Literature DB >> 24979436

Development of a portable deflectometry system for high spatial resolution surface measurements.

Alejandro V Maldonado, Peng Su, James H Burge.   

Abstract

The Slope-Measuring Portable Optical Test System (SPOTS) is a new, portable, high-resolution, deflectometry device that achieves mid to high (20 to 1000 cyc/m) spatial frequency optical surface metrology with very little filtering and very little noise. Using a proof of concept system, we achieved 1 nm RMS surface accuracy for mid to high spatial frequencies, and 300 nrad RMS slope precision. SPOTS offers a turnkey solution for measuring errors on a wide variety of optical surfaces including the large mirrors fabricated at The University of Arizona. This paper defines and discusses SPOTS, including the principles of operation, measurement modes, design, performance, error analysis, and experimental results.

Year:  2014        PMID: 24979436     DOI: 10.1364/AO.53.004023

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  2 in total

1.  Structured illumination assisted microdeflectometry with optical depth scanning capability.

Authors:  Sheng-Huei Lu; Hong Hua
Journal:  Opt Lett       Date:  2016-09-01       Impact factor: 3.776

Review 2.  Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry.

Authors:  Zonghua Zhang; Yuemin Wang; Shujun Huang; Yue Liu; Caixia Chang; Feng Gao; Xiangqian Jiang
Journal:  Sensors (Basel)       Date:  2017-12-07       Impact factor: 3.576

  2 in total

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