| Literature DB >> 29979180 |
Hongchang Wang1, Biao Cai2, Matthew James Pankhurst3, Tunhe Zhou1, Yogesh Kashyap4, Robert Atwood1, Nolwenn Le Gall3, Peter Lee3, Michael Drakopoulos1, Kawal Sawhney1.
Abstract
X-ray phase-contrast imaging can substantially enhance image contrast for weakly absorbing samples. The fabrication of dedicated optics remains a major barrier, especially in high-energy regions (i.e. over 50 keV). Here, the authors perform X-ray phase-contrast imaging by using engineered porous materials as random absorption masks, which provides an alternative solution to extend X-ray phase-contrast imaging into previously challenging higher energy regions. The authors have measured various samples to demonstrate the feasibility of the proposed engineering materials. This technique could potentially be useful for studying samples across a wide range of applications and disciplines. open access.Entities:
Keywords: X-ray phase imaging; hard X-rays; high-energy regions; porous materials; random attenuation masks; speckle technique
Year: 2018 PMID: 29979180 PMCID: PMC6038599 DOI: 10.1107/S1600577518005623
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1Methodology schematic and detailed structure of a RAM highlighting useful qualities. X-ray projection image of (a) abrasive paper, (b) steel wool and (c) Al–Cu alloy; the scale bars of these images are 1.0 mm long. Some pores are marked with yellow arrows in the speckle image (c). (d) Schematic representation of the experiment setup (not to scale). For each projection a stack of speckle images was recorded using an X-ray detector by scanning alloy transversely (along the x direction) to the X-ray beam. (e) Volume rendering of an X-ray tomographic image of the Al–Cu alloy (the black colour represents gas porosity), (f) porosity in the alloy. Here, the size of the tomographic image is 1695 µm × 918 µm × 2124 µm.
Figure 2Hard X-ray speckle technique applied to a sample of picrite (very low absorption contrast). (a) Transmission and (b) phase image demonstrating improved definition of olivine crystal, and surrounding matrix. The scale bar at the bottom of the image is 2.0 mm long. (c, d) Line profiles of the image at the positions indicated by the thin lines from (a) and (b).
Figure 3Comparison between imaging techniques using a rhyolite sample. (a) Phase-contrast image and (b, c) backscattered electron images. White scale bars are 1.0 mm.
Figure 4Hard X-ray speckle technique applied to the imaging of a chicken’s wing tip. (a) Horizontal and (b) vertical wavefront gradients, (c) phase contrast obtained with the speckle tracking technique. The scale bar at the top of image is 3.0 mm long.
Figure 5Speckle patterns produced with different RAMs, and the corresponding retrieved horizontal and vertical wavefront gradient images for a rhyolite sample. The scale bar is equal to 2 mm.
Figure 6Retrieved differential wavefront gradient, transmission and phase image of manmade amber by using a synchrotron radiation source. (a) Horizontal and (b) vertical differential wavefront gradient, (c) transmission and (d) reconstructed phase images of a beetle inside manmade amber. The scale bar is equal to 2 mm.