| Literature DB >> 29191004 |
Bing Deng1, Zhenqian Pang2, Shulin Chen3,4, Xin Li5,6, Caixia Meng7, Jiayu Li8,9, Mengxi Liu5, Juanxia Wu1, Yue Qi1,9, Wenhui Dang1, Hao Yang1,9, Yanfeng Zhang1, Jin Zhang1, Ning Kang8, Hongqi Xu8, Qiang Fu7, Xiaohui Qiu5, Peng Gao3,10, Yujie Wei2, Zhongfan Liu1,11, Hailin Peng1,11.
Abstract
Wrinkles are ubiquitous for graphene films grown on various substrates by chemical vapor deposition at high temperature due to the strain induced by thermal mismatch between the graphene and substrates, which greatly degrades the extraordinary properties of graphene. Here we show that the wrinkle formation of graphene grown on Cu substrates is strongly dependent on the crystallographic orientations. Wrinkle-free single-crystal graphene was grown on a wafer-scale twin-boundary-free single-crystal Cu(111) thin film fabricated on sapphire substrate through strain engineering. The wrinkle-free feature of graphene originated from the relatively small thermal expansion of the Cu(111) thin film substrate and the relatively strong interfacial coupling between Cu(111) and graphene, based on the strain analyses as well as molecular dynamics simulations. Moreover, we demonstrated the transfer of an ultraflat graphene film onto target substrates from the reusable single-crystal Cu(111)/sapphire growth substrate. The wrinkle-free graphene shows enhanced electrical mobility compared to graphene with wrinkles.Entities:
Keywords: graphene wrinkle; single crystal; strain engineering; thermal mismatch; ultraflat
Year: 2017 PMID: 29191004 DOI: 10.1021/acsnano.7b06196
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881