| Literature DB >> 29219519 |
Shaoxiang Sheng1, Jiang-Bin Wu2, Xin Cong2, Wenbin Li1, Jian Gou1, Qing Zhong1, Peng Cheng1, Ping-Heng Tan2,3, Lan Chen1, Kehui Wu1,3,4.
Abstract
Combining ultrahigh sensitivity, spatial resolution, and the capability to resolve chemical information, tip-enhanced Raman spectroscopy (TERS) is a powerful tool to study molecules or nanoscale objects. Here we show that TERS can also be a powerful tool in studying two-dimensional materials. We have achieved a 10^{9} Raman signal enhancement and a 0.5 nm spatial resolution using monolayer silicene on Ag(111) as a prototypical 2D material system. Because of the selective enhancement on Raman modes with vertical vibrational components in TERS, our experiment provides direct evidence of the origination of Raman modes in silicene. Furthermore, the ultrahigh sensitivity of TERS allows us to identify different vibrational properties of silicene phases, which differ only in the bucking direction of the Si-Si bonds. Local vibrational features from defects and domain boundaries in silicene can also be identified.Entities:
Year: 2017 PMID: 29219519 DOI: 10.1103/PhysRevLett.119.196803
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161