| Literature DB >> 28706235 |
Xiaoyu Shi1, Qing Chang1, Junhua Tong1, Yunjie Feng1, Zhaona Wang2, Dahe Liu3.
Abstract
The working threshold is an important parameter to assess the performance of cavity-free random lasers. Here, the temporal profile measurement is proposed as an alternative method to determine the thresholds of the surface plasmon based random lasers pumped by ns pulses based on analyzing the delay time (t Delay) and rising time (t R) of the emission signal. The obvious and slight inflection points of the curves of t Delay and t R varying with the pump power density are observed as indicators for the thresholds of random lasing and for the transition of lasing mode, respectively. The proposed method supplies consistent values to those supplied by traditional methods in frequency-domain for the random systems with different gain length. The demonstrated temporal profile approaches are free from the spectrometers and may be as a candidate for measuring the threshold of random lasers in ultrafast optics, nonlinear optics and bio-compatible optoelectronic probes.Entities:
Year: 2017 PMID: 28706235 PMCID: PMC5509694 DOI: 10.1038/s41598-017-05513-8
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Working mechanism of temporal profile based threshold measurement. Photo-physics processes in a simplified energy level diagram of an organic molecule R6G (left panel) and pictorial representation of the fluorescence intensity with time (right panel). The full lines represent the electronic states whereas the thin lines represent the vibrational states.
Figure 2Experimental configuration. (a) The scanning electron microscope (SEM) image of Ag NWs. (b) The experimental setup. The Nd:YAG ns pulses with a wavelength of 532 nm are reflected by a prism, and then normally pump the random systems in a beaker. The frequency-domain emission spectra are recorded by using an optical fiber spectrometer. Simultaneously, the temporal profile signal is recorded by a fast-response photoelectric detector and displayed by an oscilloscope. (c) The screen picture of the temporal profile spectrum of RL emissions from an oscilloscope and the diagram defining the delay time relative to the pumping pulse and rise time.
Figure 3Transition in spectral and temporal features of emission. (a,b) The frequency-domain spectrum (a) and the temporal profile signal (b) from the Ag-nanowire-based dual-regime RL with R6G in a concentration of C R6G = 2.1 mM under different pump power densities of 0.14 MW/cm2 (black line), 1.63 MW/cm2 (red line), 8.76 MW/cm2 (blue line), and 18.75 MW/cm2 (olive line). (c) Variation of delay time (bottom) and rise time (top) with pump power density. Four colored data points coordinate with the selected data in a and b while other points are gray. (d) The intensity and bandwidth of emission at 573.99 nm change with the pump power density.
Figure 4Threshold features of delay time and rise time in different random systems. Plots are the results from three systems, S2, S3, and S4, with varying C R6G concentrations of 0.1 mM, 10.4 mM, and 18.8 mM, respectively. (a,d,g) The variation of delay time (bottom) and rise time (top) versus pump power density of S2 (a), S3 (d), and S4 (g); (b,e,h) The variation of intensity and linewidth versus pump power density of S2 (b), S3 (e), and S4 (h); (c,f,i) The normalized frequency domain spectrum of S2 (c), S3 (f), and S4 (i).
The threshold of these four random systems (S1, S2, S3, and S4), measured by the temporal profile method (new) and frequency domain method (traditional), respectively.
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|
| |
|---|---|---|
| New | Traditional | |
|
| 0.95 | 0.98 |
|
| 1.36 | 1.47 |
|
| 2.71 | 2.83 |
|
| 1.61 | 1.94 |