Literature DB >> 30216795

New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlation.

T J Ruggles1, G F Bomarito2, R L Qiu3, J D Hochhalter2.   

Abstract

Conventional high angular resolution electron backscatter diffraction (HREBSD) uses cross-correlation to track features between diffraction patterns, which are then related to the relative elastic strain and misorientation between the diffracting volumes of material. This paper adapts inverse compositional Gauss Newton (ICGN) digital image correlation (DIC) to be compatible with HREBSD. ICGN-based works by efficiently tracking not just the shift in features, but also the change in their shape. Modeling a shape change as well as a shift results in greater accuracy. This method, ICGN-based HREBSD, is applied to a simulated data set, and its performance is compared to conventional cross-correlation HREBSD, and cross-correlation HREBSD with remapping. ICGN-based HREBSD is shown to have about half the strain error of the best cross-correlation method with a comparable computation time.
Copyright © 2018. Published by Elsevier B.V.

Keywords:  DIC; HREBSD; Simulated EBSD patterns

Year:  2018        PMID: 30216795      PMCID: PMC7780544          DOI: 10.1016/j.ultramic.2018.08.020

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  22 in total

1.  High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.

Authors:  T B Britton; A J Wilkinson
Journal:  Ultramicroscopy       Date:  2012-01-18       Impact factor: 2.689

2.  High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

Authors:  Angus J Wilkinson; Graham Meaden; David J Dingley
Journal:  Ultramicroscopy       Date:  2005-11-15       Impact factor: 2.689

3.  Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.

Authors:  T B Britton; J Jiang; R Clough; E Tarleton; A I Kirkland; A J Wilkinson
Journal:  Ultramicroscopy       Date:  2013-08-21       Impact factor: 2.689

4.  Bragg's Law diffraction simulations for electron backscatter diffraction analysis.

Authors:  Josh Kacher; Colin Landon; Brent L Adams; David Fullwood
Journal:  Ultramicroscopy       Date:  2009-05-27       Impact factor: 2.689

5.  Towards high accuracy calibration of electron backscatter diffraction systems.

Authors:  Ken Mingard; Austin Day; Claire Maurice; Peter Quested
Journal:  Ultramicroscopy       Date:  2011-01-18       Impact factor: 2.689

6.  Limits of simulation based high resolution EBSD.

Authors:  Jon Alkorta
Journal:  Ultramicroscopy       Date:  2013-04-17       Impact factor: 2.689

7.  Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction.

Authors:  Bret E Dunlap; Timothy J Ruggles; David T Fullwood; Brian Jackson; Martin A Crimp
Journal:  Ultramicroscopy       Date:  2017-09-01       Impact factor: 2.689

8.  Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

Authors:  T B Britton; C Maurice; R Fortunier; J H Driver; A P Day; G Meaden; D J Dingley; K Mingard; A J Wilkinson
Journal:  Ultramicroscopy       Date:  2010-08-18       Impact factor: 2.689

9.  A consistent full-field integrated DIC framework for HR-EBSD.

Authors:  T Vermeij; J P M Hoefnagels
Journal:  Ultramicroscopy       Date:  2018-05-05       Impact factor: 2.689

10.  Estimations of bulk geometrically necessary dislocation density using high resolution EBSD.

Authors:  T J Ruggles; D T Fullwood
Journal:  Ultramicroscopy       Date:  2013-05-18       Impact factor: 2.689

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