| Literature DB >> 29094392 |
Nicholas R Glavin1, Kelson D Chabak2, Eric R Heller1, Elizabeth A Moore1,3, Timothy A Prusnick2,3, Benji Maruyama1, Dennis E Walker2, Donald L Dorsey1, Qing Paduano2, Michael Snure2.
Abstract
Flexible gallium nitride (GaN) thin films can enable future strainable and conformal devices for transmission of radio-frequency (RF) signals over large distances for more efficient wireless communication. For the first time, strainable high-frequency RF GaN devices are demonstrated, whose exceptional performance is enabled by epitaxial growth on 2D boron nitride for chemical-free transfer to a soft, flexible substrate. The AlGaN/GaN heterostructures transferred to flexible substrates are uniaxially strained up to 0.85% and reveal near state-of-the-art values for electrical performance, with electron mobility exceeding 2000 cm2 V-1 s-1 and sheet carrier density above 1.07 × 1013 cm-2 . The influence of strain on the RF performance of flexible GaN high-electron-mobility transistor (HEMT) devices is evaluated, demonstrating cutoff frequencies and maximum oscillation frequencies greater than 42 and 74 GHz, respectively, at up to 0.43% strain, representing a significant advancement toward conformal, highly integrated electronic materials for RF applications.Entities:
Keywords: flexible GaN; flexible RF electronics; gallium nitride
Year: 2017 PMID: 29094392 DOI: 10.1002/adma.201701838
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849