| Literature DB >> 31167393 |
Jiqing Lian1, Dawei Zhang2, Ruijin Hong3, Tingzhen Yan4, Taiguo Lv5, Daohua Zhang6.
Abstract
Sub-wavelength artificial photonic structures can be introduced to tailor and modulate the spectrum of materials, thus expanding the optical applications of these materials. On the basis of SiO2/Cu/ITO arrays, a hybrid coupled resonance (HCR) mechanism, including the epsilon-near-zero (ENZ) mode of ITO, local surface plasmon resonance (LSPR) mode and the microstructural gap resonance (GR) mode, was proposed and researched by systematically regulating the array period and layer thickness. The optical absorptions of the arrays were simulated under different conditions by the finite-difference time-domain (FDTD) method. ITO films were prepared and characterized to verify the existence of ENZ mode and Mie theory was used to describe the LSPR mode. The cross-sectional electric field distribution was analyzed while SiO2/Cu/ITO multilayers were also fabricated, of which absorption was measured and calculated by Macleod simulation to prove the existence of GR and LSPR mode. Finally, the broad-band tailoring of optical absorption peaks from 673 nm to 1873 nm with the intensities from 1.8 to 0.41 was realized, which expands the applications of ITO-based plasmonic metamaterials in the near infrared (NIR) region.Entities:
Keywords: ENZ mode; FDTD; ITO thin films; Macleod simulation; SiO2/Cu/ITO arrays; hybrid coupled resonance; spectral tailoring
Year: 2019 PMID: 31167393 PMCID: PMC6630435 DOI: 10.3390/nano9060852
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1(a) The optical absorptions of the arrays; (b) The schematic diagram of the model.
Figure 2(a) The absorption spectra under different periods; (b) The scatter diagram of the absorption peak positions and intensities in S-NIR; (c) The scatter diagram of the absorption peak positions and intensities in M-NIR.
Figure 3Cross-sectional electric field distributions of arrays with period a = 103 nm (a); and 205 nm (b).
Figure 4Regulation of the absorption under different layer thicknesses: (a) shows the case of different Cu thicknesses; (b) shows the case of different ITO thicknesses.
Figure 5Scatter diagrams of absorption peak positions and absorption intensities of SiO2/Cu/ITO arrays, (a) peak wavelengths with different Cu thicknesses in S-NIR; (b) peak intensities with different Cu thicknesses in S-NIR; (c) peak wavelengths with different ITO thicknesses in M-NIR; (d) peak intensities with different ITO thicknesses in M-NIR.
Figure 6Surface morphology (a) and the ENZ region (b) of ITO; The absorptions of SiO2/Cu/ITO multilayers prepared by experiment (c) and calculated by Macleod simulation (d).
Figure 7Cross-section electric field distributions of SiO2/Cu/ITO microstructures with various wavelengths of incident light: (a) 1243 nm; (b) 753 nm; (c) 1378 nm; (d) 1694 nm.
Figure 8The results of optical absorption peaks modulated by thickness: (a) the results in different Cu layers, (b) the results of in different ITO layers.