| Literature DB >> 28496309 |
Mehmet Sinan Dogan1, Mehmet Cihan Yavas2, Yasemin Yavuz3, Sait Erdogan4, İsmail Yener4, İbrahim Simsek1, Zeki Akkus5, Veysel Eratilla6, Abdulsamet Tanik7, Mehmet Zulkuf Akdag2.
Abstract
The purpose of this study was to examine the possible effect of extremely low-frequency electromagnetic fields (ELF-EMFs), from a high-voltage source, on rat teeth in terms of changes in trace elements (TEs) and the effect of antioxidants (melatonin [MLT] and Ganoderma lucidum [GL]) in counteracting these effects. We used adult male Wistar albino rats with a mean weight of 250-300 g and divided the rats into eight groups. The groups were subjected to an ELF-EMF that was applied with a high-voltage line for 8 hours/day for 26 days (Groups I, II, and III) or 52 days (Groups V, VI, and VII). Groups IV and VIII were the 26- and 52-day control/sham groups, respectively. Groups II and VI were treated with GL, and Groups III and VII were treated with MLT. MLT and GL were administered daily based on the weight of the animals and appropriate standards. At the end of the study, the rats were euthanized, and their anterior teeth were extracted. The teeth were preserved in pure water before evaluating the major TEs. At the end of the study, TE concentrations (in mg/kg) were assessed in the control and test groups. Compared with Group V, statistically significant differences in the concentrations of zinc (Zn) and strontium (Sr) were found for Group VII (ELF-EMF + MLT) (P<0.05). Therefore, ELF-EMF exposure can change the content of certain TEs in teeth and, after administering MLT and GL, the values of some of the TEs return to normal.Entities:
Keywords: ELF-EMF; Ganoderma lucidum; melatonin; tooth; trace element
Mesh:
Substances:
Year: 2017 PMID: 28496309 PMCID: PMC5422323 DOI: 10.2147/DDDT.S132308
Source DB: PubMed Journal: Drug Des Devel Ther ISSN: 1177-8881 Impact factor: 4.162
TE contents in each group at the end of the study
| TE (mg/kg) | Group I | Group II | Group III | Group IV | Group V | Group VI | Group VII | Group VIII |
|---|---|---|---|---|---|---|---|---|
| 7Li | 0.2617 | 0.1695 | 0.0834 | 0.1693 | 0.1735 | 0.1013 | 0.1495 | 0.1443 |
| 11B | 0.0417 | 0.0277 | 0.0275 | 0.0264 | 0.0216 | 0.0187 | 0.0166 | 0.0352 |
| 24Mg | 0.6803 | 0.8939 | 0.8814 | 0.8768 | 0.8505 | 0.8191 | 0.7801 | 0.8464 |
| 44Ca | 0.4895 | 0.5342 | 0.5240 | 0.5767 | 0.5436 | 0.5537 | 0.5624 | 0.6148 |
| 55Mn | 0.0015 | 0.0018 | 0.0013 | 0.0016 | 0.0013 | 0.0012 | 0.0013 | 0.0016 |
| 56Fe | 0.1330 | 0.2026 | 0.2493 | 0.2606 | 0.2645 | 0.2587 | 0.2358 | 0.2518 |
| 59Co | 0.0061 | 0.0088 | 0.0042 | 0.0074 | 0.0031 | 0.0053 | 0.0065 | 0.0050 |
| 66Zn | 0.0682 | 0.0532 | 0.0585 | 0.0550 | 0.0616 | 0.0991 | 0.1775 | 0.1335 |
| 75As | 0.0859 | 0.0402 | 0.0000 | 0.0310 | 0.0215 | 0.1174 | 0.0441 | 0.0094 |
| 51V | 0.1041 | 0.1001 | 0.0494 | 0.0683 | 0.0325 | 0.0715 | 0.0911 | 0.0765 |
| 88Sr | 0.1473 | 0.1215 | 0.1322 | 0.1422 | 0.1632 | 0.1663 | 0.1735 | 0.1816 |
| 107Ag | 0.0013 | 0.0012 | 0.0011 | 0.0011 | 0.0010 | 0.0012 | 0.0011 | 0.0012 |
| 111Cd | 0.0042 | 0.0096 | 0.0017 | 0.0013 | 0.0029 | 0.0018 | 0.0038 | 0.0056 |
| 208Pb | 0.1166 | 0.1688 | 0.0820 | 0.0861 | 0.0810 | 0.0967 | 0.1156 | 0.1258 |
| 15P | 0.6900 | 0.9770 | 0.9470 | 0.8200 | 0.9130 | 0.8170 | 0.8620 | 0.9840 |
| 78Se | 0.2016 | 0.0534 | 0.0472 | 0.0411 | 0.3113 | 0.1167 | 0.1120 | 0.1524 |
Notes: Group I, 26 days of high-voltage ELF-EMF exposure; Group II, 26 days of high-voltage ELF-EMF exposure + GL; Group III, 26 days of high-voltage ELF-EMF exposure + MLT; Group IV, control/sham group for 26 days; Group V, 52 days of high-voltage ELF-EMF exposure; Group VI, 52 days of high-voltage ELF-EMF exposure + GL; Group VII, 52 days of high-voltage ELF-EMF exposure + MLT; and Group VIII, control/sham group for 52 days.
Abbreviation: TE, trace element.