| Literature DB >> 29765044 |
L M Zheng1, X Renshaw Wang2, W M Lü3, C J Li4, T R Paudel5, Z Q Liu6, Z Huang7, S W Zeng7, Kun Han7, Z H Chen8,9,10, X P Qiu11, M S Li4, Shize Yang12, B Yang1, Matthew F Chisholm12, L W Martin8,9, S J Pennycook4, E Y Tsymbal5, J M D Coey13,14, W W Cao1,15.
Abstract
Complex-oxide materials exhibit physical properties that involve the interplay of charge and spin degrees of freedom. However, an ambipolar oxide that is able to exhibit both electron-doped and hole-doped ferromagnetism in the same material has proved elusive. Here we report ambipolar ferromagnetism in LaMnO3, with electron-hole asymmetry of the ferromagnetic order. Starting from an undoped atomically thin LaMnO3 film, we electrostatically dope the material with electrons or holes according to the polarity of a voltage applied across an ionic liquid gate. Magnetotransport characterization reveals that an increase of either electron-doping or hole-doping induced ferromagnetic order in this antiferromagnetic compound, and leads to an insulator-to-metal transition with colossal magnetoresistance showing electron-hole asymmetry. These findings are supported by density functional theory calculations, showing that strengthening of the inter-plane ferromagnetic exchange interaction is the origin of the ambipolar ferromagnetism. The result raises the prospect of exploiting ambipolar magnetic functionality in strongly correlated electron systems.Entities:
Year: 2018 PMID: 29765044 PMCID: PMC5953920 DOI: 10.1038/s41467-018-04233-5
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Schematic and structural characterization of the electric double-layer transistor. a Schematic of the device, fabricated by ultraviolet lithography. The exposed area of LaMnO3 is 300 µm in length and 50 µm in width. The scale bar is 100 µm. b Atomically flat surface of 3 unit cell (uc) LaMnO3 film grown on a SrTiO3 (001) substrate characterized by atomic force microscopy. The scale bar is 1 µm. c High-angle annular dark field (HAADF) image of the SrTiO3-capped sample. The scale bar is 2 nm. d EELS of the SrTiO3-capped sample. The corresponding EELS region is indicated in the green box in the HAADF image (c)
Fig. 2Transport properties of 3 uc LaMnO3 film at various gate voltages (VG) and temperatures. a The sheet resistance as a function of VG at 300 K. No loop is seen, indicating that effects of oxygen migration are negligible. b, c Hall resistivity (ρ) of LaMnO3 under of VG = −3 V (b) and 3 V (c) at different temperatures. temperatures. Due to the presence of high noise levels in ρ (300 K) for magnetic field above 3 Tesla, the high-field data of ρ at 300 K are omitted. d Hall carrier density expressed in electron or hole content per Mn site based on the Hall results at 2 K and various VG. The error bars at these VG were calculated based on the fluctuation of ρ within the ordinary Hall effect (OHE) region at 2 K
Fig. 3Metal–insulator transition (MIT) in ionic liquid-gated 3 uc LaMnO3. a, b The sheet resistance as a function of gate voltages. Both negative (a) and positive (b) voltage regimes show a MIT, accompanying the reduction of sheet resistance. c, d Temperature dependence of magnetoresistance in the hole-doped and electron-doped 3 uc LaMnO3 film
Fig. 4Electron–hole asymmetry in electrostatically gated LaMnO3. a Contour plot of sheet resistance (RS) as a function of gate voltage (VG) and temperature. b Evolution of the resistivity peak (TP) of RS in the electron-doped and hole-doped regimes. c Asymmetric peak magnitude and temperature of the magnetoresistance (MR), defined as (R(H)−R(0))/R(0)) (%), for an electron-doped or hole-doped LaMnO3 film. d First-principles calculations on the magnetism of LaMnO3 under bipolar gating. The exchange coupling parameter and J (open blue dots) and the distortion parameter b/b (filled red dots) are shown as a function of doping