| Literature DB >> 31164953 |
Peter Ozaveshe Oviroh1, Rokhsareh Akbarzadeh1, Dongqing Pan2, Rigardt Alfred Maarten Coetzee1, Tien-Chien Jen1.
Abstract
Atomic layer deposition (ALD) is an ultra-thin film deposition technique that has found many applications owing to its distinct abilities. They include uniform deposition of conformal films with controllable thickness, even on complex three-dimensional surfaces, and can improve the efficiency of electronic devices. This technology has attracted significant interest both for fundamental understanding how the new functional materials can be synthesized by ALD and for numerous practical applications, particularly in advanced nanopatterning for microelectronics, energy storage systems, desalinations, catalysis and medical fields. This review introduces the progress made in ALD, both for computational and experimental methodologies, and provides an outlook of this emerging technology in comparison with other film deposition methods. It discusses experimental approaches and factors that affect the deposition and presents simulation methods, such as molecular dynamics and computational fluid dynamics, which help determine and predict effective ways to optimize ALD processes, hence enabling the reduction in cost, energy waste and adverse environmental impacts. Specific examples are chosen to illustrate the progress in ALD processes and applications that showed a considerable impact on other technologies.Entities:
Keywords: 10 Engineering and Structural materials; 102 Porous / Nanoporous / Nanostructured materials; 306 Thin film / Coatings; 400 Modeling / Simulations; Atomic layer deposition; Computational fluid dynamics; Molecular dynamics; Thin film
Year: 2019 PMID: 31164953 PMCID: PMC6534251 DOI: 10.1080/14686996.2019.1599694
Source DB: PubMed Journal: Sci Technol Adv Mater ISSN: 1468-6996 Impact factor: 8.090
Figure 1.Illustration of ALD for ZnO thin film deposition. Adapted with permission from [11].
Figure 2.A model ALD process for depositing TiO2 on hydroxyl groups functionalized substrate using TiCl4 and H2O as precursors. Adapted with permission from [13], copyright Elsevier 2017.
Different types of film deposition methods (adapted from [54]), the sputtering was adapted from [55] while the breath figure method was adapted from [56], with permission.
| Method | Description and types | Advantages | Applications |
|---|---|---|---|
| Film formation from chemicals in electrolytic solution placed onto substrate surface with a seed layer on top | Corrosion resistance, decoration, mechanical characteristics improvement, protection barriers, electrical conduction and heat resistance | Metal plating, corrosion resistance, decoration, mechanical characteristics improvement, friction reduction, protection barriers, improved electrical conductivity, heat resistance and radiation protection etc. | |
| Film formation from chemical reaction between liquid-phase sources (often sol–gel) applied onto surface of substrate while spinning | Simplicity and ease of set up, low cost and fast operating system | Photoresists, insulators, organic semiconductors, synthetic metals, nanomaterials, metal and metal oxide precursors, transparent conductive oxides, optical mirrors, magnetic disk for data storage, solar cells etc. | |
| A process of deposition of materials because of bombardment of targets by high energy particles ejected from a source | Deposit a wide variety of metal and metal oxide nanoparticles (NPs) and nanoclusters (NCs), insulators, alloys and composites, and even organic compounds | Silicon wafer, solar panel or optical device, catalysis | |
| A self-assembly process that results in a honeycomb-structured films with micro-pores arranged in honeycomb shape usually formed by water microdroplets condensed on a cool surface from warm, humid air like breath | It is simple and applicable to a wide variety of materials with highly organized honeycomb-like porous surface | Optics, photonics, surface science, biotechnology, and regenerative medicine | |
| Film formation by thermal oxidation of the substrate | Slow oxidation rate, good control of the oxide thickness and high values of breakdown field | Semiconductor industry, transistors, photoresistors, capacitors and field oxides, etc. | |
| Film formation by condensation of gasified source material, directly transported from source to substrate through the gas phase: Evaporation (thermal, E-beam), Molecular beam epitaxy (MBE), Pulsed laser deposition (PLD), Reactive PVD, Sputtering (DC, DC magnetron, RF) | Atomic level control of chemical composition, film thickness, and transition sharpness | Fuel cells, batteries, microelectronics, optical and conducting surfaces, etc. | |
| Film formation by chemical reaction between mixed gaseous source materials on a substrate surface using: Atmospheric-pressure CVD (APCVD), Low-pressure CVD (LPCVD), Plasma-enhanced CVD (PECVD), Metal-organic CVD (MOCVD) | High growth rates, good reproducibility, epitaxial films growth, good film quality, conformal step coverage | Microelectronics, solar cells, fuel cells, batteries, etc. | |
| A sub-class of CVD with film formation via sequential cycling of self-limiting chemical half-reactions on the substrate surface. Each reaction cycle accounts for the deposition of a (sub) monolayer. The reaction can be activated by thermal energy or plasma enhancement. They can be categorized as: Thermal ALD, Plasma-enhanced ALD (PEALD), Spatial ALD (S-ALD) | High quality films, conformality, uniformity, step coverage | Fuel cells, desalination, microelectronics, capacitors, oxides, catalysts, etc. |
Comparison of thin film deposition techniques which are similar to ALD (Adapted with permission from Elsevier 2017 [57]).
| Property | Deposition Technique | |||||
|---|---|---|---|---|---|---|
| CVD | MBE | ALD | PLD | Evaporate | Sputtering | |
| Deposition Rate | Good | Fair | Poor | Good | Good | Good |
| Film density | Good | Good | Good | Good | Fair | Good |
| Lack of pinholes | Good | Good | Good | Fair | Fair | Fair |
| Thickness uniformity | Good | Fair | Good | Fair | Fair | Good |
| Sharp dopant profiles | Fair | Good | Good | Varies | Good | Poor |
| Step coverage | Varies | Poor | Good | Poor | Poor | Poor |
| Sharp interfaces | Fair | Good | Good | Varies | Good | Poor |
| Low substrate temp. | Varies | Good | Good | Good | Good | Good |
| Smooth interfaces | Varies | Good | Good | Varies | Good | Varies |
| No plasma damage | Varies | Good | Good | Fair | Good | Poor |
Abbreviations: Chemical vapour deposition (CVD), Molecular beam epitaxy (MBE), Atomic layer deposition (ALD), Pulsed layer deposition (PLD)
Advantages and disadvantages of ALD.
| Advantages | Disadvantages |
|---|---|
High-quality films
Control of the film thickness Excellent repeatability High film density Amorphous or crystalline film Ultra-thin films Conformality
Excellent 3D conformality Large area thickness uniformity Atomically flat and smooth surface coating Challenging Substrates
Gentle deposition process for sensitive substrates Low temperature and stress Excellent adhesion Coats Teflon Low-temperature processing Stoichiometric control Inherent film quality associated with self-limiting Self-assembled nature of the ALD mechanism Multilayer | The time required for the chemical reactions The economic viability Very high material waste rate Very high energy waste rate Intensive nature of the ALD process Nano-particle emissions |
Materials, reactants and templates used in ALD coating of nano-porous structures. Republished with permission from [59].
| Materials | Reactants | Temperature | Template |
|---|---|---|---|
| TiO2 | Ti[OCH(CH3)2]4/H2O | 140 °C | Polycarbonate |
| ZrO2 | Zr[OCH(CH3)3]4 | ||
| TiO2 | TiCl4/H2O | 105 oC | AAO |
| ZnO | Zn(C2H5)2/H2O | 200 oC | AAO |
| ITO | InCp/O3 Tetrakis(dimethylamino)tin/H2O2 | 275 oC | AAO |
| Ru | Ru(EtCp)2/O2 | 300 oC | AAO |
| SiO2 | H2N(CH2)3Si(OCH2CH3)3/H2O/O3 | 150 oC | AAO |
| Fe2O3 | Fe2(OBu)6/H2O | 130 oC − 170 oC | AAO |
| Fe2O3 | Fe(Cp)2/O3 | 230 oC | AAO |
| Fe2O3 + Fe3O4 | Fe(Cp)2/O2 | 350 oC − 500 oC | AAO |
| ZnS | Zn(C2H5)2/H2S | 120 oC | AAO |
| Sb2O5 | (Sb(NMe2)3)/O3 | 120 oC | AAO |
| Sb2S3 | (Sb(NMe2)3)/H2S | 120 oC | AAO |
| Nb2O3 | NbI5/O3 | 320 oC | AAO |
ITO stands for Indium tin oxide, AAO stands for anodic aluminium oxide, Ru(EtCp)2 stands for bis(ethycyclopentadienyl)ruthenium, Sb(NMe2)3 stands for Tris(dimethylamido)antimony(III)
Figure 3.Schematic illustration of the Li deposition process on planar Cu and 3D ALD-CNTS substrates. (a) Inhomogeneous Li deposition resulted in the formation of Li dendrites, which punctured the separator after repeated cycles. (b) A high-specific-surface-area CNTS network with a robust Al2O3 layer on the surface ensures homogenous Li nucleation during the Li plating process and forms a stable, dendrite-free Li metal anode.
Figure 4.Side-view scanning electron microscopy (SEM) images at a 45° angle of gyroid replication into ZnO: (a) gyroid polystyrene template, (b) as-deposited ZnO-PS hybrid, and (c) ZnO gyroid after annealing at 550 °C. (d,e,f) Different faces of the ZnO gyroid shown in (c). The scale bars correspond to 1 μm for (a) and (b), 400 nm for (c) and (d), 200 nm for (e) and (f).
Advantages and disadvantages of PEALD.
| Advantages | Disadvantages |
|---|---|
| Low deposition temperature | Limited conformality |
| Higher reactivity (shorter | More complicated reactor designs |
| Higher film purity | More complicated reaction chemistry |
| Wide range of chemistry possible | |
| Denser films | Potentially poor conformality |
| Higher throughput | Lower throughput |
| Damage to films | |
| Lower impurity | Additional growth parameter |
Figure 5.Schematic representation of the three different types of plasma-assisted atomic layer deposition that can be distinguished: (a) direct plasma (b) remote plasma, and (c) radical enhanced. For each type different hardware configurations and plasma sources.
Figure 6.Various methods in describing fluid flow at different levels (modified with permission from Liao and Jen [91] and Coetzee and Jen [11]).
Materials grown by ALD process.
| Material | Precursor | Purge | Temperature | Film thickness | Method | Application | Ref |
|---|---|---|---|---|---|---|---|
| TiO2 | TTIP (Titanium (IV) | N2 | 90 | 103 nm/cycle | Low-temperature | Cotton fabrics | [ |
| SrTiO3 | Ti(CpMe5) (OMe)3, O3 | N2 | 370 | 0.05 nm/cycle | Capacitor | [ | |
| TiO2 | TDMA, H2O isopropoxide, DI | 150 | 0.055 nm/cycle | Thermal | Catalysts membranes, dye-sensitized solar cells, batteries sensor | [ | |
| TiO2 | SiO2, [(EtCp)Ti(NMe2)3 Et = CH2CH3] | O3, O2 | 250–300 | Thermal | MicroelectronicsDevices | [ | |
| Ge–Sb–Se–Te (GSST) | Sb (OC2H5)3 and [(CH3)3Si]2 | Ar | 70 | Low-temperature | PcRAM | [ | |
| SnO | Tetrakis(dimethylamino)tin(IV) and H2O | N2 | 80 | (0.15 ± 0.01) nm/cycle | Spatial Atmospheric Pressure | Solar cell | [ |
| SnS2 | Sn(OAc)4 and H2S | N2 | 150–250 | 0.17 Å/cycle | Low‐temperature | Electronicscatalysis | [ |
| TiO2 | Titaniumtetraisopropoxide (TTIP) and H2O | N2 | 200 | 0.02 nm/cycle | Thermal | Nano wires | [ |
| Si-O-Si(CH3)3 | HMDS ((CH3)3-Si-N-Si(CH3)3) + TMCS (Cl-Si(CH3)3) and H2O | N2 | 180 | Plasma | Carbon separation, capture | [ | |
| Sb2Se3, TiO2 and Pt | Titanium(IV) tetraisopropoxide (TTIP), and H2O | N2 | 160 | Solar energy conversion | [ | ||
| Al2O3 and TiO2 | TiCl4, TMA OH, O2 | 150 and 250 | Low-Temperature | Filtration, gas storage, and catalysis | [ | ||
| Al2O3 | 150, 200, and 250 | Nano-electronic devices | [ | ||||
| Al2O3 | [Al(NMe2)2(DMP)], [Al(NEt2)2(DMP) [Al(N | 100 and 180 | Thermal and plasma ALD | Microelectronics, organic electronics, solar cells | [ | ||
| V2O5 | vanadium triisopropoxide (VTIP) | N2 | 150 to 300 | Thermal | Capacitors | [ | |
| Ru | Ru(DMBD)(CO)3 and O2 | N2 | 290 to 320 | 0.067 nm/cycle | Thermal | Transistors, capacitors | [ |
| RuO2 | Ru(DMBD)(CO)3 and O2 | N2 | 220 to 240 | 0.065 nm/cycle | Thermal | Transistors, capacitors | [ |
| MoS2 | Mo(NMe2)4 | N2 | 60 | 1.2 Å/cycle | Thermal | Catalysis, battery | [ |
| CuSbS2 | CuAMD, SbTDMA, H2S | N2 | 225 | Low-Temperature | Photovoltaics | [ | |
| TiO2 | TiCl4, H2O | N2 | 180 | 0.6 Å/cycle | Photocatalysis | [ | |
| TiO2 | TiCl4, H2O | N2 | 40–250 | 0.048 nm/cycle to 0.113 nm/cycle | PEALD, tALD | Catalysis, semiconductors | [ |
| V2O5 and VO2 | VO[O(C3H7)]3, H2O | N2 | 135 | 0.03 nm/cycle | PEALD, tALD | Microelectronics | [ |
| Ag | Ag(fod) (PEt3), BH3(NHMe2) | 110 | 0.3 Å/cycle | Thermal | [ | ||
| Bi2O3 | Bi(Ph)3 and O3 | N2 | 250 and 320 | 0.23 Å/cycle | Supercapacitors, gas sensors, solid oxide fuel cells | [ | |
| ZnS | ZnS/g-C3N4 | N2 | 200 | Thermal | Photocatalysis | [ | |
| Ta2O5 | Ta(N | N2 | 250–300 | 0.77 and 0.67 Å/cycle | Thermal | Capacitors, solar cell | [ |
| Cobalt | bis(1,4-di- | N2 | 170 and 200 | 0.98 Å/cycle | Low temperature | Microelectronics | [ |
| ZnO/ZrO2 | Tetrakis(ethylmethylamino)zirconium (TEMAZ), diethylzinc (DEZ) and H2O | Ar | 200 | 1.0 Å/cycle | Thermal | Optical and electronic devices | [ |
| HfO2 | HfCl4 and H2O, tetrakis (dimethylamino) hafnium and H2O | N2 | 200–275 | −0 | Thermal | Transistors (MOSFET) | [ |
| HfO2 | Tetrakis(dimethylamino)hafnium (TDMA-Hf, [(CH3)2N]4Hf) and H2O | N2 | 250 | Thermal | Microelectronics | [ | |
| ZrO2 | (C5H5)Zr [N(CH3)2]3) and O3 | Ar | 180 | 0.8 Å/cycle | Thermal | Capacitors (DRAM) | [ |
| ZrO2 | CpZr[N(CH3)2]3/C7H8 and O3 | Ar | 250 to 350 | Thermal | Microelectronics | [ | |
| ZnO | (C2H5)2Zn and H2O | Ar | 100 to 300 | Plasma, Thermal | Microelectronics, Solar energy | [ | |
| MoS2 | Trimethylaluminium (TMA) and H2O | N2 | 200 | 1 Å/cycle | Thermal | Field-effect transistors (FETs) | [ |
Main ALD reactor types classified by their most important processing-related characteristics. (Adapted with permission from [165]).
| Reactor | Processing ability | Gas-solid contact | Agglomeration prevention | Energy Provision | Vacuum quality |
|---|---|---|---|---|---|
| Flow-type | Medium | Flow through | None (static bed) | Thermal | Medium |
| Viscous flow | Low | Flow over | None (static bed) | Thermal | Medium |
| Fluidized bed | High | Mixed flow | Mechanical & pneumatic vibration, stirring, microjet, pulsed flow | Thermal | Medium-atmosphere |
| Rotary | Medium | Mixed flow | Rotational agitation | Thermal & plasma | High-medium |
| Pneumatic conveying | High | Local mix (jet) | None | Thermal | Atmospheric |
Figure 7.Life cycle greenhouse gas emission and cumulative energy demand in an ALD process compared to other processes. Adapted with permission from [171]. Results are modelled based on cell efficiencies of 20.4% and 25% for current and prospective cells, respectively. SHJ - Silicon heterojunction.
Figure 8.(a) The traditional planar MOSFET design leading to an inverted surface channel and (b) the FinFET or trigate design where a Si fin that is covered by the gate oxide from three sides becomes inverted from the surrounding gate oxide, thus increasing the overall inverted volume compared to the planar design for the same gate voltage. Adapted with permission from [7], copyright Sciencedirect 2014.
Figure 9.Schematic showing a basic gas flow sequence for Chemical Vapour Deposition (CVD) and for Atomic Layer Deposition (ALD) as well as expected film growth profiles vs. process time. Adapted from [194].
Figure 10.The new 10 nm-class DRAM with high performance and reliability by Samsung. The thickness of the dielectric layers uniform to a few angstroms-DRAM chip contains hundreds of millions to billions of cells depending on data capacity. Each cell consists of two parts: a capacitor that stores data in the form of an electrical charge, and a transistor that controls access to it. Adapted from [208].
Figure 11.(a) TEM images of spherical alumina supported Pd catalysts with different numbers of Al2O3 ALD overcoating from 0 to 20 cycles and schematic illustration of porous ALD Al2O3 overcoat on Pd NP for Oxide-supported Pd catalyst and dense Al2O3 film on oxide support and porous Al2O3 overcoat on Pd NP formed by ALD. Republished with permission from [211], copyright 2012 American Chemical Society, b) Cross-sectional schematic of a single membrane within its silicon die before and after application of the catalyst layers using ALD. Adapted with permission from [210], copyright Nature 2010.
Figure 12.Complex structural features of biological pores that can be adapted for biomimetic filtration. Adapted from [38].
Figure 13.Translated biomimetic design transmission electron microscopy (TEM) showing pore geometry modifications achieved by atomic layer deposition targeted to the pore mouth. ALD of polypeptide groups which modifies internal pore chemistry to produce pore active sites with dimensions and chemical functionality similar to natural biological pores. Adapted from [38]. (Pictures taken from Sandia laboratory publication Biomimetic membrane for water purification 2010 [38]).
Figure 14.(a) Schematic of a graphene membrane before atomic layer deposition (ALD). (b) Optical image of an exfoliated graphene flake with 7 cycles of alumina ALD. (c) Optical image of a pure alumina film after graphene is etched away. (d) Atomic force microscope image of a pressurized 7-cycle pure alumina ALD film with ∆p = 278 kPa. (e) Deflection vs. position through the centre of the film in (d) at different ∆p. Adapted with permission from [232], copyright Nanoletters 2012.
Figure 15.(a) Hydrogenated graphene pore (b) and hydroxylated graphene pore, and (c) side view of the computational system. Adapted with permission from [228], copyright Nanoletters 2012.
Figure 16.(a) Classification of composite catalysts synthesized with selective ALD in this review, (I) core-shell structure, (II) discontinuous coating structure, and (III) embedded structure. Republished with permission from [238], copyright 2017 Author(s). (b) The effect of different catalysts on Fischer-Tropsch synthesis CH4 output measured by Gas Chromatograph (Adapted with permission from [239]).
Figure 17.The effect of ALD oxide layers on the commercial nickel-based catalyst (left) and on commercial noble metal catalyst (right) activity on steam reforming (Adapted with permission from [239]).