| Literature DB >> 30332463 |
Justyna P Zwolak1,2, Sandesh S Kalantre1,2,3, Xingyao Wu1,4, Stephen Ragole1,4, Jacob M Taylor1,2,4.
Abstract
BACKGROUND: Over the past decade, machine learning techniques have revolutionized how research and science are done, from designing new materials and predicting their properties to data mining and analysis to assisting drug discovery to advancing cybersecurity. Recently, we added to this list by showing how a machine learning algorithm (a so-called learner) combined with an optimization routine can assist experimental efforts in the realm of tuning semiconductor quantum dot (QD) devices. Among other applications, semiconductor quantum dots are a candidate system for building quantum computers. In order to employ QDs, one needs to tune the devices into a desirable configuration suitable for quantum computing. While current experiments adjust the control parameters heuristically, such an approach does not scale with the increasing size of the quantum dot arrays required for even near-term quantum computing demonstrations. Establishing a reliable protocol for tuning QD devices that does not rely on the gross-scale heuristics developed by experimentalists is thus of great importance.Entities:
Mesh:
Year: 2018 PMID: 30332463 PMCID: PMC6192646 DOI: 10.1371/journal.pone.0205844
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Fig 1Quantum dots from a nanowire.
A) A generic model of a nanowire with 5 gates. The barrier gates, V with i = 1, 2, 3 (light gray), are set to a fixed voltage and are used to form islands by confining electron density to certain region. Voltage on the plunger gates, V with j = 1, 2 (dark gray), is varied to allow for control of the current flow through the nanowire. B) Potential profile along a nanowire for a double dot system with N1 and N2 denoting the number of electrons on each dot. C) Possible states in the 5-gate device. In the short circuit state the potential profile is below the Fermi level, leading to an unintended current flow. When the potential profile is above the Fermi level, the current flow is blocked (barrier state). By varying the voltage applied to plunger gates in the lower range while keeping the barriers above the Fermi level of the contacts, one can transition between one and two dots.
Fig 2Data simulation flow chart.
The simulation for a device begins by setting gate voltages and calculating the potential profile V(x). This potential profile, along with other physical parameters, is used to calculate the electron-density self-consistently along the 1D channel. The state of the channel, e.g., the number of dots is known at this stage. The electron density is used to construct a capacitance model. The model predicts the stable charge states on the dots and the current through the device. The sensor conductance is calculated using the charge states. The final output for a single set of gate voltages consists of the device state (state labels), current, charges, and sensor conductance(s). The simulation is repeated for every point in the space of plunger gate voltages for a single device and then across an ensemble of device geometries.
Mean values for the parameters defining simulated 5-gates devices: Height of the potential profile (V0) at the gate position (x0), the height at which barriers were fixed (h), and the radius of the barrier gates (r0).
The device size along x-axis is 120 nm, with the center positioned at x0 = 0 nm.
| Gate | ||||
|---|---|---|---|---|
| -200 | −40 | 50 | 5 | |
| (0,400) | −20 | 50 | 5 | |
| -200 | 0 | 50 | 5 | |
| (0,400) | 20 | 50 | 5 | |
| -200 | 40 | 50 | 5 |
Fig 3Data structure.
The generic data structure tree for the data files. The data type is given in square brackets. The simulation output is highlighted in gray. See Tables 2 and 3 for a reference list.
The single device simulation output (stored as ‘output’) is a list of 10 000 dictionaries, holding the simulated data for each point in the plunger voltage space (defined by vectors ‘V_P1_vec’ and ‘V_P2_vec’).
The ‘output’ dictionaries include four variables, as defined in the table.
| Key | Description | Type |
|---|---|---|
| ‘charge’ | an information about the number of charges on each dot (with a default value 0 for short circuit and a barrier) | tuple |
| ‘current’ | a current through the device at infinitesimal bias | float |
| ‘sensor’ | an output of the charge sensors, evaluated as the electrostatic potential at the sensor locations | list |
| ‘state’ | a numeric label determining the state of the device, distinguishing between a single dot (1), a double dot (2), a short circuit (-1), and a barrier (0) | integer |
The physical parameters of the devices, stored as a dictionary ‘physics’.
Fixed values are given explicitly. Varied parameters, given in angle brackets, were randomly sampled from a Gaussian distribution with the given mean value μ and standard deviation set to 0.05|μ| (unless stated otherwise).
| Key | Description | Value |
|---|---|---|
| attempt_rate_coef | controls the strength of the attempt rate factor | 1 |
| barrier_current | a scale for the current set to the device when in barrier mode | 1 arb. unit |
| barrier_tunnel_rate | a tunnel rate set when the device is in barrier mode while calculating the tunnel probability | 10.0 |
| beta | effective temperature used for self-consistent calculation of the electron density | 1000(eV)−1 |
| bias | difference in the chemical potential between the source and drain | 100μeV |
| c_k | kinetic term for the 2DEG | 〈1 meV nm〉 |
| D | dimension of the problem to be used in the electron density integral, (only when polylogarithm function is used to calculate the electron density, for a 2DEG a direct analytic integral of the Fermi function is used) | 2 |
| g_0 | coefficient of the density of states | 〈1.0(eV nm)−1〉 |
| gates | the dictionary of parameters defining each of the five gates: | 〈1.0〉 |
| 〈50.0 nm〉 | ||
| - for gate 1 | 〈−40 nm〉 | |
| - for gate 2 | 〈−20 nm〉 | |
| - for gate 3 | 〈0 nm〉 | |
| - for gate 4 | 〈20 nm〉 | |
| - for gate 5 | 〈40 nm〉 | |
| - for gates 1, 3, and 5 | 〈200 mV〉 | |
| - for gates 2 and 4 | 〈−400 mV〉 | |
| 〈5.0 nm〉 | ||
| 〈20.0 nm〉 | ||
| K_0 | the strength of the Coulomb interaction | 〈10 meV〉 |
| K_mat | the Coulomb interaction matrix | K_mat(x,K_0,sigma) |
| kT | temperature of the system used in the transport calculations | 50 μeV |
| mu | Fermi level (assumed to be equal for both leads) | 0.1 eV |
| sensor_gate_coeff | weight applied while including the potential of the gate in calculating the sensor output | 0.1 |
| sensors | the position of the two charge sensors in the 2DEG plane, stored as (horizontal position with respect to the center of the device, vertical position with respect to the dots which are assumed to be located on the | [(−20,50), (20,50)] nm |
| short_circuit_current | an arbitrary high current value given to the device when in short circuit mode | 100 arb. unit |
| sigma | softening parameter | 3.0 nm |
| V | potential profile | V(x) |
| V_L | voltage applied to left lead | 50 μV |
| V_R | voltage applied to right lead | −50 μV |
| WKB_coeff | the strength of WKB tunneling | 0.5 |
| x | linear array spanning the size of the device | (−60, 60) nm |
Fig 4Data visualization.
A) Current, B) charge, C) charge sensor, and D) state data as a function of plunger gate voltages (2D map 100 × 100 pixels). Note that the data is unitless. For current, the data in the figure is re-scaled by a factor of 104. The code used to generate these plots can be found in S1 File.
Fig 5State distribution.
A) A typical distribution of states in a sample training set (N = 9009). B) A visualization of the performance of the ML algorithm on sample simulated data (N = 1001).
Fig 6A sample preview output.
A preview of a single dot (left) and of a double dot subregion (right) generated using a QFlow lite build-in function qf.data_preview(). The labels printed above images indicate the actual state, as well as the fraction of each type of state within the given image in the format: [SC, QPC, SD, DD].