| Literature DB >> 28960515 |
Zhinan Guo1,2, Si Chen2, Zhongzheng Wang1,3, Zhenyu Yang3, Fei Liu4, Yanhua Xu2, Jiahong Wang1, Ya Yi1, Han Zhang2, Lei Liao3, Paul K Chu5, Xue-Feng Yu1.
Abstract
Black phosphorus (BP), a burgeoning elemental 2D semiconductor, has aroused increasing scientific and technological interest, especially as a channel material in field-effect transistors (FETs). However, the intrinsic instability of BP causes practical concern and the transistor performance must also be improved. Here, the use of metal-ion modification to enhance both the stability and transistor performance of BP sheets is described. Ag+ spontaneously adsorbed on the BP surface via cation-π interactions passivates the lone-pair electrons of P thereby rendering BP more stable in air. Consequently, the Ag+ -modified BP FET shows greatly enhanced hole mobility from 796 to 1666 cm2 V-1 s-1 and ON/OFF ratio from 5.9 × 104 to 2.6 × 106 . The mechanisms pertaining to the enhanced stability and transistor performance are discussed and the strategy can be extended to other metal ions such as Fe3+ , Mg2+ , and Hg2+ . Such stable and high-performance BP transistors are crucial to electronic and optoelectronic devices. The stability and semiconducting properties of BP sheets can be enhanced tremendously by this novel strategy.Entities:
Keywords: 2D materials; Raman; black phosphorus; transistors
Year: 2017 PMID: 28960515 DOI: 10.1002/adma.201703811
Source DB: PubMed Journal: Adv Mater ISSN: 0935-9648 Impact factor: 30.849