| Literature DB >> 30310593 |
Mitsuharu Suzuki1, Yuji Yamaguchi2, Kensuke Uchinaga1, Katsuya Takahira2, Cassandre Quinton1, Shinpei Yamamoto1, Naoto Nagami1, Mari Furukawa1, Ken-Ichi Nakayama2,3, Hiroko Yamada1.
Abstract
The synergistic action of properly integrated semiconducting materials can bring about sophisticated electronic processes and functions. However, it is often a great challenge to achieve optimal performance in organic devices because of the limited control over the distribution of different materials in active layers. Here, we employ a unique photoreaction-based layer-by-layer solution process for preparing ternary organic photovoltaic layers. This process is applicable to a variety of compounds from wide-band-gap small molecules to narrow-band-gap π-extended systems, and enables the preparation of multicomponent organic semiconducting thin films having the right compound at the right place. The resulting ternary photovoltaic devices afford high internal quantum efficiencies, leading to an approximately two times higher power-conversion efficiency as compared to the corresponding binary bulk-heterojunction system. This work opens up new possibilities in designing materials and active layers for solution-processed organic electronic devices.Entities:
Year: 2018 PMID: 30310593 PMCID: PMC6115635 DOI: 10.1039/c8sc01799a
Source DB: PubMed Journal: Chem Sci ISSN: 2041-6520 Impact factor: 9.825
Fig. 1(a) General scheme of the photo-induced decarbonylative aromatization employed in the photoprecursor approach; (b) chemical structures of the newly synthesized DK-type photoprecursors PhBADTDK and AtDDK, and their photoreaction products PhBADT and AtD; (c) schematic illustration of the p–i–n-type OPV evaluated in this work.
Scheme 1Synthesis of the photoprecursors. (a) PhBADTDK; (b) AtDDK.
Fig. 2(a and b) Frontier-orbital coefficient distribution in PhBADT and AtD calculated at the B3LYP/6-31G(d) level of theory. Note that the ethylhexyl groups of AtD are simplified to methyl for saving the calculation time. (c) Photoabsorption spectra of thin films of PhBADT and AtD prepared by the photoprecursor approach. (d) Energy-level diagram of PhBADT and AtD along with PC71BM and electrode materials. The values are adopted from the literature26 except those for PhBADT and AtD. The HOMO levels of PhBADT and AtD were determined by photoelectron yield spectroscopy in air and the LUMO levels were calculated to be “HOMO + absorption onset energy”. See the ESI† for experimental details.
Fig. 3Schematic description of the procedure for fabricating p–i–n-type OPVs through the photoprecursor approach. ETL-1 is a fullerene-based solution-processable cathode buffer reported by Li et al.27
Photovoltaic parameters ,
| Entry | Active layer structure |
|
| FF | PCE | PCEave |
|
|
| 1 | p–i–n | 10.6 | 0.89 | 49.8 | 4.7 | 4.3 ± 0.3 | 16 | 424 |
| 2 | BHJ | 1.6 | 0.83 | 23.5 | 0.30 | 0.29 ± 0.02 | 433 | 465 |
| 3 | p–i | 2.8 | 0.92 | 24.6 | 0.63 | 0.58 ± 0.09 | 213 | 307 |
| 4 | i–n | 9.7 | 0.89 | 48.1 | 4.1 | 3.9 ± 0.4 | 21 | 423 |
| 5 | p–i–n (with SVA) | 12.7 | 0.88 | 52.6 | 5.9 | 5.5 ± 0.3 | 11 | 411 |
Measured under simulated AM1.5G illumination at 100 mW cm–2.
General device structure: [ITO/PEDOT:PSS (30 nm)/active layer/ETL-1/Al (80 nm)].
Concentrations of cast solutions: PhBADTDK for p-layer, 1 mg mL–1; AtDDK:PC71BM (1 : 1) for i-layer, 9 mg mL–1; PC71BM for n-layer, 7 mg mL–1. All these solutions are in chloroform.
Parameters of the best-performing cells.
Averages and standard deviations calculated from at least four devices.
R S, series resistance; RP, parallel resistance.
Annealed with THF vapor for 120 s.
Fig. 4Photovoltaic response of the OPVs prepared without annealing treatment (Entries 1–4 in Table 1). (a) J–V curves; (b) EQE spectra; (c) IQE spectra. Data are of the best-performing cell in each active-layer structure and obtained under simulated AM1.5G illumination at 100 mW cm–2. EQE: external quantum efficiency, IQE: internal quantum efficiency.
Fig. 5Tapping-mode AFM images of AtD:PC71BM (1 : 1) blend films before (a) and after (b) SVA with THF. The scale bars correspond to 0.5 μm. The RMS values of surface roughness are 0.32 and 0.48 nm for (a) and (b), respectively.
Fig. 6Photovoltaic characteristics of p–i–n OPVs. (a) J–V curves and (b) photoabsorption, EQE and IQE spectra of the best-performing p–i–n OPV prepared with THF SVA; (c) light-intensity dependence of JSC of the best-performing p–i–n devices prepared with THF SVA; (c) light-intensity dependence of JSC of the best-performing p–i–n devices prepared with and without THF SVA. The α values are 0.981 for the device with SVA and 0.974 without SVA.