| Literature DB >> 30033946 |
Ichiro Higashikubo1, Heihachiro Arito1,2, Yoko Eitaki1,3, Akihiro Araki1, Kenji Ando1, Hidesuke Shimizu1, Haruhiko Sakurai1.
Abstract
This study quantitatively assessed personal exposure of 86 workers to indium compounds as total dust at 11 Japanese indium plants. The personal exposures to indium concentrations in the breathing zone during an 8 h work-shift were determined by ICP-MS. The arithmetic mean indium concentration of all the workers was 0.098 mg Indium (In)/m3, with individual values ranging from 0.0001 to 1.421 mg In/m3. There were 11 workers whose exposure to indium concentrations exceeded the American Conference of Governmental Industrial Hygienists' Threshold Limit Value-Time Weighted Average (TLV-TWA) of 0.1 mg In/m3. Based on the condition TLV-TWA<X95 (upper 95th percentile of log-normal distribution), five indium plants were judged as "control measures required", while 3 other plants were evaluated as "control measures not required". Five workers belonging to the worst group were exposed to far higher indium concentrations than the TLV-TWA. Another group of 5 workers belonging to the best group was exposed to far lower indium concentrations than the TLV-TWA, and this was attributed to the stringent engineering control measures used at their workplaces. The quantitative assessment of occupational exposure to indium dust was influenced by different occupational exposure limit values without carcinogenicity and particle size-selectivity of indium particulates or "total" dust.Entities:
Keywords: Indium dust; Indium-Tin-Oxide; Particle size-selectivity; Personal sampling; Total dust; Upper 95th percentile
Mesh:
Substances:
Year: 2018 PMID: 30033946 PMCID: PMC6258755 DOI: 10.2486/indhealth.2018-0099
Source DB: PubMed Journal: Ind Health ISSN: 0019-8366 Impact factor: 2.179
Summary of 11 Japanese indium plants examined for indium material handled, operations in manufacturing processes, number of employees and number of workers exposed to indium compounds in total dust
| Plants | Sectors of indium industry | Number of employees | Indium compounds handled | Operations in indium- manufacturing processes | Number of examined workers exposed to indium/Total number of possibly exposed workers |
|---|---|---|---|---|---|
| a | Recycling/Reclamation | 21 | ITO, Metallic indium, Indium hydroxide | Crushing raw materials, Filling and bagging, Solubilizing indium materials | 8/14 |
| b | Manufacturing electronic devices including ITO | 118 | Indium hydroxide, ITO | Ingot filling, Solubilizing, Drying and crushing | 3/18 |
| c | Manufacturing electronic devices including ITO | 135 | ITO | Pellett and powder filling, Crushing | 1/2 |
| d | Manufacturing electronic devices including transparent electrodes and panels | 486 | Indium hydroxide, ITO | Weighing and powder filling, Formulation, Bonding, Grinding and cleaning | 12/33 |
| e | Manufacturing electronic devices including transparent electrodes and panels | 150 | Indium hydroxide, ITO | Deposition by beam evaporation, Filling into a 18-l container, Maintenance (powder) | 9/14 |
| f | Manufacturing electronic devices including sputtering target | 70 | ITO | Shot-blasting, Dust cleaning | 6/10 |
| g | Recycling/Reclamation | 579 | Indium oxide, Indium hydroxide | Filtering and drying, Crushing, Powder filling | 11/32 |
| h | Manufacturing electronic devices including sputtering target | 192 | ITO | Sintering (Ingot, solubilized metal), Crushing and bonding (clumpted metal), Grinding and Powder fillling | 9/14 |
| i | Manufacturing electronic devices including sputtering target, Surface materials and semiconductors | 318 | Metallic indium, ITO, Indium hydroxide, Indium phosphide | Pressing (cake-like), Bonding (clumped metal), Drying, Filling,Grinding and dust cleaning | 17/114 |
| j | Recycling/Reclamation | 45 | Metallic indium, ITO | Ingot melting and solubilizing, Electrophoresis, Sintering | 8/11 |
| k | Recycling/Reclamation | 25 | Metallic indium, ITO | Crushing, Solubilizing, Sintering ingot | 2/3 |
Fig. 1.Individual 8h-TWA indium total dust exposure concentrations of the 86 workers. The individuals are identified by a number and a letter, which indicates the plant where they were employed. The two dashed lines indicate the TLV-TWA (0.1 mg/m3) and the AL (0.05 mg/m3).
Indium concentrations (mg In/m3) as determined by personal exposure to total dust of indium at the breathing zone with reference to ACGIH’s TLV-TWA
| Items | Plants | Number of workers | Number of workers whose exposure concentrations exceeded the TLV-TWA (0.1 mg In/m3) | Number of workers whose exposure concentrations exceeded the AL (0.05 mg In/m3) | Min | Max | AM | GM | GSD | X95 | Statistical significance of log-normal distribution at
|
|---|---|---|---|---|---|---|---|---|---|---|---|
| Indium concentrations in total dust | a | 8 | 3 | 4 | 0.004 | 0.760 | 0.146 | 0.052 | 4.864 | 0.701 | * |
| b | 3 | 0 | 1 | 0.011 | 0.085 | 0.044 | NC | NC | NC | NC | |
| c | 1 | 1 | 1 | 0.120 | 0.120 | 0.120 | NC | NC | NC | NC | |
| d | 12 | 1 | 2 | 0.002 | 0.194 | 0.033 | 0.013 | 4.137 | 0.131 | * | |
| e | 9 | 3 | 5 | 0.001 | 1.421 | 0.345 | 0.073 | 9.693 | 3.047 | ||
| f | 6 | 0 | 0 | 0.0001 | 0.001 | 0.000 | 0.0003 | 2.321 | 0.001 | * | |
| g | 11 | 1 | 3 | 0.006 | 0.469 | 0.069 | 0.028 | 3.403 | 0.209 | * | |
| h | 9 | 0 | 1 | 0.002 | 0.090 | 0.020 | 0.012 | 2.894 | 0.067 | * | |
| i | 17 | 1 | 1 | 0.0004 | 0.965 | 0.071 | 0.010 | 6.668 | 0.220 | * | |
| j | 8 | 0 | 0 | 0.001 | 0.026 | 0.009 | 0.005 | 3.497 | 0.035 | * | |
| k | 2 | 1 | 1 | 0.002 | 1.273 | 0.638 | NC | NC | NC | NC | |
| Total | 86 | 11 | 19 | 0.0001 | 1.421 | 0.098 | 0.014 | 7.610 | 0.393 | * |
AL: Action level; Min: Minmum value; Max: Maximum value; AM: Arithmetic mean; GM: Geometric mean; GSD: Geometric standard deviation; X95:Upper 95th percentile of a log-normal distribution; NC: Not calculated.
The worst and best 5 cases of personal exposure to indium compounds in total dust in the breathing zone, and industrial hygiene control measures being used at their workplaces
| Personal exposure concentrations of indium in total dust | Control Measures | |||
|---|---|---|---|---|
| The worst or best group of 5 cases | Indium-handling operations (Time spent at the workplace) | Indium exposure concentration as 8h-TWA (mg In/m3) | Local Exhaust Ventilation (LEV) | Respiratory Protective Equipment (RPE) |
| Worst group | ||||
| Worker e8 | Collection of indium oxide dust into 18-l container (44 min) | 1.421 | None | Half-face dust mask |
| Worker k2 | Crushing (5 min), Sintering (25 min) | 1.273 | Hood-type LEV | Half-face dust mask |
| Worker e9 | Collection of indium oxide powder into a 18-l container (44 min) | 1.256 | None | Half-face dust mask |
| Worker i17 | Cutting off and crushing of ITO target (30 min) | 0.965 | Hood-type LEV | Half-face dust mask |
| Worker a6 | Weighing and bagging (120 min) | 0.760 | Hood-type LEV | Half-face dust mask |
| Best group | ||||
| Worker f6 | Recovery of indium residue in the ditch (16 min) | 0.0001 | None | Half-face dust mask |
| Worker f5 | Recovery and transfer of indium residue from the ditch (13 min) | 0.0002 | None | Half-face dust mask |
| Worker f3 | Shot-blasting (380 min) | 0.0003 | Enclosed-type LEV | Half-face dust mask |
| Worker i9 | Grinding and cutting off of InP crystal (360 min) | 0.0004 | Glove box | Disposable, unwoven mask |
| Worker i8 | Grinding and cutting off of InP single crystal (360 min) | 0.0005 | Enclosed-type LEV | None |