Literature DB >> 24222518

Origins and structures of background ions produced by fast-atom bombardment of glycerol.

K A Caldwell1, M L Gross.   

Abstract

Accurate mass measurements were used to assign elemental compositions and tandem mass spectrometry was used to characterize the peak-at-every-mass background ions produced by kiloelectron-volt-particle bombardment of neat fast-atom bombardment matrices. The majority of the background ions observed in the mass spectrum of neat glycerol was identified. On the basis of the experiments with glycerol, a theory for the formation of background ions is presented. Results are discussed according to the chemical and physical changes that ygoe;on-volt-particle bombardment produces in the matrix.

Entities:  

Year:  1994        PMID: 24222518     DOI: 10.1016/1044-0305(94)85039-9

Source DB:  PubMed          Journal:  J Am Soc Mass Spectrom        ISSN: 1044-0305            Impact factor:   3.109


  11 in total

1.  Continuous-flow fast atom bombardment mass spectrometry.

Authors:  R M Caprioli; W T Moore
Journal:  Methods Enzymol       Date:  1990       Impact factor: 1.600

2.  Molecular secondary ion mass spectrometry.

Authors:  R J Day; S E Unger; R G Cooks
Journal:  Anal Chem       Date:  1980-04-01       Impact factor: 6.986

3.  Fast atom bombardment-induced condensation of glycerol with ammonium surfactants. I: Regioselectivity of the adduct formation.

Authors:  A A Tuinman; K D Cook
Journal:  J Am Soc Mass Spectrom       Date:  1992-05       Impact factor: 3.109

4.  Ion source for liquid matrix secondary ionization mass spectrometry.

Authors:  A M Falick; G H Wang; F C Walls
Journal:  Anal Chem       Date:  1986-06       Impact factor: 6.986

5.  Influence of the ratio of matrix to analyte on the fast atom bombardment mass spectrometric response of peptides sampled from aqueous glycerol.

Authors:  C E Heine; J F Holland; J T Watson
Journal:  Anal Chem       Date:  1989-12-01       Impact factor: 6.986

6.  Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.

Authors:  W H Aberth; A L Burlingame
Journal:  Anal Chem       Date:  1988-07-15       Impact factor: 6.986

7.  Instrumental conditions of secondary ion mass spectrometry that affect sensitivity for observation of very high masses.

Authors:  W Aberth
Journal:  Anal Chem       Date:  1986-05       Impact factor: 6.986

8.  Dehalogenation reactions in fast atom bombardment mass spectrometry.

Authors:  S K Sethi; C C Nelson; J A McCloskey
Journal:  Anal Chem       Date:  1984-09       Impact factor: 6.986

9.  Negative gold ion gun for liquid secondary ion mass spectrometry.

Authors:  C N McEwen; J R Hass
Journal:  Anal Chem       Date:  1985-04       Impact factor: 6.986

10.  Detection, identification and structural investigation of biologically important compounds by secondary ion mass spectrometry.

Authors:  A Benninghoven; W K Sichtermann
Journal:  Anal Chem       Date:  1978-07       Impact factor: 6.986

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  2 in total

1.  Evidence for a mechanism that involves secondary electron capture in the liquid secondary ionization mass spectrometry beam-induced dehalogenation of organic compounds.

Authors:  R Théberge; M J Bertrand
Journal:  J Am Soc Mass Spectrom       Date:  1996-11       Impact factor: 3.109

2.  Beam-induced reaction between meta-nitrobenzyl alcohol and dipyridocyanine dyes in liquid-secondary-ion mass spectrometry.

Authors:  S W Lemire; X Zhao; L M Tolbert; K L Busch
Journal:  J Am Soc Mass Spectrom       Date:  1994-11       Impact factor: 3.109

  2 in total

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