| Literature DB >> 29735999 |
Min Guo1, Panagiotis Chandris2, John Paul Giannini2,3, Adam J Trexler4,5, Robert Fischer4, Jiji Chen6, Harshad D Vishwasrao6, Ivan Rey-Suarez2,3, Yicong Wu2, Xufeng Wu4, Clare M Waterman4, George H Patterson7, Arpita Upadhyaya8, Justin W Taraska4, Hari Shroff2,6,8.
Abstract
We combined instant structured illumination microscopy (iSIM) with total internal reflection fluorescence microscopy (TIRFM) in an approach referred to as instant TIRF-SIM, thereby improving the lateral spatial resolution of TIRFM to 115 ± 13 nm without compromising speed, and enabling imaging frame rates up to 100 Hz over hundreds of time points. We applied instant TIRF-SIM to multiple live samples and achieved rapid, high-contrast super-resolution imaging close to the coverslip surface.Entities:
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Year: 2018 PMID: 29735999 PMCID: PMC7470603 DOI: 10.1038/s41592-018-0004-4
Source DB: PubMed Journal: Nat Methods ISSN: 1548-7091 Impact factor: 28.547