| Literature DB >> 30775236 |
Jingjing Guo1, Jianzhong Fan2, Lili Lin2, Jiajie Zeng1, Hao Liu1, Chuan-Kui Wang2, Zujin Zhao1, Ben Zhong Tang1,3.
Abstract
Organic materials with aggregation-induced delayed fluorescence (AIDF) have exhibited impressive merits for improving electroluminescence efficiency and decreasing efficiency roll-off of nondoped organic light-emitting diodes (OLEDs). However, the lack of comprehensive insights into the underlying mechanism may impede further development and application of AIDF materials. Herein, AIDF materials consisting of benzoyl serving as an electron acceptor, and phenoxazine and fluorene derivatives as electron donors are reported. They display greatly enhanced fluorescence with increased delayed component upon aggregate formation. Experimental and theoretical investigations reveal that this AIDF phenomenon can be rationally ascribed to the suppression of internal conversion and the promotion of intersystem crossing in solid. Moreover, the theoretical calculations disclose that the efficient solid-state delayed fluorescence originates from the higher energy electronic excited state (e.g., S2) rather than the lowest energy-excited state (S1), demonstrating an anti-Kasha behavior. The excellent AIDF property allows high exciton utilization and thus superb performance of OLEDs using these new materials as light-emitting layers.Entities:
Keywords: aggregation‐induced delayed fluorescence; anti‐Kasha emission; internal conversion; intersystem crossing; organic light‐emitting diodes
Year: 2018 PMID: 30775236 PMCID: PMC6364497 DOI: 10.1002/advs.201801629
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1a) Molecular structures of DMF‐BP‐PXZ, DPF‐BP‐PXZ, and SBF‐BP‐PXZ, b) crystal structure (CCDC 1572670) and c) packing pattern of DMF‐BP‐PXZ in crystals.
Figure 2a) Absorption spectra in THF solutions (10−5 m), b) PL spectra in neat films of DMF‐BP‐PXZ, DPF‐BP‐PXZ, and SBF‐BP‐PXZ. Transient PL decay spectra of these molecules in d) THF solutions (10−5 m) and e) neat films, measured at 300 K under nitrogen. c) PL spectra and f) transient PL decay spectra of DMF‐BP‐PXZ in THF/water mixtures with different water fractions (f w), measured under nitrogen.
Photophysical properties of DMF‐BP‐PXZ, DPF‐BP‐PXZ, and SBF‐BP‐PXZ
| Soln | Neat film | Doped film | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| λabs [nm] | λem [nm] | ΦPL
| τ | λem [nm] | ΦPL
| τprompt
| τdelayed
| λem [nm] | ΦPL
| τprompt
| τdelayed
| |
| DMF‐BP‐PXZ | 406, 320 | 595 | 2.6 | 2.3 | 548 | 45.4 | 30.2 | 1.4 | 534 | 73.4 | 31.0 | 2.1 |
| DPF‐BP‐PXZ | 408, 324 | 596 | 2.8 | 3.2 | 550 | 48.7 | 27.9 | 1.1 | 536 | 69.5 | 29.3 | 2.3 |
| SBF‐BP‐PXZ | 407, 327 | 596 | 1.8 | 1.8 | 551 | 45.5 | 27.5 | 1.1 | 542 | 73.0 | 30.5 | 2.1 |
Measured in THF solution (10−5 m) at room temperature
Deposited on a quartz substrate
Absolute PL quantum yield determined by a calibrated integrating sphere under nitrogen at room temperature
Mean fluorescence lifetime evaluated at 300 K under nitrogen
Fluorescence lifetimes of prompt (τprompt) and delayed (τdelayed) decay components evaluated at 300 K under nitrogen.
Photophysical parameters of DMF‐BP‐PXZ, DPF‐BP‐PXZ, and SBF‐BP‐PXZ in solutions and neat films
| DMF‐BP‐PXZ | DPF‐BP‐PXZ | SBF‐BP‐PXZ | ||||
|---|---|---|---|---|---|---|
| Soln | Film | Soln | Film | Soln | Film | |
|
| 2.6 | 32.1 | 2.8 | 37.5 | 1.8 | 35.9 |
|
| – | 13.3 | – | 11.2 | – | 9.6 |
|
| – | 29.3 | – | 23 | – | 21.1 |
|
| – | 45.4 | – | 48.7 | – | 45.5 |
|
| 11.1 | 10.6 | 8.8 | 13.5 | 10.1 | 13 |
|
| 41.7 | 1.3 | 30.5 | 1.4 | 55.2 | 1.6 |
|
| – | 9.7 | – | 8.2 | – | 7.7 |
|
| – | 1.0 | – | 1.2 | – | 1.1 |
Abbreviations: Φ prompt and Φ delayed = prompt and delayed components, respectively, determined from the total Φ PL and the proportion of the integrated area of each component in the transient spectra to the total integrated area; Φ ISC = the intersystem crossing quantum yield; k F = fluorescence decay rate; k IC = internal conversion rate; k ISC = intersystem crossing rate; k RISC = reverse intersystem crossing rate.
Figure 3Nanosecond TA spectra of DMF‐BP‐PXZ in a) degassed THF solution (10−5 m) and c) the vacuum‐deposited neat film. Decay curves of DMF‐BP‐PXZ in b) degassed THF solution (10−5 m) and d) the vacuum‐deposited neat film at 940 nm (λex = 410 nm).
Figure 4Geometry comparisons between S0 (blue) and S1 (red) in a) THF and b) solid phase; geometry comparisons between S2 (black) and T3 (orange) in c) THF and d) solid phase.
Figure 5Adiabatic excitation energies for DMF‐BP‐PXZ a) in THF solution and b) in solid.
Figure 6Transition characteristics for S2 and T3 sates of DMF‐BP‐PXZ in THF solution and in solid phase. The value above every arrow represents the ratio of depicted NTOs in corresponding transition.
EL performances of OLEDs based on DMF‐BP‐PXZ, DPF‐BP‐PXZ, and SBF‐BP‐PXZ
| Emitter | Maximum values | Values at 1000 cd m−2 | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|
| ηc [cd A−1] | ηP [lm W−1] | ηext [%] |
|
| ηC [cd A−1] | ηP [lm W−1) | ηext [%] | RO [%] | CIE [ | |
| Nondoped device I | |||||||||||
| DMF‐BP‐PXZ | 2.7 | 39.9 | 38.0 | 13.3 | 27 331 | 4.9 | 37.4 | 24.0 | 12.5 | 6.0 | (0.440, 0.543) |
| DPF‐BP‐PXZ | 2.6 | 41.6 | 45.0 | 14.3 | 31 422 | 5.0 | 41.4 | 26.0 | 14.1 | 1.4 | (0.458, 0.530) |
| SBF‐BP‐PXZ | 2.5 | 36.8 | 37.9 | 12.3 | 33 990 | 4.0 | 36.7 | 28.8 | 12.2 | 0.8 | (0.456, 0.528) |
| Doped device II | |||||||||||
| DMF‐BP‐PXZ | 2.7 | 60.6 | 55.6 | 18.6 | 53 013 | 4.6 | 58.8 | 42.4 | 18.2 | 2.2 | (0.404, 0.565) |
| DPF‐BP‐PXZ | 2.7 | 62.3 | 59.9 | 19.0 | 77 480 | 4.4 | 61.5 | 43.9 | 18.8 | 1.1 | (0.399, 0.564) |
| SBF‐BP‐PXZ | 2.7 | 62.3 | 62.9 | 19.4 | 113 145 | 4.2 | 61.8 | 46.2 | 19.2 | 1.0 | (0.419, 0.557) |
Abbreviations: V on = turn‐on voltage at 1 cd m−2; ηc = current efficiency; ηp = power efficiency; ηext = external quantum efficiency; L = luminance; RO = external quantum efficiency roll‐off from maximum value to that at 1000 cd m−2; CIE = Commission Internationale de I'Eclairage coordinates. Device I (nondoped OLEDs): ITO/TAPC (25 nm)/DMF‐BP‐PXZ or DPF‐BP‐PXZ or SBF‐BP‐PXZ (35 nm)/TmPyPB (55 nm)/LiF (1 nm)/Al; Device II (doped OLEDs): ITO/TAPC (25 nm)/30 wt% DMF‐BP‐PXZ or 30 wt% DPF‐BP‐PXZ or 30 wt% SBF‐BP‐PXZ : CBP (35 nm)/TmPyPB (55 nm)/LiF (1 nm)/Al.