| Literature DB >> 29755511 |
Xiaocong Zhang1,2, Yunying Dong3, Renlai Zhou1,4,5.
Abstract
Examination stress occurs so frequently in the lives of students. The neural mechanisms of attentional bias induced by examination stress in test-anxious individuals remain unclear. Accordingly, we investigated the attentional bias toward test-related threatening words in selected high and low test-anxious participants under the stress of final examinations by using an event-related potential (ERP) technique. A classic dot-probe paradigm was adopted with a test-related/test-unrelated threatening word and a neutral word pair as cues. Results showed attention bias and enhanced N200 amplitude toward test-related threat in high test-anxious individuals, whereas avoidance of test-related threat and decreased N200 amplitude were shown in low test-anxious individuals. Additionally, ERP data revealed the relatively enhanced LPP amplitude in low test-anxious participants compared with that in high test-anxious participants. No attentional bias toward test-unrelated threat was found. In conclusion, examination stress resulted in attentional bias and functional perturbations of a brain circuitry that reacted rapidly to test-related threat in high test-anxious individuals.Entities:
Mesh:
Year: 2018 PMID: 29755511 PMCID: PMC5884033 DOI: 10.1155/2018/3281040
Source DB: PubMed Journal: Neural Plast ISSN: 1687-5443 Impact factor: 3.599
Figure 1Example trial sequence in the dot-probe task.
Mean reaction times (in ms) in the dot-probe task for HTA and LTA participants (standard deviations in parentheses).
| Test-related threatening word | Test-unrelated threatening word | |||
|---|---|---|---|---|
| Incongruent | Congruent | Incongruent | Congruent | |
| HTA group ( | 621.13 (231.43) | 595.16 (208.05) | 602.03 (214.92) | 599.59 (215.09) |
| LTA group ( | 488.77 (150.79) | 509.32 (155.56) | 500.59 (153.32) | 500.96 (157.67) |
Bias scores in the dot-probe task for HTA and LTA participants.
| Test-related threatening word | Test-unrelated threatening word | |||
|---|---|---|---|---|
| Mean (SD) |
| Mean (SD) |
| |
| HTA group ( | 12.98 (19.02) | 3.20∗ | 1.22 (16.83) | .34 |
| LTA group ( | −10.27 (12.70) | −3.88∗ | −.18 (13.59) | −.07 |
aResults from a one-sample t-test between bias scores and zero (∗p < .05).
Figure 2Bias scores to test-related (TR) and test-unrelated (TU) threat for HTA and LTA participants.
Figure 3Grand-averaged ERPs evoked by probes in the incongruent test-unrelated (TU) condition and test-related (TR) condition at the P7 electrode site for HTA and LTA participants.
Figure 4Grand-averaged late positive potential (LPP) evoked by probes at the POz electrode site for HTA (red) and LTA (blue) participants.