| Literature DB >> 30645371 |
Yohei Nishizaki, Matias Valdivia, Ryoichi Horisaki, Katsuhisa Kitaguchi, Mamoru Saito, Jun Tanida, Esteban Vera.
Abstract
We present a new class of wavefront sensors by extending their design space based on machine learning. This approach simplifies both the optical hardware and image processing in wavefront sensing. We experimentally demonstrated a variety of image-based wavefront sensing architectures that can directly estimate Zernike coefficients of aberrated wavefronts from a single intensity image by using a convolutional neural network. We also demonstrated that the proposed deep learning wavefront sensor can be trained to estimate wavefront aberrations stimulated by a point source and even extended sources.Year: 2019 PMID: 30645371 DOI: 10.1364/OE.27.000240
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894