Literature DB >> 28888107

Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction.

Bret E Dunlap1, Timothy J Ruggles2, David T Fullwood3, Brian Jackson3, Martin A Crimp4.   

Abstract

In this work, the relative capabilities and limitations of electron channeling contrast imaging (ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD) have been assessed by studying the dislocation distributions resulting from nanoindentation in body centered cubic Ta. Qualitative comparison reveals very similar dislocation distributions between the CC-EBSD mapped GNDs and the ECC imaged dislocations. Approximate dislocation densities determined from ECC images compare well to those determined by CC-EBSD. Nevertheless, close examination reveals subtle differences in the details of the distributions mapped by these two approaches. The details of the dislocation Burgers vectors and line directions determined by ECCI have been compared to those determined using CC-EBSD and reveal good agreement.
Copyright © 2017 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  CC-EBSD; Dislocations; EBSD dislocation microscopy; ECCI; HR-EBSD; Nanoindentation

Year:  2017        PMID: 28888107      PMCID: PMC8025839          DOI: 10.1016/j.ultramic.2017.08.017

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  9 in total

1.  Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).

Authors: 
Journal:  J Microsc       Date:  1999-09       Impact factor: 1.758

2.  Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope.

Authors:  G Naresh-Kumar; B Hourahine; P R Edwards; A P Day; A Winkelmann; A J Wilkinson; P J Parbrook; G England; C Trager-Cowan
Journal:  Phys Rev Lett       Date:  2012-03-30       Impact factor: 9.161

3.  High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

Authors:  Angus J Wilkinson; Graham Meaden; David J Dingley
Journal:  Ultramicroscopy       Date:  2005-11-15       Impact factor: 2.689

Review 4.  Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast.

Authors:  Martin A Crimp
Journal:  Microsc Res Tech       Date:  2006-05       Impact factor: 2.769

5.  Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.

Authors:  T B Britton; J Jiang; R Clough; E Tarleton; A I Kirkland; A J Wilkinson
Journal:  Ultramicroscopy       Date:  2013-08-21       Impact factor: 2.689

6.  Sub-micron resolution selected area electron channeling patterns.

Authors:  J Guyon; H Mansour; N Gey; M A Crimp; S Chalal; N Maloufi
Journal:  Ultramicroscopy       Date:  2014-11-11       Impact factor: 2.689

7.  Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.

Authors:  J Jiang; T B Britton; A J Wilkinson
Journal:  Ultramicroscopy       Date:  2012-11-23       Impact factor: 2.689

8.  The effect of length scale on the determination of geometrically necessary dislocations via EBSD continuum dislocation microscopy.

Authors:  T J Ruggles; T M Rampton; A Khosravani; D T Fullwood
Journal:  Ultramicroscopy       Date:  2016-03-09       Impact factor: 2.689

9.  Estimations of bulk geometrically necessary dislocation density using high resolution EBSD.

Authors:  T J Ruggles; D T Fullwood
Journal:  Ultramicroscopy       Date:  2013-05-18       Impact factor: 2.689

  9 in total
  1 in total

1.  New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlation.

Authors:  T J Ruggles; G F Bomarito; R L Qiu; J D Hochhalter
Journal:  Ultramicroscopy       Date:  2018-08-29       Impact factor: 2.689

  1 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.