| Literature DB >> 28773237 |
Amar Prasad Gupta1,2, Sangjun Park3, Seung Jun Yeo4,5, Jaeik Jung6, Chonggil Cho7, Sang Hyun Paik8, Hunkuk Park9, Young Chul Cho10, Seung Hoon Kim11, Ji Hoon Shin12, Jeung Sun Ahn13, Jehwang Ryu14,15.
Abstract
We report the design, fabrication and characterization of a carbon nanotube enabled open-type X-ray system for medical imaging. We directly grew the carbon nanotubes used as electron emitter for electron gun on a non-polished raw metallic rectangular-rounded substrate with an area of 0.1377 cm² through a plasma enhanced chemical vapor deposition system. The stable field emission properties with triode electrodes after electrical aging treatment showed an anode emission current of 0.63 mA at a gate field of 7.51 V/μm. The 4.5-inch cubic shape open type X-ray system was developed consisting of an X-ray aperture, a vacuum part, an anode high voltage part, and a field emission electron gun including three electrodes with focusing, gate and cathode electrodes. Using this system, we obtained high-resolution X-ray images accelerated at 42-70 kV voltage by digital switching control between emitter and ground electrode.Entities:
Keywords: carbon nanotube; field emission; open-type X-ray system
Year: 2017 PMID: 28773237 PMCID: PMC5578244 DOI: 10.3390/ma10080878
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Process flow of (a,b) growth of carbon nanotubes (CNTs) emitter on metal substrate and (c) electrical aging treatment.
Figure 2Photo image of (a) the open-type X-ray system and (b) schematic of triode configuration during FE test and inside the X-ray system (c) optical image of electron gun and (c) cross-sectional 3D design of electron gun.
Figure 3SEM images of the CNT forest at (a) 10.0 k and (b) 20.0 k magnification.
Figure 4Field emission characteristic of CNT-emitter (a) during the electrical aging treatment; inset is the semi log plot of cathode current at 50th cycle (b) after the aging treatment; inset is the semi log plot of cathode current at 100th cycle and (c) at the last 100th cycle; inset is the Fowler Nordhiem (FN) plot.
Statistical analysis of field emission with cycles.
| Voltage (V) | Electric Field (V/µm) | Cycle (1st–50th) | Cycle (51th–100th) | ||||
|---|---|---|---|---|---|---|---|
| Average (µA) | S.D. * (µA) | R.S.D. * (%) | Average (µA) | S.D. * (µA) | R.S.D. * (%) | ||
| 2000 | 5.4 | 17.61 | 5.10 | 28.94 | 19.06 | 2.57 | 13.48 |
| 2400 | 6.5 | 128.85 | 18.86 | 14.63 | 125.40 | 6.60 | 5.26 |
| 2800 | 7.6 | 511.46 | 93.15 | 18.21 | 562.26 | 48.98 | 8.71 |
* S.D.: Standard Deviation. * R.S.D.: Relative Standard Deviation.
Figure 5(a–o) X-ray images and (p) the optical image of computer mouse with accelerated energies 42–70 kV.
Figure 6(a) Optical image and (b) X-ray image of printed circuit board taken at 45 kV/0.3 mA.
Figure 7X-ray image of an alive rat taken at 55 kV/0.3 mA.