| Literature DB >> 29215600 |
Zonghua Zhang1,2, Yuemin Wang3, Shujun Huang4, Yue Liu5, Caixia Chang6, Feng Gao7, Xiangqian Jiang8.
Abstract
The fast development in the fields of integrated circuits, photovoltaics, the automobile industry, advanced manufacturing, and astronomy have led to the importance and necessity of quickly and accurately obtaining three-dimensional (3D) shape data of specular surfaces for quality control and function evaluation. Owing to the advantages of a large dynamic range, non-contact operation, full-field and fast acquisition, high accuracy, and automatic data processing, phase-measuring deflectometry (PMD, also called fringe reflection profilometry) has been widely studied and applied in many fields. Phase information coded in the reflected fringe patterns relates to the local slope and height of the measured specular objects. The 3D shape is obtained by integrating the local gradient data or directly calculating the depth data from the phase information. We present a review of the relevant techniques regarding classical PMD. The improved PMD technique is then used to measure specular objects having discontinuous and/or isolated surfaces. Some influential factors on the measured results are presented. The challenges and future research directions are discussed to further advance PMD techniques. Finally, the application fields of PMD are briefly introduced.Entities:
Keywords: 3D calibration; 3D shape measurement; phase calculation; phase-measuring deflectometry; slope integration; specular objects
Year: 2017 PMID: 29215600 PMCID: PMC5750795 DOI: 10.3390/s17122835
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Flowchart of 3D shape measurement of specular objects by using classical PMD.
Figure 2Principle of classical PMD to measure specular objects.
Figure 3Orthogonal fringe pattern sets. (a) Horizontal direction and (b) vertical direction.
Figure 4One crossed fringe pattern containing two orthogonal fringe patterns.
Figure 5One color composite fringe pattern containing three fringe patterns.
Comparison of three fringe reflection methods.
| Orthogonal Fringe | Crossed Fringe | Color Fringe | |
|---|---|---|---|
| Time | Long | Short | Shortest |
| Accuracy | High | Median | Low |
| Resolution | High | Median | High |
Comparison of three integration methods.
| RBF-Based | Least-Squares | Transform-Based | |
|---|---|---|---|
| Speed | Slow | Fast for small size | Fast |
| Accuracy | High (sub-micrometer) | High (sub-micrometer) | Median (micrometer) |
| Memory | Huge for large size | Small | Large |
Figure 6Measurement example of DPMD. (a) Principle of DPMD. (b) Hardware of the experimental setup. (c) Monolithic multi-mirror array on the MIRI spectrometer optics for the James Webb Space Telescope. (d) Measured depth.