Literature DB >> 29624404

Stable Defects in Semiconductor Nanowires.

A M Sanchez1, J A Gott1, H A Fonseka1, Y Zhang2, H Liu2, R Beanland1.   

Abstract

Semiconductor nanowires are commonly described as being defect-free due to their ability to expel mobile defects with long-range strain fields. Here, we describe previously undiscovered topologically protected line defects with null Burgers vector that, unlike dislocations, are stable in nanoscale crystals. We analyze the defects present in semiconductor nanowires in regions of imperfect crystal growth, i.e., at the nanowire tip formed during consumption of the droplet in self-catalyzed vapor-liquid-solid growth and subsequent vapor-solid shell growth. We use a form of the Burgers circuit method that can be applied to multiply twinned material without difficulty. Our observations show that the nanowire microstructure is very different from bulk material, with line defects either (a) trapped by locks or other defects, (b) arranged as dipoles or groups with a zero total Burgers vector, or (c) have a zero Burgers vector. We find two new line defects with a null Burgers vector, formed from the combination of partial dislocations in twinned material. The most common defect is the three-monolayer high twin facet with a zero Burgers vector. Studies of individual nanowires using cathodoluminescence show that optical emission is quenched in defective regions, showing that they act as strong nonradiative recombination centers.

Entities:  

Keywords:  CL; Nanowire; STEM; defects

Year:  2018        PMID: 29624404     DOI: 10.1021/acs.nanolett.8b00620

Source DB:  PubMed          Journal:  Nano Lett        ISSN: 1530-6984            Impact factor:   11.189


  1 in total

1.  Highly Strained III-V-V Coaxial Nanowire Quantum Wells with Strong Carrier Confinement.

Authors:  Yunyan Zhang; George Davis; H Aruni Fonseka; Anton Velichko; Anders Gustafsson; Tillmann Godde; Dhruv Saxena; Martin Aagesen; Patrick W Parkinson; James A Gott; Suguo Huo; Ana M Sanchez; David J Mowbray; Huiyun Liu
Journal:  ACS Nano       Date:  2019-05-09       Impact factor: 15.881

  1 in total

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