| Literature DB >> 30894945 |
Youssef S Al Jabbari1,2, Theodoros Koutsoukis1, Suliman Al Hadlaq1,3, David W Berzins1,4, Spiros Zinelis5,1.
Abstract
BACKGROUND/Entities:
Keywords: EDX; SEM; Ti nitride; coating; endodontic files
Year: 2015 PMID: 30894945 PMCID: PMC6395189 DOI: 10.1016/j.jds.2015.07.004
Source DB: PubMed Journal: J Dent Sci ISSN: 1991-7902 Impact factor: 2.080
Figure 1Titanium nitride coated file with the characteristic yellowish color and an uncoated conventional Ni–Ti file. Scale in mm.
Figure 2(A) Representative BE image for the surface of as-received files. Parallel oblong regions denote areas with higher mean atomic number (H) compared to the rest of the surface (L). Arrows show representative points of the spot EDX analysis (bar = 50 μm). (B) The oblong regions have been distinguished based on image contrast in BE and marked with white color for further image processing. BE = backscattered electron; EDX = energy-dispersive X-ray spectroscopy.
Mean values of elemental composition of low (L) and high (H) (oblong regions) mean atomic number areas on cutting surface of files tested along with the area ratio of H regiona on file surface and coating thickness.a
| File no. | L | H | Area ratio of H regions (%) | Coating thickness (μm) | ||||
|---|---|---|---|---|---|---|---|---|
| Ti | Ni | N | Ti | Ni | N | |||
| 15 | 57.6 | 29.6 | 13.5 | 50.6 | 45.1 | 5.0 | 6.5 ± 2.7 | |
| 25 | 57.8 | 29.0 | 12.7 | 50.8 | 44.8 | 5.3 | 7.4 ± 1.9 | |
| 35 | 57.9 | 28.6 | 12.6 | 50.9 | 44.9 | 4.9 | 5.9 ± 2.3 | |
| 20 | 0.33 ± 0.03 | |||||||
| 30 | 0.30 ± 0.03 | |||||||
| 40 | 0.29 ± 0.02 | |||||||
No differences were identified among different file sizes (P > 0.05).
Figure 3(A) BE image from the cross section where the coating is distinguished from the file and embedding resin. The white points indicate representative points of EDX spot analysis at (C) the coating and (B) the bulk. (Bar = 2.5 μm.) (B) EDX spectrum from the bulk of the file where only Ni and Ti were identified. (C) EDX spectrum taken at C (coating), where N and O were also identified along with Ni and Ti. BE = backscattered electron; EDX = energy-dispersive X-ray spectroscopy.
Figure 4(A) BE image from the cross section analysis of files tested, and corresponding EDX elemental maps for (B) Ti, (C) Ni, (D) N, and (E) O. BE = backscattered electron; EDX = energy-dispersive X-ray spectroscopy.
Figure 5(A) BE image with the line where the line analysis has been carried out, and EDX line profile analyses of (B) Ti, (C) Ni, (D) N, and (E) O. BE = backscattered electron; EDX = energy-dispersive X-ray spectroscopy.