Literature DB >> 29981229

Through-focus or volumetric type of optical imaging methods: a review.

Ravikiran Attota1.   

Abstract

In recent years, the use of through-focus (TF) or volumetric type of optical imaging has gained momentum in several areas such as biological imaging, microscopy, adaptive optics, material processing, optical data storage, and optical inspection. We provide a review of basic TF optical methods highlighting their design, major unique characteristics, and application space. (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

Entities:  

Keywords:  axial scanning; extended-depth-of-field imaging; optical imaging; optical microscope; out-of-focus imaging; through-focus imaging; through-focus scanning optical microscopy; volumetric imaging

Year:  2018        PMID: 29981229      PMCID: PMC6157599          DOI: 10.1117/1.JBO.23.7.070901

Source DB:  PubMed          Journal:  J Biomed Opt        ISSN: 1083-3668            Impact factor:   3.170


  64 in total

1.  High-resolution full-field optical coherence tomography with a Linnik microscope.

Authors:  Arnaud Dubois; Laurent Vabre; Alber-Claude Boccara; Emmanuel Beaurepaire
Journal:  Appl Opt       Date:  2002-02-01       Impact factor: 1.980

2.  Optical sectioning deep inside live embryos by selective plane illumination microscopy.

Authors:  Jan Huisken; Jim Swoger; Filippo Del Bene; Joachim Wittbrodt; Ernst H K Stelzer
Journal:  Science       Date:  2004-08-13       Impact factor: 47.728

3.  Simultaneous imaging of different focal planes in fluorescence microscopy for the study of cellular dynamics in three dimensions.

Authors:  Prashant Prabhat; Sripad Ram; E Sally Ward; Raimund J Ober
Journal:  IEEE Trans Nanobioscience       Date:  2004-12       Impact factor: 2.935

4.  Extended depth of field imaging for high speed cell analysis.

Authors:  William E Ortyn; David J Perry; Vidya Venkatachalam; Luchuan Liang; Brian E Hall; Keith Frost; David A Basiji
Journal:  Cytometry A       Date:  2007-04       Impact factor: 4.355

5.  Extended focused image in microscopy by digital Holography.

Authors:  Pietro Ferraro; Simonetta Grilli; Domenico Alfieri; Sergio De Nicola; Andrea Finizio; Giovanni Pierattini; Bahram Javidi; Giuseppe Coppola; Valerio Striano
Journal:  Opt Express       Date:  2005-09-05       Impact factor: 3.894

6.  Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis.

Authors:  Ravikiran Attota; Thomas A Germer; Richard M Silver
Journal:  Opt Lett       Date:  2008-09-01       Impact factor: 3.776

7.  Enhancing diffractive multi-plane microscopy using colored illumination.

Authors:  Alexander Jesacher; Clemens Roider; Monika Ritsch-Marte
Journal:  Opt Express       Date:  2013-05-06       Impact factor: 3.894

8.  Designing the focal plane spacing for multifocal plane microscopy.

Authors:  Amir Tahmasbi; Sripad Ram; Jerry Chao; Anish V Abraham; Felix W Tang; E Sally Ward; Raimund J Ober
Journal:  Opt Express       Date:  2014-07-14       Impact factor: 3.894

9.  Parameter optimization for through-focus scanning optical microscopy.

Authors:  Ravi Kiran Attota; Hyeonggon Kang
Journal:  Opt Express       Date:  2016-06-27       Impact factor: 3.894

10.  Super-resolution imaging of multiple cells by optimised flat-field epi-illumination.

Authors:  Kyle M Douglass; Christian Sieben; Anna Archetti; Ambroise Lambert; Suliana Manley
Journal:  Nat Photonics       Date:  2016-10-17       Impact factor: 38.771

View more
  3 in total

1.  Five-dimensional two-photon volumetric microscopy of in-vivo dynamic activities using liquid lens remote focusing.

Authors:  Kayvan Forouhesh Tehrani; Charles V Latchoumane; W Michael Southern; Emily G Pendleton; Ana Maslesa; Lohitash Karumbaiah; Jarrod A Call; Luke J Mortensen
Journal:  Biomed Opt Express       Date:  2019-06-26       Impact factor: 3.732

2.  Fidelity test for through-focus or volumetric type of optical imaging methods.

Authors:  Ravi Kiran Attota
Journal:  Opt Express       Date:  2018-07-23       Impact factor: 3.894

3.  Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy.

Authors:  Min-Ho Rim; Emil Agocs; Ronald Dixson; Prem Kavuri; András E Vladár; Ravi Kiran Attota
Journal:  J Vac Sci Technol B Nanotechnol Microelectron       Date:  2020
  3 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.