of uniform and
large-scale crystals of monolayer MoS2, as shown in Figures c and S1c,d. The growth at 800 °C shows highly
uniform large-scale bilayer MoS2 crystals (Δk = 22.35 cm–1) with the crystal edge
length exceeding 300 μm (Figures g and S1b). Both the layers
of MoS2 are perfectly stacked on top of each other as the
edges of both the crystals match perfectly. The growth of bilayer
at this temperature can be associated with changes in sulfur evaporation
rate.[42] At 850 °C, large-scale monolayer
MoS2 crystals (Δk = 17.20 cm–1) are observed with roughness around the edges (Figure e). This roughness
around the edges can be attributed to the nonuniform growth of the
secondary layer on the edges of the crystal. The MoS2 grown
at 900 °C shows high coverage with secondary growth of MoS2 on top (Figure f). The continuous layer has visible grain boundaries, which is an
indication of the merging of highly crystalline and large crystals
of MoS2 through chemical bonding. As the large-area monolayer
grains of MoS2 merge together, the process of in-plane
growth stops and a second layer starts to grow on top of the first
layer with van der Waals adhesion forming a layer-by-layer structure.
The Raman shift for the continuous layer (1L), the secondary flake
(2L), and the bright spot in the middle (bulk) was found to be 17.77,
22.356, and 24.073 cm–1, respectively.[43] For confirming the thickness of the grown MoS2 crystal at various temperatures, AFM was used (Figure S3). The topography image and its thickness
profile of monolayer flakes grown at 780 °C are shown in Figure h. The thickness
observed is 1.75 nm, which corresponds to bilayer MoS2.
However, the Raman spectroscopy reveals the thickness to be monolayer
(Δk = 18.055 cm–1) corresponding
to 0.8 nm thickness. The contradiction in the thickness measurement
can be explained by errors in the AFM height measurement that are
induced by surface roughness, impurities, background noise, thermal
vibrations induced by the cantilever, and the difference in the interacting
forces depending on the samples.[44−46] The uniformity of the
grown crystals was also determined using Raman mapping for the same
growth conditions. The Raman maps were obtained for both the vibrating
modes E12g and A1g, as shown in Figure b–d. The Raman
mapping indicates that the flake is uniform and has high crystallinity.[47]This dependency of MoS2 growth
on temperature can be
explained with the help of diffusion rates of Mo, S, and NaCl at elevated
temperatures. The diffusion rate and the deposition of the MoO3, sulfur, and NaCl vapors on the substrate surface vary with
the change in temperature. For the growth at a lower temperature,
the MoO3 clusters that are deposited on the surface of
the substrate have a lower concentration and small size. This results
in an ease of reduction of the MoO3 cluster into the MoS2 clusters at the beginning of the growth process. Thus, the
formation of 2D nuclei on the surface of the substrate occurs. The
further continuation of the growth process results in an increase
in the domain size, and the MoS2 domains are created with
both the monolayer and bilayer structures. In the case of growth at
elevated temperatures, the high diffusion rate of the precursors results
in the transport of a high concentration of nanoparticles on the surface
of the substrate. This results in rapid sulfurization and growth of
the MoS2 crystals with the deposition of multilayer nuclei
of the MoO3–S nanoparticles.The role of NaCl is also crucial at
higher temperatures as the
metal oxides have more tendency to react with molten NaCl at higher
temperatures. This results in a higher vapor pressure of the metal
precursors, and the reaction rate is also promoted. The further growth
of these nanoparticles induces the growth of larger MoS2 crystals.[48,49] However, this trend is not observed
as the temperature increases indefinitely. As the temperature is increased
beyond 780 °C, the flake size and the tendency for the growth
of multilayer crystals increases. The high diffusion of precursors
due to high temperatures increases the population of the nucleation
sites, limiting the areas for the grains to grow.[50] However, the growth at higher temperatures results in more
coverage on the substrates with a higher rate for growth of multilayers
of MoS2.The growth process indicates the evolution
of the shapes of MoS2. For better understanding of the
surface morphology of the
MoS2 crystals, scanning electron microscopy (SEM) was used.
The SEM images show various shapes depending on different growth conditions,
as shown in Figure . All of the structures in Figure show clear edges of the grains
with different angles, indicating the polycrystalline nature of these
samples.[51] This shape evolution can be
explained by the change in the local concentration of Mo and S precursors
due to the confined-space CVD approach. The structure of the grown
MoS2 is dependent on the distance of the substrate from
the source because of the difference of the Mo/S ratio. It is also
observed that the growth at higher temperatures (850–900 °C)
indirectly promotes the shape evolution of the MoS2 crystals.
This can be attributed to changes in the vapor concentration of Mo
and S depending on the growth temperature as the growth rate of the
zigzag edges for S and Mo varies.[52] These
types of edge terminations are normally observed in the MoS2 crystals, and the high reactivity of these terminations results
in the growth from these edges instead of the basal plane of MoS2. The structures having the shape of three-point stars are
usually single crystals. Depending on the rate of growth of different
crystal edges, the shape of the crystal is determined. As there are
various shapes that have been observed on the substrates in this work,
it can be established that the changes in the shape evolution is observed
because of the variation in the Mo/S ratio and temperature. The reduction
rate of MoO3 varies depending on the temperature, resulting
in the change in Mo proportion as compared to S.[36] The SEM images in Figure e–n show the growth of simple triangular-shaped
crystals, three-point star, four-point star, six-point star, and twin
crystals with representative grain boundaries. The formation of complicated
morphologies like the six-point star (Figure f,j) can be explained by the merging of two
misoriented grains with different kinetics of growth.[53] The presence of cyclic twins (Figure k) is attributed to the symmetric intergrowth
of two or more crystals.[54] The formation
of mirror boundary (Figure g) is also observed which occurs due to the intersection of
two MoS2 flakes with 180° relative in-plane rotation.[52,55]
Figure 4
SEM
images of MoS2 crystals grown on SiO2 substrate
at a growth temperature of 780 °C with a MoO3/S ratio
of 1:20 and 25 mg NaCl. (a–d) SEM images of
MoS2 with low magnification. High-magnification SEM images
of various shapes of CVD-grown MoS2: (e) three-point star,
(f) four-point star, (g) tilt boundary, (h) mirror boundary, (i, j)
six-point star, (k) seven-point star, and (l) mirror twins.
SEM
images of MoS2 crystals grown on SiO2 substrate
at a growth temperature of 780 °C with a MoO3/S ratio
of 1:20 and 25 mg NaCl. (a–d) SEM images of
MoS2 with low magnification. High-magnification SEM images
of various shapes of CVD-grown MoS2: (e) three-point star,
(f) four-point star, (g) tilt boundary, (h) mirror boundary, (i, j)
six-point star, (k) seven-point star, and (l) mirror twins.Based on the findings of the above experiments,
we have identified
780 °C to be the optimal temperature for the growth of large-area
MoS2 monolayers. Figure demonstrates the changes in
the MoS2 morphology by changes in the amount of NaCl. The
experiments are performed by changing the amount of NaCl from 5 to
100 mg with a MoO3/S ratio of 1:20 at a growth temperature
of 780 °C. Figure a–f shows how the crystal morphology is related to the amount
of NaCl. With the NaCl amount of 5 mg, the growth of small-sized monolayer
MoS2 crystals is observed, which corresponds to insufficient
availability of NaCl for reaction kinetics. However, the growth at
these conditions is highly uniform with high coverage. With the increase
in the amount of NaCl to 15 mg, there is a clear increase in the size
of MoS2 crystals as the crystals having edges longer than
20 μm are observed. However, nonuniformity can be observed in
the grown flakes of MoS2 as there is presence of 1L, 2L,
3L, and bulk MoS2 crystals. As the NaCl is increased up
to 25 mg, there is a clear observation of an increase in the flake
size as crystals with edge lengths greater than 200 μm are observed.
This condition results in the growth of highly uniform monolayer crystals
of MoS2. Further increase in the amount of NaCl causes
larger particles in the nucleation sites, which results in the bulk
growth of MoS2 (yellow spot), and bulk and monolayer MoS2 crystals tend to grow with a large size distribution, as
observed in Figure d–f.
Figure 5
Changes in the morphology of MoS2 crystals
based on
the amount of NaCl. (a–f) Optical microscopic images of MoS2 grown on a SiO2 substrate with the NaCl amount
changing from 5 to 100 mg with a MoO3/S ratio of 1:20 at
a growth temperature of 780 °C. (g) The AFM topography shows
the thickness of these bright spots around 14 nm.
Changes in the morphology of MoS2 crystals
based on
the amount of NaCl. (a–f) Optical microscopic images of MoS2 grown on a SiO2 substrate with the NaCl amount
changing from 5 to 100 mg with a MoO3/S ratio of 1:20 at
a growth temperature of 780 °C. (g) The AFM topography shows
the thickness of these bright spots around 14 nm.NaCl plays a very important role as a seeding promoter
in the growth
of MoS2. The metal halides like NaCl have the tendency
for evaporation at a lower temperature than the metal oxides as they
are highly active.[56] The mixture of MoO3 and NaCl powders results in the formation of a molten solution
at growth temperatures. As NaCl has higher vapor pressure, this results
in the increased vaporization of both NaCl and MoO3, which
promotes nucleation at low growth temperatures.The main reason
behind the role of NaCl is the presence of Na in
the compound. This deposited Na acts as a catalyst and accelerates
the growth rate.[57] This is achieved by
the lowering of the energy barrier to grow MoS2.[58] NaCl results in the formation of intermediates
like NaO between Na and O on the surface of the SiO2 substrate.[28,59] At the start of the growth process, these NaO bonds enhance the
growth rate by lowering the energy barrier.[58] However, as the growth time increases, the saturation of NaO bonds
on the surface causes reduction of the surface energy and thus, the
growth rate. The reduced surface energy also promotes the growth of
multilayer MoS2 as the stacking behavior of crystals is
preferred in this case.[60] The change in
the reaction kinetics is also clear from the changes in the shape
of MoS2 at a higher NaCl concentration (Figure d–f).There is
also an observation of clusters of bulk MoS2 (Figure S1a) that are formed on the surface
of the substrate as the NaCl-assisted growth takes place. The role
of NaCl in the formation of cluster-like structures can be confirmed
using NaCl separately in the same crucible without mixing it with
the MoO3 precursor. This method results in the formation
of huge nucleation sites suggesting that large vapors of NaCl are
deposited on the substrate. This causes the stacking of MoS2 crystals on top of one another forming a cluster of bright yellow
spots. The thickness of these clusters is confirmed by Raman spectroscopy,
and the results suggest that there are multiple layers of MoS2 which are stacked above one another. This suggests that the
presence of NaCl might result in the formation of different morphologies
depending on the synthesis parameters. It is also observed that for
higher concentration of NaCl, bright yellow spots are observed in
the center of the grown crystals. When the thickness of these bright
spots was observed using AFM, it was found to be around 14 nm, as
shown in Figure g.
This indicates the presence of multilayer MoS2. On the
other hand, the yellow spot formation on the growth substrate can
be attributed to the presence of large clusters of MoO3 (MoO3–S clusters), which are not sulfurized properly.[48]The presence of MoO3–S nanoparticles can be confirmed
by XPS data.
As shown in Figure b, the low-intensity peak observed at 235.98 eV shows the presence
of MoO3 on the substrate. Moreover, the EDX analysis was
carried out on the yellow spot for further confirmation (Figure S5). The analysis shows significant presence
of oxygen along with Mo, S, and Na (Table S1), indicating the presence of MoO3–S clusters.
Figure 7
XPS analysis
of MoS2 grown at 780 °C: (a) XPS survey.
(b) Peaks for Mo 3d orbitals 3d5/2 and 3d3/2 at 229.68 and 232.80 eV, respectively. Sulfur oxidation peak at
226.99 eV. A peak of low intensity observed at 235.98 eV representing
MoO3. (c) Orbitals of S 2p, 2p3/2 and 2p1/2, observed at 162.62 and 163.80 eV, respectively. (d) Carbon
calibration peak at 284.28 eV. (e) O 1s peak at 532.78 eV representing
the oxide layer of the Si substrate. (f) Na 1s peak observed at 1071.69
eV representing Na2MoO or Na2SO4.
Based on the
study conducted on the amount of NaCl, 5 mg is identified
to be the optimum amount for high coverage of the monolayer having
the tendency of forming a continuous layer (Figure a). Further optimization of the precursor
ratio was performed to obtain a continuous monolayer on the substrate. Figure a–e show the changes in the morphology of the grown
MoS2 by changing the concentration of MoO3 at
optimum conditions of NaCl and temperature for high coverage (5 mg
and 780 °C) while all of the other growth parameters were kept
the same. The results were evaluated by keeping the sulfur at 100
mg and changing the concentration of MoO3 from 5 to 25
mg with a step size of 5 mg. This results in the formation of small-sized
monolayer crystals of MoS2 on the target substrate, as
shown in Figure a–e.
The crystals formed on the edges of the top substrate are comparatively
large and are shown in Figure S2.
Figure 6
Changes in
the morphology of MoS2 crystals based on
the MoO3/S ratio. Optical microscope images of MoS2 grown on SiO2 substrate at a temperature of 780
°C with sulfur = 100 mg and NaCl = 25 mg and MoO3 (a)
5 mg, (b) 10 mg, (c) 15 mg, (d) 20 mg, and (e) 25 mg. Formation of
continuous layer at selected area on the substrates with MoO3 amounts (f) 10 mg and (g) 25 mg.
Changes in
the morphology of MoS2 crystals based on
the MoO3/S ratio. Optical microscope images of MoS2 grown on SiO2 substrate at a temperature of 780
°C with sulfur = 100 mg and NaCl = 25 mg and MoO3 (a)
5 mg, (b) 10 mg, (c) 15 mg, (d) 20 mg, and (e) 25 mg. Formation of
continuous layer at selected area on the substrates with MoO3 amounts (f) 10 mg and (g) 25 mg.The small size of the crystals found in Figure a was already attributed
to the reduced concentration
of NaCl (5 mg), which results in moderate nucleation on the substrate
with high coverage. The part of the substrate near the boat gets more
input of nucleation vapors resulting in the merging of MoS2 to form a partial continuous layer on some portion of the substrate,
as shown in Figure f,g. This also results in the formation of a locally continuous layer
on the substrate. However, with high coverage of the substrate, some
secondary nucleation sites are found, which appear in the form of
small crystals of MoS2 (Figure f,g). The thickness of the continuous monolayer
was confirmed using Raman spectroscopy, showing the distance between
the two peaks to be 15.47 cm–1.As a result,
by comparing the different growth methods, i.e., growth
at different temperatures, changing the amount of NaCl and MoO3, the size, coverage, and thickness of the MoS2 crystals can be controlled. The high coverage of monolayer MoS2 can be achieved at a high growth temperature with a clear
definition of grain boundaries indicating highly crystalline growth,
in comparison with the continuous layer achieved by varying the MoO3 concentration. However, this method has a disadvantage of
the growth of large-size secondary flakes of MoS2. It is
also noted that the continuous layer was achieved in each case by
optimizing the precursor ratios without extending the growth time,
which shows that our proposed methodology can be adopted for changing
the substrate coverage with the same growth time (30 min).XPS analysis
of MoS2 grown at 780 °C: (a) XPS survey.
(b) Peaks for Mo 3d orbitals 3d5/2 and 3d3/2 at 229.68 and 232.80 eV, respectively. Sulfur oxidation peak at
226.99 eV. A peak of low intensity observed at 235.98 eV representing
MoO3. (c) Orbitals of S 2p, 2p3/2 and 2p1/2, observed at 162.62 and 163.80 eV, respectively. (d) Carbon
calibration peak at 284.28 eV. (e) O 1s peak at 532.78 eV representing
the oxide layer of the Si substrate. (f) Na 1s peak observed at 1071.69
eV representing Na2MoO or Na2SO4.For a better understanding of the atomic structure
of the grown
MoS2, its chemical properties, and to investigate the role
of NaCl, we carried out XPS analysis of the MoS2 crystals
grown at 780 °C (Figure ). The survey spectrum of MoS2 can be observed in Figure a. Figure b shows binding energy (BE) peaks at 229.68 and 232.80 eV,
which correspond to the 3d5/2 and 3d3/2 orbitals
of Mo4+, which is representative of the molybdenum in its
charged state in MoS2.[61] There
is also an observation of low intensity peak at 235.98 eV. This corresponds
to the presence of oxides of Mo likely MoO3, which might
be due do the presence of the unreacted precursor of MoO3, which is usually observed in CVD-grown MoS2 as Mo6+ peaks.[61−63] The Mo4+ 3d5/2 has the absorption
peak, which is located at 226.99 eV; this can be attributed to the
oxidation of sulfur. The spin–orbit doublets for the S 2p spectrum
are observed at the positions of 162.62 and 163.80 eV, which shows
the BE for 2p3/2 and 2p1/2, respectively, as
shown in Figure c.
The energy separation for these peaks is observed to be 1.18 eV. Figure d represents the
BE of C 1s peak, which as observed at 284.28 eV for the purpose of
calibration. Figure e shows the BE of the O 1s peak, which is centered at 532.78 eV and
might be due to the oxide layer on the Si substrate. The presence
of the core-level spectra of Na 1s is also observed at 1071.69 eV
(Figure f), which
arises due to the presence of Na. This shows that the Na from NaCl
might be present beneath the crystals in the form of growth intermediates
like Na2MoO[26] and Na2SO4.[28](a) Schematic of the fabricated MoS2 FETs. (b, c) Transfer
curves at different values of VDS. (d)
Characteristic curve (IDS–VDS) of 2D MoS2-based FET at different
back-gate voltages (VBG).To evaluate the quality of the CVD-grown MoS2, back-gate
field-effect transistors (FETs) were fabricated with two terminals
on monolayer MoS2, as shown in Figure a. The measurements were carried out under
ambient conditions to evaluate the ON/OFF ratio, carrier mobilities,
and the on-state currents.
Figure 8
(a) Schematic of the fabricated MoS2 FETs. (b, c) Transfer
curves at different values of VDS. (d)
Characteristic curve (IDS–VDS) of 2D MoS2-based FET at different
back-gate voltages (VBG).
The transfer curves for VDS = 1–5
V are plotted in linear and log scales, as shown in Figure b,c. The device exhibits a
strong n-type behavior, as it achieves on-state at the positive gate
voltage. The I–V curves show
symmetric and linear behaviors measured at different back-gate voltages
(sweeping from −80 to 80 V), as represented in Figure d. This confirms that the contact
at the interface of Ti/MoS2 is ohmic in nature as explained
by Fermi-level pinning.[64] The devices exhibited
an ON/OFF ratio of up to 105, which is better than the
previously reported values for CVD-grown MoS2[65,66] and comparable with the other previous reports.[67,68] We have also estimated the field-effect mobility of the monolayer
MoS2 devices for various channel lengths, from the transfer
curve using the equationwhere L and W denote the channel length and channel width, respectively, IDS is the current between the drain and the
source terminal, Coxide is the capacitance
of the gate dielectric, and VDS is the
applied drain-to-source voltage. The apparent value of mobility for
our devices lies between 0.6 and 1.9 cm2 V–1 s–1, which is in accordance with the previously
reported range (0.1–10 cm2 V–1 s–1) of values for exfoliated as well as CVD-grown
MoS2.[58,65,69−71] The mobility of the devices can be improved further
with the use of top-gate electrodes with high-k dielectrics.
The usage of NaCl as a seeding promoter and surface impurities might
also degrade the device performance.[60] There
is still some room for improvement in the device performance, which
can be achieved through the optimization of growth parameters and
better electrode fabrication. The performance of device gives a clear
indication that the method of synthesis reported here is a feasible
method for the growth of monolayer to few-layer MoS2 for
FET applications.
Conclusions
This work illustrates the use of different
methodologies for the
growth of MoS2 on a large scale using a confined-space
CVD method with NaCl as a seeding promoter. The experiments conducted
illustrate the control of important growth parameters like temperature,
precursor ratio, and the amount of NaCl for yielding highly crystalline
MoS2 with varying morphologies. The characterization of
the grown MoS2 is carried out using optical microscopy,
scanning electron microscopy (SEM), Raman spectroscopy, AFM, XPS,
and EDX analysis. The work also sheds light on the proposed explanation
for the growth of large-scale MoS2 crystals on the substrate
with different morphologies by the variation in growth conditions
and its electrical properties. The method suggested in this article
can be utilized for the controlled growth of other transition-metal
dichalcogenides with different morphologies, which can be used for
the fabrication of different electronic devices.
Experimental Section
CVD Growth of MoS2
The preparation of MoS2 crystals in this work was performed using a confined-space
CVD method. SiO2 (300 nm)/Si was used as the growth
substrate, which was placed in a high temperature zone in the CVD
chamber. MoO3 powder (≥99.5%, Sigma-Aldrich) and
NaCl were mixed in an alumina boat and placed in the center of the
furnace in the high temperature zone. A quartz boat containing sulfur
powder (≥99.5%, Sigma-Aldrich) was placed upstream in a lower-temperature
zone with temperature around (150–180 °C). Before the
growth process, the pressure in the furnace was reduced to 1.5 ×
10–2 Torr and purging was carried out inside the
tube with Ar (99.99% purity) at 500 sccm to remove any preexisting
contaminants. The SiO2/Si substrate was cut into a square
shape with the dimensions 1.5 × 1.5 cm2. The substrates
were cleaned using deionized water, acetone, and isopropyl alcohol
(IPA) for 10 min each and was dried with nitrogen gas. The substrates
were placed on top of the boat as well as on the sides of the boat
containing the MoO3 precursor. The blocking substrates
were placed at a distance of 1 mm from each other to ensure that a
small outlet is created for escaping vapors. During the growth process,
Ar (99.99% purity) gas was used as a carrier gas at 120 sccm. First
the system was ramped up to a temperature of 300 °C in 10 min.
Then, the temperature was ramped up from 300 to 700–900 °C
in 20 min. The system was maintained at the growth temperature for
30 min and then allowed to cool down naturally.
Device Fabrication and Characterizations
MoS2 FET devices were fabricated directly on the growth substrate without
transferring. The thickness of the grown flake was identified using
AFM and Raman measurements. The drain and source electrodes were defined
on the crystals using standard photolithography and e-beam lithography
process followed by the deposition of Ti (10 nm)/Au (40 nm) through
e-beam evaporator system. The deposited samples were then soaked in
acetone for lift-off process and cleaned using IPA and deionized water,
followed by drying with N2 gas. The devices were then thermally
annealed at a temperature of 200 °C for 2 h in the presence of
argon at 20 sccm for reducing the contact resistance and to remove
any interfacial adsorbates. The measurements of the FET device were
carried using a parameter analyzer (Keithley 4200A-SCS).
Authors: Chullhee Cho; Joeson Wong; Amir Taqieddin; Souvik Biswas; Narayana R Aluru; SungWoo Nam; Harry A Atwater Journal: Nano Lett Date: 2021-04-29 Impact factor: 11.189
Authors: Haitao Zhang; Don-Hyung Ha; Robert Hovden; Lena Fitting Kourkoutis; Richard D Robinson Journal: Nano Lett Date: 2010-12-09 Impact factor: 11.189
Authors: Kehao Zhang; Brian M Bersch; Fu Zhang; Natalie C Briggs; Shruti Subramanian; Ke Xu; Mikhail Chubarov; Ke Wang; Jordan O Lerach; Joan M Redwing; Susan K Fullerton-Shirey; Mauricio Terrones; Joshua A Robinson Journal: ACS Appl Mater Interfaces Date: 2018-11-14 Impact factor: 9.229
Authors: In Soo Kim; Vinod K Sangwan; Deep Jariwala; Joshua D Wood; Spencer Park; Kan-Sheng Chen; Fengyuan Shi; Francisco Ruiz-Zepeda; Arturo Ponce; Miguel Jose-Yacaman; Vinayak P Dravid; Tobin J Marks; Mark C Hersam; Lincoln J Lauhon Journal: ACS Nano Date: 2014-09-22 Impact factor: 15.881