| Literature DB >> 31098017 |
K Giewekemeyer1, A Aquila1, N-T D Loh2,3,4, Y Chushkin5, K S Shanks6, J T Weiss6, M W Tate6, H T Philipp6, S Stern1,7, P Vagovic1,7, M Mehrjoo1, C Teo2,4, M Barthelmess7, F Zontone5, C Chang8, R C Tiberio9, A Sakdinawat8, G J Williams8, S M Gruner6,10,11, A P Mancuso1,12.
Abstract
The routine atomic resolution structure determination of single particles is expected to have profound implications for probing structure-function relationships in systems ranging from energy-storage materials to biological molecules. Extremely bright ultrashort-pulse X-ray sources - X-ray free-electron lasers (XFELs) - provide X-rays that can be used to probe ensembles of nearly identical nanoscale particles. When combined with coherent diffractive imaging, these objects can be imaged; however, as the resolution of the images approaches the atomic scale, the measured data are increasingly difficult to obtain and, during an X-ray pulse, the number of photons incident on the 2D detector is much smaller than the number of pixels. This latter concern, the signal 'sparsity', materially impedes the application of the method. An experimental analog using a conventional X-ray source is demonstrated and yields signal levels comparable with those expected from single biomolecules illuminated by focused XFEL pulses. The analog experiment provides an invaluable cross check on the fidelity of the reconstructed data that is not available during XFEL experiments. Using these experimental data, it is established that a sparsity of order 1.3 × 10-3 photons per pixel per frame can be overcome, lending vital insight to the solution of the atomic resolution XFEL single-particle imaging problem by experimentally demonstrating 3D coherent diffractive imaging from photon-sparse random projections.Entities:
Keywords: X-ray free-electron lasers; XFELs; coherent X-ray diffractive imaging (CXDI); phase problem; single particles
Year: 2019 PMID: 31098017 PMCID: PMC6503918 DOI: 10.1107/S2052252519002781
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 1A schematic diagram of the experiment. The sample, a gold nanostructure supported on a silicon nitride membrane, was rotated about the y axis by an angle θ to obtain diffraction patterns at different orientations with respect to the optical axis z. A first rotation series about the y axis was followed by an in-plane rotation of the sample about z (angle χ) and a subsequent second rotation series about y. The beam attenuation and illumination time were adjusted so that each data frame contains only about 50 scattered photons. An example of a single diffraction pattern is shown in the inset on the upper left-hand side (see also animation in the supporting information). The area of a single pixel in comparison with the field-of-view area has been enlarged for visualization.
Figure 2Orthogonal slices through (a)–(c) the EMC-reconstructed and (d)–(f) the reference 3D diffraction volumes. The EMC-reconstructed diffraction volume 〈W(q)〉 results from averaging the results of 13 independent EMC runs, each starting with a random intensity distribution. The reference diffraction volume W ref(q) was constructed based on the known orientations of the sample for each frame during the measurement. The dashed circles in panels (c) and (f) indicate a radius of 127 voxels, whereas the solid circles indicate radii of 20 and 50, respectively. All slices are drawn on the same scale with dimensionless lateral coordinates in units of ΔXk/D.
Figure 3The red line illustrates the Fourier shell correlation (FSC) between two EMC-retrieved reciprocal-space volumes resulting from splitting the data set into two equal halves and performing the same analysis on them as on the whole data set. The blue line indicates the FSC between 〈W(q)〉 and W ref, i.e. the reciprocal-space volume resulting from analyzing the whole data set using EMC and the reference intensity assembled using known orientations. The green line denotes the half-bit threshold curve, used as a common criterion for resolution determination in analysis of FSC curves.
Figure 4Reconstruction of the 3D electron density. (a) Reconstruction from the result derived by EMC. The electron density projected along an axis perpendicular to the drawing plane is shown here. (b) Reconstruction from the reference Fourier volume. Again, the projected electron density is shown. (c) 3D iso-surface rendering of the reconstructed electron density shown in panel (a). The threshold of the iso-surface has been set to 0.2, given a normalized density with values between 0 and 1 (see also animation in the supporting information). (d) Scanning electron micrograph from the original sample.
Figure 5Phase retrieval transfer functions for the reconstructions from the EMC-generated Fourier space intensity 〈W(q)〉 and the reference intensity W ref. The curves decay to a value of 1/e between q = 90 and q = 100, corresponding to a half-period resolution between 20 and 23 nm.