| Literature DB >> 28772532 |
Charlotte Skjöldebrand1, Susann Schmidt2, Vicky Vuong3, Maria Pettersson4, Kathryn Grandfield5, Hans Högberg6, Håkan Engqvist7, Cecilia Persson8.
Abstract
Silicon nitride (Entities:
Keywords: X-ray photoelectron spectroscopy (XPS); Young’s modulus, transmission electron microscopy (TEM); coating; hardness; hip joint replacement; nanoindentation; silicon nitride
Year: 2017 PMID: 28772532 PMCID: PMC5459168 DOI: 10.3390/ma10020173
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Heating power, resulting substrate temperature, nitrogen-to-argon flow ratio (ƒN), growth rate and thickness as well as resulting composition (as determined by XPS) for the different processes.
| Process No. | Heating (kW) | Growth Rate (nm/s) | Coating Thickness (µm) | Si (at.%) | N (at.%) | O (at.%) | ||
|---|---|---|---|---|---|---|---|---|
| 1 | 1 | 200 | 0.06 | 0.50 | 7.5 | 71.7 | 22.8 | 1.8 |
| 2 | 1 | 200 | 0.17 | 0.40 | 7.3 | 54.6 | 39.2 | 3.6 |
| 3 | 1 | 200 | 0.30 | 0.34 | 7.1 | 45.6 | 48.0 | 5.0 |
| 4 | 3 | 350 | 0.17 | 0.42 | 7.6 | 54.4 | 40.9 | 2.0 |
| 5 | 3 | 350 | 0.30 | 0.35 | 7.4 | 45.2 | 47.5 | 5.8 |
| 6 | 5 | 430 | 0.30 | 0.40 | 7.3 | 53.9 | 41.3 | 2.1 |
Figure 1(a–c) XPS Si2p core-level spectra acquired from coatings deposited using (a) process 1; (b) process 2 (same behavior seen for processes 4 and 6); and (c) process 3 (same behavior seen for process 5). The core-level spectra were acquired on as-deposited samples, without additional Ar+ cleaning.
Figure 2(a–f) Representative SEM cross-sections of coatings deposited onto Si(001) by (a) process 1; (b) process 2; (c) process 3; (d) process 4; (e) process 5; and (f) process 6. The Si(001)/SiN interfaces are indicated.
Figure 3Diffraction patterns from process 1 (a); process 2 (b) and process 3 (c).
Figure 4VSI images illustrating the surface for coatings for processes 1–6, the numbers in the figure refer to the process number. The corresponding R parameters are found in Table 2.
Figure 5Nano-hardness (a) and Young’s modulus (b) values as a function of substrate temperature and nitrogen flow ratio. The process numbers are indicated in the graph. Groups that gave significantly different results have been given different letters (*, ** and ***).
Surface roughness, hardness, Young’s modulus, N/Si ratio and H/E ratio for processes 1–6 and the CoCrMo reference.
| Process No./CoCrMo Reference | N/Si Ratio | ||||||
|---|---|---|---|---|---|---|---|
| 1 | 0.32 | 12.5 ± 2.2 | 330 | 1430 | 12.1 ± 0.8 | 172.7 ± 7.5 | 0.070 |
| 2 | 0.72 | 10.8 ± 1.8 | 377 | 1460 | 17.9 ± 1.3 | 239.1 ± 12.6 | 0.075 |
| 3 | 1.05 | 12.5 ± 3.7 | 461 | 2180 | 23.7 ± 3.0 | 292.6 ± 18.1 | 0.081 |
| 4 | 0.75 | 11.4 ± 1.8 | 365 | 1750 | 18.7 ± 1.2 | 226.1 ± 9.1 | 0.083 |
| 5 | 1.05 | 15.1 ± 2.7 | 1272 | 4710 | 25.9 ± 2.1 | 285.5 ± 20.1 | 0.091 |
| 6 | 0.76 | 12.8 ± 4.5 | 964 | 3800 | 19.6 ± 2.0 | 222.0 ± 13.3 | 0.088 |
| CoCrMo | - | 10.7 ± 1.8 | 282 | 870 | 6.2 ± 0.4 | 293.1 ± 17.7 | 0.021 |