Literature DB >> 3064656

Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.

W H Aberth, A L Burlingame.   

Abstract

Entities:  

Mesh：

Substances：

Year:  1988        PMID： 3064656     DOI： 10.1021/ac00165a016

Source DB:  PubMed          Journal:  Anal Chem        ISSN： 0003-2700            Impact factor:   6.986


× No keyword cloud information.
  3 in total

1.  Improving fast atom bombardment mass spectra: The influence of some controllable parameters on spectral quality.

Authors:  J D Reynolds; K D Cook
Journal:  J Am Soc Mass Spectrom       Date:  1990-04       Impact factor: 3.109

2.  A comparison of the peptide fragmentation obtained from a reflector matrix-assisted laser desorption-ionization time-of-flight and a tandem four sector mass spectrometer.

Authors:  J C Rousecor; W Yu; S A Martin
Journal:  J Am Soc Mass Spectrom       Date:  1995-09       Impact factor: 3.109

3.  Origins and structures of background ions produced by fast-atom bombardment of glycerol.

Authors:  K A Caldwell; M L Gross
Journal:  J Am Soc Mass Spectrom       Date:  1994-02       Impact factor: 3.109
  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.