| Literature DB >> 28333432 |
Dorian Gaboriau1,1, Maxime Boniface1, Anthony Valero1,1, Dmitry Aldakov1, Thierry Brousse2,3, Pascal Gentile1, Said Sadki1.
Abstract
Silicon nanowires were coated by a 1-5 nm thin alumina layer by atomic layer deposition (ALD) in order to replace poorly reproducible and unstable native silicon oxide by a highly conformal passivating alumina layer. The surface coating enabled probing the behavior of symmetric devices using such electrodes in the EMI-TFSI electrolyte, allowing us to attain a large cell voltage up to 6 V in ionic liquid, together with very high cyclability with less than 4% capacitance fade after 106 charge/discharge cycles. These results yielded fruitful insights into the transition between an electrochemical double-layer capacitor behavior and an electrolytic capacitor behavior. Ultimately, thin ALD dielectric coatings can be used to obtain hybrid devices exhibiting large cell voltage and excellent cycle life of dielectric capacitors, while retaining energy and power densities close to the ones displayed by supercapacitors.Entities:
Keywords: EMI-TFSI electrolyte; TEM; XPS; atomic layer deposition; chemical vapor deposition; silicon nanowires; supercapacitor
Year: 2017 PMID: 28333432 DOI: 10.1021/acsami.7b01574
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229