| Literature DB >> 29338197 |
Yee-Fun Lim1, Kumar Priyadarshi1,2, Fabio Bussolotti1, Pranjal Kumar Gogoi3, Xiaoyang Cui1, Ming Yang1, Jisheng Pan1, Shi Wun Tong1, Shijie Wang1, Stephen J Pennycook4, Kuan Eng Johnson Goh1,3, Andrew T S Wee3, Swee Liang Wong1,3, Dongzhi Chi1.
Abstract
Single-layer molybdenum disulfide (MoS2) has attracted significant attention due to its electronic and physical properties, with much effort invested toward obtaining large-area high-quality monolayer MoS2 films. In this work, we demonstrate a reactive-barrier-based approach to achieve growth of highly homogeneous single-layer MoS2 on sapphire by the use of a nickel oxide foam barrier during chemical vapor deposition. Due to the reactivity of the NiO barrier with MoO3, the concentration of precursors reaching the substrate and thus nucleation density is effectively reduced, allowing grain sizes of up to 170 μm and continuous monolayers on the centimeter length scale being obtained. The quality of the monolayer is further revealed by angle-resolved photoemission spectroscopy measurement by observation of a very well resolved electronic band structure and spin-orbit splitting of the bands at room temperature with only two major domain orientations, indicating the successful growth of a highly crystalline and well-oriented MoS2 monolayer.Entities:
Keywords: Raman spectroscopy; angle-resolved photoemission spectroscopy; chemical vapor deposition; electronic transport measurement; molybdenum disulfide
Year: 2018 PMID: 29338197 DOI: 10.1021/acsnano.7b07682
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881