| Literature DB >> 28760975 |
Won-Kyu Lee1, Shuangcheng Yu2, Clifford J Engel3, Thaddeus Reese1, Dongjoon Rhee1, Wei Chen4, Teri W Odom5,3.
Abstract
Nanostructured surfaces with quasi-random geometries can manipulate light over broadband wavelengths and wide ranges of angles. Optimization and realization of stochastic patterns have typically relied on serial, direct-write fabrication methods combined with real-space design. However, this approach is not suitable for customizable features or scalable nanomanufacturing. Moreover, trial-and-error processing cannot guarantee fabrication feasibility because processing-structure relations are not included in conventional designs. Here, we report wrinkle lithography integrated with concurrent design to produce quasi-random nanostructures in amorphous silicon at wafer scales that achieved over 160% light absorption enhancement from 800 to 1,200 nm. The quasi-periodicity of patterns, materials filling ratio, and feature depths could be independently controlled. We statistically represented the quasi-random patterns by Fourier spectral density functions (SDFs) that could bridge the processing-structure and structure-performance relations. Iterative search of the optimal structure via the SDF representation enabled concurrent design of nanostructures and processing.Entities:
Keywords: light trapping; pattern transfer; silicon photonics; spectral density function; wrinkles
Year: 2017 PMID: 28760975 PMCID: PMC5565438 DOI: 10.1073/pnas.1704711114
Source DB: PubMed Journal: Proc Natl Acad Sci U S A ISSN: 0027-8424 Impact factor: 11.205