Literature DB >> 30353290

Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment Ions.

M P Seah1, R Havelund2, S J Spencer2, I S Gilmore2.   

Abstract

Sets of matrix factors, Ξ, are reported for the first time for secondary ions in secondary ion mass spectrometry for several binary organic systems. These show the interplay of the effects of ion velocity, fragment chemistry, and the secondary ion point of origin. Matrix factors are reported for negative ions for Irganox 1010 with FMOC or Irganox 1098 and, for both positive and negative ions, with Ir(ppy)2(acac). For Irganox 1010/FMOC, the Ξ values for Irganox 1010 fall with m/z, whereas those for FMOC rise. For m/z < 250, Ξ scales very approximately with (m/z)0.5, supporting a dependence on the ion velocity at low mass. Low-mass ions generally have low matrix factors but |Ξ| may still exceed 0.5 for m/z < 50. Analysis of ion sequences with addition or loss of a hydrogen atom shows that the Ξ values for Irganox 1010 and FMOC ions change by - 0.026 and 0.24 per hydrogen atom, respectively, arising from the changing charge transfer rate constant. This effect adds to that of velocity and may be associated with the nine times more hydrogen atoms in the Irganox 1010 molecule than in FMOC. For Irganox 1098/Irganox 1010, the molecular similarity leads to small |Ξ|, except for the pseudo molecular ions where the behavior follows Irganox 1010/FMOC. For Ir(ppy)2(acac)/Irganox 1010, the positive secondary ions show twice the matrix effects of negative ions. These data provide the first overall assessment of matrix factors in organic mixtures necessary for improved understanding for quantification and the precise localization of species. Graphical Abstract ᅟ.

Entities:  

Keywords:  Analysis; Matrix factors; Organic solid mixtures; Quantification; SIMS; Secondary ion mass spectrometry

Year:  2018        PMID: 30353290     DOI: 10.1007/s13361-018-2086-8

Source DB:  PubMed          Journal:  J Am Soc Mass Spectrom        ISSN: 1044-0305            Impact factor:   3.109


  14 in total

1.  Matrix effects in biological SIMS using cluster ion beams of different chemical composition.

Authors:  Afnan M Alnajeebi; John C Vickerman; Nicholas P Lockyer
Journal:  Biointerphases       Date:  2016-06-29       Impact factor: 2.456

2.  Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles.

Authors:  R Havelund; M P Seah; I S Gilmore
Journal:  J Phys Chem B       Date:  2016-02-26       Impact factor: 2.991

3.  Organic depth profiling of a binary system: the compositional effect on secondary ion yield and a model for charge transfer during secondary ion emission.

Authors:  Alexander G Shard; Ali Rafati; Ryosuke Ogaki; Joanna L S Lee; Simon Hutton; Gautam Mishra; Martyn C Davies; Morgan R Alexander
Journal:  J Phys Chem B       Date:  2009-08-27       Impact factor: 2.991

4.  Enhancing ion yields in time-of-flight-secondary ion mass spectrometry: a comparative study of argon and water cluster primary beams.

Authors:  Sadia Sheraz née Rabbani; Irma Berrueta Razo; Taylor Kohn; Nicholas P Lockyer; John C Vickerman
Journal:  Anal Chem       Date:  2015-01-27       Impact factor: 6.986

5.  Organic secondary ion mass spectrometry: signal enhancement by water vapor injection.

Authors:  Taoufiq Mouhib; Arnaud Delcorte; Claude Poleunis; Patrick Bertrand
Journal:  J Am Soc Mass Spectrom       Date:  2010-08-27       Impact factor: 3.109

6.  Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

Authors:  M P Seah; R Havelund; A G Shard; I S Gilmore
Journal:  J Phys Chem B       Date:  2015-10-08       Impact factor: 2.991

7.  Reduce the matrix effect in biological tissue imaging using dynamic reactive ionization and gas cluster ion beams.

Authors:  Hua Tian; Andreas Wucher; Nicholas Winograd
Journal:  Biointerphases       Date:  2016-06-08       Impact factor: 2.456

8.  Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

Authors:  Alexander G Shard; Rasmus Havelund; Steve J Spencer; Ian S Gilmore; Morgan R Alexander; Tina B Angerer; Satoka Aoyagi; Jean-Paul Barnes; Anass Benayad; Andrzej Bernasik; Giacomo Ceccone; Jonathan D P Counsell; Christopher Deeks; John S Fletcher; Daniel J Graham; Christian Heuser; Tae Geol Lee; Camille Marie; Mateusz M Marzec; Gautam Mishra; Derk Rading; Olivier Renault; David J Scurr; Hyun Kyong Shon; Valentina Spampinato; Hua Tian; Fuyi Wang; Nicholas Winograd; Kui Wu; Andreas Wucher; Yufan Zhou; Zihua Zhu; Vanina Cristaudo; Claude Poleunis
Journal:  J Phys Chem B       Date:  2015-08-06       Impact factor: 2.991

9.  SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.

Authors:  R Havelund; M P Seah; M Tiddia; I S Gilmore
Journal:  J Am Soc Mass Spectrom       Date:  2018-02-21       Impact factor: 3.109

10.  Enhancing secondary ion yields in time of flight-secondary ion mass spectrometry using water cluster primary beams.

Authors:  Sadia Sheraz née Rabbani; Andrew Barber; John S Fletcher; Nicholas P Lockyer; John C Vickerman
Journal:  Anal Chem       Date:  2013-05-31       Impact factor: 6.986

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  1 in total

1.  ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H2, C2H2, CO, and O2.

Authors:  Jernej Ekar; Peter Panjan; Sandra Drev; Janez Kovač
Journal:  J Am Soc Mass Spectrom       Date:  2021-12-22       Impact factor: 3.109

  1 in total

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