| Literature DB >> 29732273 |
Andrey Goryachev1, Lu Gao1, Yue Zhang1, Roderigh Y Rohling1, René H J Vervuurt2, Ageeth A Bol2, Jan P Hofmann1, Emiel J M Hensen1.
Abstract
Cobalt phosphides are an emerging earth-abundant alternative to platinum-group-metal-based electrocatalysts for the hydrogen evolution reaction (HER). Yet, their stability is inferior to platinum and compromises the large-scale applicability of CoP x in water electrolyzers. In the present study, we employed flat, thin CoP x electrodes prepared through the thermal phosphidation (PH3) of Co3O4 films made by plasma-enhanced atomic layer deposition to evaluate their stability in acidic water electrolysis by using a multi-technique approach. The films were found to be composed of two phases: CoP in the bulk and a P-rich surface CoP x (P/Co>1). Their performance was evaluated in the HER and the exchange current density was determined to be j0=-8.9 ⋅ 10-5 A/cm2. The apparent activation energy of HER on CoP x (Ea=81±15 kJ/mol) was determined for the first time. Dissolution of the material in 0.5 M H2SO4 was observed, regardless of the constantly applied cathodic potential, pointing towards a chemical instead of an electrochemical origin of the observed cathodic instability. The current density and HER faradaic efficiency (FE) were found to be stable during chronoamperometric treatment, as the chemical composition of the HER-active phase remained unchanged. On the contrary, a dynamic potential change performed in a repeated way facilitated dissolution of the film, yielding its complete degradation within 5 h. There, the FE was also found to be changing. An oxidative route of CoP x dissolution has also been proposed.Entities:
Keywords: OLEMS/DEMS; cobalt phosphide; hydrogen evolution reaction; model electrodes; stability
Year: 2018 PMID: 29732273 PMCID: PMC5915747 DOI: 10.1002/celc.201701119
Source DB: PubMed Journal: ChemElectroChem ISSN: 2196-0216 Impact factor: 4.590
Figure 1a) Atomic force and b) scanning electron micrographs of fresh CoP.
Figure 2a) Co 2p and b) P 2p XP spectra of CoP electrodes prepared at different phosphidation temperatures.
P to Co ratio derived from Co 2p and P 2p XPS analysis.
| P/Co ratios from XPS | Overall P content | Pδ− content |
|---|---|---|
|
| 4.1 | 3.0 |
|
| 3.9 | 3.2 |
|
| 4.0 | 2.9 |
| average ratio | 4.0±0.1 | 3.0±0.1 |
Figure 3a) XPS depth profile of fresh CoP; b) Raman spectra (λ=632.8 nm) of as‐prepared Co3O4 (black) and thermal CoP (red) films, L marks impurity lines of the HeNe laser.
Figure 4T‐dependent Tafel plots and b) corresponding Arrhenius plot of HER conducted on CoP in 0.5 M H2SO4 with intermittent cathodic protection.
Figure 5a) Chronoamperograms of HER at constant potential (E HER=−0.12 V); b) J‐t profile of rLSV‐treated CoP cathode where J values were sampled from the corresponding voltammograms at E HER=−0.12 V.
Figure 6a) Co 2p and b) P 2p XP spectra of CoP electrodes subjected to rLSV and CA treatments.
Figure 7a) XPS depth profile of CA‐treated CoP and b) Raman spectra of CoP cathodes subjected to rLSV (red) and CA (black) treatments, where L marks peaks of the laser impurities.
Figure 8Faradaic efficiency of CoP in 0.5 M H2SO4 (charge vs. H2 + ion current) under a) consecutive HER and b) HER with intermittent CVs.