| Literature DB >> 29636534 |
Lauren M Otto1,2, D Frank Ogletree3, Shaul Aloni3, Matteo Staffaroni2, Barry C Stipe2, Aeron T Hammack4,5.
Abstract
We report visualizations of the bidirectional near-field optical transfer function for a waveguide-coupled plasmonic transducer as a metrology technique essential for successful development for mass-fabricated near-field devices. Plasmonic devices have revolutionized the observation of nanoscale phenomena, enabling optical excitation and readout from nanoscale regions of fabricated devices instead of as limited by optical diffraction. Visualizations of the plasmonic transducer modes were acquired both by local near-field excitation of the antenna on the front facet of a waveguide using the focused electron beam of a scanning electron microscope as a probe of the near-field cathodoluminescence during far-field collection from the back facet of the waveguide, and by local mapping of the optical near-field for the same antenna design using scattering scanning near-field optical microscopy as a probe of the near-field optical mode density for far-field light focused into the back facet of the waveguide. Strong agreement between both measurement types and numerical modeling was observed, indicating that the method enables crucial metrological comparisons of as fabricated device performance to as-modeled device expectations for heat-assisted magnetic recording heads, which can be extended to successful development of future near-field-on-chip devices such as optical processor interconnects.Entities:
Year: 2018 PMID: 29636534 PMCID: PMC5893547 DOI: 10.1038/s41598-018-24061-3
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Schematics for bidirectional near-field characterization. (a) A side cross-sectional profile of a heat-assisted magnetic recording head (LD: laser diode, ABS: air-bearing surface), which incorporates a (b) waveguide-coupled plasmonic antenna surrounded by the standard magnetic write pole and coils. Bidirectional near-field characterization was performed using (c) scanning electron microscopy cathodoluminescence and (d) scattering scanning near-field optical microscopy. In c, the electrons in the near-field excite resonances in the antenna, which are coupled into the waveguide and collected in the far-field using a fiber. In (d) far-field laser light is focused into the head’s waveguide using the microscope’s objective, and the light is waveguide coupled into the plasmonic antenna whose near-field is probed using an AFM tip that scatters near-field light into the far-field where it is collected by another objective.
Figure 2Cathodoluminescence analysis as performed inside a scanning electron microscope. (a–c) Full field intensity maps were collected over the antenna region for discrete and narrow (20 nm) wavelength windows revealing the spatial location of the resonances on the air-bearing surface. (Additional maps for other wavelengths can be found in the Supporting Information.) E-antenna notch width ~50 nm. Based on these maps, (d) three distinct and different points on the air-bearing surface surrounding the plasmonic antenna were chosen and (e) full measured spectra (solid lines) were compared with modeling (dashed lines).
Figure 3Scattering scanning near-field optical microscopy images of HAMR heads as a function of wavelength and polarization. Near-field maps for the 1ω0 and 6ω0 with both (a) 830 nm and (b) 633 nm wavelengths as well as polarizations ranging from −90° deg (perp, TE) to 0° (para TM) to +90° (perp, TE). All maps are 400 nm × 400 nm. The intensity maxima from all maps were extracted and plotted against the expected cos2(θ) intensity decay curve for both (c) 830 nm light and (d) 633 nm light. The full data set ranged from −100° to 100° in increments of 10° and covered six harmonics for both wavelengths. The AFM color scale ranges from −3.8 to +1.6 nm, and the map is 400 nm × 400 nm. Additional images can be found in the Supporting Information.