Literature DB >> 28500917

Using rapid-scan EPR to improve the detection limit of quantitative EPR by more than one order of magnitude.

J Möser1, K Lips2, M Tseytlin3, G R Eaton4, S S Eaton4, A Schnegg5.   

Abstract

X-band rapid-scan EPR was implemented on a commercially available Bruker ELEXSYS E580 spectrometer. Room temperature rapid-scan and continuous-wave EPR spectra were recorded for amorphous silicon powder samples. By comparing the resulting signal intensities the feasibility of performing quantitative rapid-scan EPR is demonstrated. For different hydrogenated amorphous silicon samples, rapid-scan EPR results in signal-to-noise improvements by factors between 10 and 50. Rapid-scan EPR is thus capable of improving the detection limit of quantitative EPR by at least one order of magnitude. In addition, we provide a recipe for setting up and calibrating a conventional pulsed and continuous-wave EPR spectrometer for rapid-scan EPR.
Copyright © 2017 Elsevier Inc. All rights reserved.

Entities:  

Keywords:  Amorphous silicon; Quantitative EPR; Rapid-scan EPR; Sensitivity

Mesh：

Substances：

Year:  2017        PMID： 28500917      PMCID： PMC5556260          DOI： 10.1016/j.jmr.2017.04.003

Source DB:  PubMed          Journal:  J Magn Reson        ISSN： 1090-7807            Impact factor:   2.229


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