| Literature DB >> 28447707 |
Junyoung Kwon1, Jong-Young Lee, Young-Jun Yu, Chul-Ho Lee, Xu Cui, James Hone, Gwan-Hyoung Lee.
Abstract
2D semiconductors, including transition metal dichalcogenides (TMDs), have been widely studied recently. However, the device performance is deteriorated due to the significant contact resistance. The contact resistance of MoS2-metal contacts decreases with the thickness of MoS2. We obtained a Schottky barrier height as low as about 70 meV when MoS2 is trilayer-thick. It is important to find the optimal choice of contact metal and layer thickness of MoS2.Entities:
Year: 2017 PMID: 28447707 DOI: 10.1039/c7nr01501a
Source DB: PubMed Journal: Nanoscale ISSN: 2040-3364 Impact factor: 7.790