| Literature DB >> 28770607 |
Jungseok Chae1,2, Sangmin An1,2, Georg Ramer1,2, Vitalie Stavila3, Glenn Holland1, Yohan Yoon1,2, A Alec Talin3, Mark Allendorf3, Vladimir A Aksyuk1, Andrea Centrone1.
Abstract
The atomic force microscope (AFM) offers a rich observation window on the nanoscale, yet many dynamic phenomena are too fast and too weak for direct AFM detection. Integrated cavity-optomechanics is revolutionizing micromechanical sensing; however, it has not yet impacted AFM. Here, we make a groundbreaking advance by fabricating picogram-scale probes integrated with photonic resonators to realize functional AFM detection that achieve high temporal resolution (<10 ns) and picometer vertical displacement uncertainty simultaneously. The ability to capture fast events with high precision is leveraged to measure the thermal conductivity (η), for the first time, concurrently with chemical composition at the nanoscale in photothermal induced resonance experiments. The intrinsic η of metal-organic-framework individual microcrystals, not measurable by macroscale techniques, is obtained with a small measurement uncertainty (8%). The improved sensitivity (50×) increases the measurement throughput 2500-fold and enables chemical composition measurement of molecular monolayer-thin samples. Our paradigm-shifting photonic readout for small probes breaks the common trade-off between AFM measurement precision and ability to capture transient events, thus transforming the ability to observe nanoscale dynamics in materials.Entities:
Keywords: AFM; Optomechanical resonators; PTIR; chemical composition; nanoscale dynamics; thermal conductivity
Year: 2017 PMID: 28770607 PMCID: PMC5685553 DOI: 10.1021/acs.nanolett.7b02404
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189